Chip-lifetime testing instrument for semiconductor devices

Claim 1

An instrument for testing chips of semiconductor devices, comprising: a tray having a slot to hold a chip to be tested, said chip having an arrangement of electrodes thereon; a plurality of probes for contacting the electrodes on said chip; a substrate to which said probes are connected, said substrate having circuit patterns connected to said probes for electrical testing of said chip; said substrate being substantially flat and said probes projecting from said substrate substantially in the plane of said substrate, said probes having ends for contacting the electrodes; said substrate being selectively mountable on said tray for bringing said ends of the probes into contact with said electrodes; marking means on the chip and the substrate for indicating angular corresponding of the substrate and the chip and consequent correspondence of the probes and the electrodes; and means on said substrate for engaging said tray to align and fix the ends of said probes and said electrodes when the substrate is mounted on said tray.