Feature biassing and absorptive phase-shifting techniques to improve optical projection imaging

Claim 2

A phase-shifting mask consisting of a composite pattern material disposed on a substantially transparent substrate and comprising a first sublayer of an absorptive non-opaque phase-shifting material having a predetermined absorption for incident radiation and a second sublayer of a substantially transmissive phase-shifting material, with openings in said composite pattern material permitting passage of radiation through said substrate, said absorptive and transmissive phase-shifting materials having predetermined thicknesses such that there is a relative phase shift of π radians between radiation passing through said composite material, whereby radiation passing through said composite layer has a predetermined attenuation and a π phase shift with respect to radiation passing through said opening

Claim 3

A phase-shifting mask according to claim 1 consisting of three levels of absorption; where the low absorption part is used on isolated short absorbing features smaller than a predetermined size.

Claim 4

A mask according to claim 1, in which said phase shift mask is a rim phase shift mask.

Claim 5

A mask according to claim 1, in which said phase shift mask is an alternative element phase shift mask.

Claim 6

A mask according to claim 1, in which said phase shift mask is a subresolution phase shift mask.

Claim 7

A mask according to claim 1, in which said phase shift mask is an unattenuated phase shift mask.

Claim 8

A mask according to claim 1, in which said phase shift mask is a rim phase shift mask.

Claim 9

A mask according to claim 1, in which said phase shift mask is an alternative element phase shift mask.

Claim 10

A mask according to claim 1, in which said phase shift mask is a subresolution phase shift mask.

Claim 11

A mask according to claim 1, in which said phase shift mask is an unattenuated phase shift mask.

Claim 12

A phase-shifting mask comprising an opaque and a partially transmissive phase-shifting layer disposed on respective portions of a transparent substrate and having predetermined openings therein permitting the passage of incident radiation through said openings and said substrate, said partially transmissive layer having a predetermined thickness such that there is a relative phase shift of π radians between radiation passing through said openings and radiation passing through said partially transmissive material, whereby radiation passing through said partially transmissive layer has a predetermined attenuation and a π phase shift with respect to radiation passing through said openings.

Claim 13

A phase-shifting mask comprising an opaque and a partially transmissive phase-shifting layer disposed on respective portions of a transparent substrate and having predetermined openings therein permitting the passage of incident radiation through said openings and said substrate, said partially transmissive layer having a predetermined thickness such that there is a relative phase shift of π radians between radiation passing through said openings and radiation passing through said partially transmissive material, whereby radiation passing through said partially transmissive layer has a predetermined attenuation and a π phase shift with respect to radiation passing through said openings.

Claim 14

A phase-shifting mask according to claim 2, consisting of a mixture of opaque layers and partially transmissive phase-shifting layers, whereon said partially transmissive layer is used to define isolated long absorbing features.

Claim 15

A phase-shifting mask in accordance with claim 12 wherein the latter is used on isolated long absorbing features smaller than a redetermined size.

Claim 16

A phase-shifting mask according to claim 5, in which said partially transmissive layer is used to define isolated short absorbing features, and said opaque layer is used to define isolated long absorbing features.

Claim 17

A phase-shift mask for producing a pattern of wafer lines, wafer holes and wafer spaces having nominal wafer dimensions specified by predetermined ground rules in an optical resist on a wafer, comprising a transparent substrate and at least one absorbing layer disposed thereon, said absorbing layer having a pattern of openings permitting the passage of incident radiation therethrough, said absorbing layer further permitting the passage of part of said incident radiation with a phase shift of π radians with respect to radiation passing through said openings, in which said openings and said absorbing layer comprise features selected from the classes of liens, spaces, combinations of lines and spaces, holes, and islands, each of which classes has associated with it at lest one nominal mask dimension characteristic of said class to provide a corresponding nominal ground rule wafer dimension characteristic of said class and each of which classes occupies a window in an E-D diagram, the overlap of which windows defines a common depth of focus and common exposure for said mask, characterized in that: at least one of said classes has an altered nominal mask dimension different from an original nominal mask dimension such that said window in said E-D diagram corresponding to said at least one class is shifted to overlap at least one other window in said E-D diagram corresponding to at least one other class, whereby a common depth of focus and common exposure are established for said mask by said overlap and said class having an altered nominal mask dimension has a corresponding altered wafer dimension different from said nominal ground rule wafer dimension characteristic of said class.

Claim 18

A phase-shift mask for producing a pattern of wafer lines, wafer holes and wafer spaces having nominal wafer dimensions specified by predetermined ground rules in an optical resist on a wafer, comprising a transparent substrate and at least one absorbing layer disposed thereon, said absorbing layer having a pattern of openings permitting the passage of incident radiation therethrough, said absorbing layer further permitting the passage of part of said incident radiation with a phase shift of π radians with respect to radiation passing through said openings, in which said openings and said absorbing layer comprise features selected from the classes of liens, spaces, combinations of lines and spaces, holes, and islands, each of which classes has associated with it at lest one nominal mask dimension characteristic of said class to provide a corresponding nominal ground rule wafer dimension characteristic of said class and each of which classes occupies a window in an E-D diagram, the overlap of which windows defines a common depth of focus and common exposure for said mask, characterized in that: at least one of said classes has an altered nominal mask dimension different from an original nominal mask dimension such that said window in said E-D diagram corresponding to said at least one class is shifted to overlap at least one other window in said E-D diagram corresponding to at least one other class, whereby a common depth of focus and common exposure are established for said mask by said overlap and said class having an altered nominal mask dimension has a corresponding altered wafer dimension different from said nominal ground rule wafer dimension characteristic of said class.

Claim 19

A phase-shifting mask according to claim 15, further characterized in that: a) isolated and densely populated long openings have said nominal dimensions, b) isolated and less densely populated opaque long lines have an altered nominal mask dimension smaller than said nominal dimension for the class of opaque long lines.

Claim 20

A phase-shifting mask according to claim 16, further characterized in that: c) said altered nominal mask dimensions of opaque lines become smaller as a function of the separation form other opaque features.

Claim 21

A phase-shifting mask in accordance with claim 17, further characterized in that: a) short openings have an altered nominal mask dimension larger than the nominal mask dimension of long openings.

Claim 22

A mask according to claim 15, further characterized in that: said phase shift mask is a rim phase shift mask.

Claim 23

A mask according to claim 15, further characterized in that: said phase shift mask is an alternative-element phase shift mask.

Claim 24

A mask according to claim 15, further characterized in that: said phase shift mask is a subresolution phase shift mask.

Claim 25

A mask according to claim 15, further characterized in that: said phase shift mask is an unattenuated phase shift mask.