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US5287002A Expired / Lapsed US ⏱️ 0.0 years remaining

Planar multi-layer metal bonding pad

Assignee: NXP USA Inc
•
Filing: 1992-05-29
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Granted: 1994-02-15
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Expires: 2012-05-29
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Abstract

Abstract A planarized multi-layer metal bonding pad. A first metal bonding pad layer (13) that defines a metal bonding pad is provided. A first dielectric layer (14) is provided with a multitude of vias (17) that covers the first metal bonding pad layer (13), thereby exposing portions of the first metal bonding pad layer (13) through the multitude of vias (17) in the first dielectric (14). A second metal bonding pad layer (18) that further defines the metal bonding pad is deposited on the first dielectric layer (14) making electrical contact to the first metal bonding pad layer through the multitude of vias (17). Planarization of the second metal bonding pad layer (18) is achieved by having the second metal bonding pad layer (18) cover the first dielectric layer (14) and making contact through the vias (17).

Inventors

  • 👤 John L. Freeman, Jr.
  • 👤 Clarence J. Tracy

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-03 05:22
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/40; H10W72/00; H10W72/01; H10W72/019; H10W72/90; H10W72/931; H10W72/934; H10W72/981; H10W72/983

Claims Analysis

Total Claims: 5
Claim 1
Independent Claim 223 words
A planarized multi-layer metal bonding pad on an integrated circuit comprising: a first metal bonding pad layer defining a bonding pad; a first dielectric layer with a multitude of vias that covers the first metal bonding pad layer, and wherein portions of the first metal bonding pad layer are exposed through the vias; a second metal bonding pad layer that further defines the bonding pad that covers the vias in the first dielectric layer so that electrical contact is made between the first metal bonding pad layer and the second metal bonding pad layer through the vias; a second dielectric layer with a multitude of vias that covers the second metal bonding pad layer, thereby exposing portions of the second metal bonding pad layer through the vias; a third metal bonding pad layer further defining the metal bonding pad that covers the vias in the second dielectric layer so that electrical contact is made between the second metal bonding pad layer and the third metal bonding pad layer; a third dielectric layer with an opening exposing a portion of the third metal bonding pad layer; and a fourth metal bonding pad layer that further defines the bonding pad that covers the opening in the third dielectric layer so that electrical contact is made between the third and the fourth metal bonding pads layers.
Claim 2
Dependent Claim 223 words
A planarized multi-layer metal bonding pad on an integrated circuit comprising: a first metal bonding pad layer defining a bonding pad; a first dielectric layer with a multitude of vias that covers the first metal bonding pad layer, and wherein portions of the first metal bonding pad layer are exposed through the vias; a second metal bonding pad layer that further defines the bonding pad that covers the vias in the first dielectric layer so that electrical contact is made between the first metal bonding pad layer and the second metal bonding pad layer through the vias; a second dielectric layer with a multitude of vias that covers the second metal bonding pad layer, thereby exposing portions of the second metal bonding pad layer through the vias; a third metal bonding pad layer further defining the metal bonding pad that covers the vias in the second dielectric layer so that electrical contact is made between the second metal bonding pad layer and the third metal bonding pad layer; a third dielectric layer with an opening exposing a portion of the third metal bonding pad layer; and a fourth metal bonding pad layer that further defines the bonding pad that covers the opening in the third dielectric layer so that electrical contact is made between the third and the fourth metal bonding pads layers.
Claim 3
Dependent Claim 21 words
A planarized multi-layer metal bonding pad as claimed in claim 1 wherein the multi-layer metal bonding pad is a probe pad.
Claim 4
Dependent Claim 28 words
A planarized multi-layer metal bonding pad as claimed in claim 1 wherein the electrical connection is made by a multitude of metal plugs in the multitude of vias.
Claim 5
Dependent Claim 49 words
A planarized multi-layer metal bonding pad as claimed in claim 1 further comprising providing additional dielectric layers with a multitude of vias and providing additional metal layers that cover the additional dielectric layers so that electrical contact is made between the additional metal layer and the third metal layer.

References Cited (Backward Citations)

US4755482A Cited
US5063175A Cited
US4933303A Cited
US5006486A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1997-02-14 1997-08-16 1998-02-15 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2001-02-14 2001-08-16 2002-02-15 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2005-02-14 2005-08-16 2006-02-15 $7700.00 Window Closed / Lapsed

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