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US5281840A
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High mobility integrated drivers for active matrix displays
Assignee: Honeywell Inc
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Filing: 1992-08-17
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Granted: 1994-01-25
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Expires: 2012-08-17
Abstract
Abstract High mobility thin film transistors for fabricating integrated drivers for active matrix displays and a special method of fabrication for obtaining the thin film transistors having mobility sufficiently high enough as drivers operable in the several megahertz frequency range needed for driving high resolution active matrix displays.
Inventors
- 👤 Kalluri R. Sarma
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 16:17
CPC Classifications
H; H10; H10D; H10D86/00; H10D86/01; H10D86/021; H10D30/00; H10D30/60; H10D30/01; H10D30/021; H10D30/031; H10D30/0321; H10D30/0323; H10D30/67; H10D30/6704; H10D30/6723; H10D30/674; H10D30/6741; H10D30/6743; H10D30/6744; H10D86/40; H10D86/60; H10P; H10P50/00; H10P50/60; H10P50/64; H10P50/642; H10P90/00; H10P90/19; H10P90/1904; H10P90/1906; H10W; H10W10/00; H10W10/01; H10W10/061; H10W10/10; H10W10/181; G; G02; G02F; G02F1/00; G02F1/01; G02F1/13; G02F1/133; G02F1/1333; G02F1/1345; G02F1/13454; H10P90/1914; H10W10/011; H10W10/012; H10W10/021; H10W10/13; H10W10/20
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
233 words
A plurality of high mobility thin film transistors comprising: a low temperature glass substrate having a strain point temperature less than 700° C.; and a plurality of islands situated on a surface of said glass substrate, wherein each island comprises: a light shield layer situated on said glass substrate; a barrier layer situated on said light shield layer situated on said glass substrate; a single crystal silicon epitaxial device layer having a first surface situated on said barrier layer and having a second surface; a region of low fixed charge density silicon dioxide gate dielectric having a fixed charge density less than 1×10 11 charges per square centimeter, embedded in the single crystal silicon epitaxial device layer and having a surface exposed at the second surface of said single crystal silicon epitaxial device layer; a polysilicon gate situated on only a portion of said region of low fixed charge density silicon dioxide gate dielectric; at least one drain-source implantation at the second surface of said single crystal silicon epitaxial device layer and adjacent to said region of low fixed charge density silicon dioxide gate dielectric, having a depth greater than a depth of said region of low fixed charge density silicon dioxide gate electric, relative to the second surface of said single crystal silicon epitaxial device layer; and a drain-source metalization in contact with each drain-source implantation of said plurality of drain-source implantations.
Claim 2
Dependent Claim
233 words
A plurality of high mobility thin film transistors comprising: a low temperature glass substrate having a strain point temperature less than 700° C.; and a plurality of islands situated on a surface of said glass substrate, wherein each island comprises: a light shield layer situated on said glass substrate; a barrier layer situated on said light shield layer situated on said glass substrate; a single crystal silicon epitaxial device layer having a first surface situated on said barrier layer and having a second surface; a region of low fixed charge density silicon dioxide gate dielectric having a fixed charge density less than 1×10 11 charges per square centimeter, embedded in the single crystal silicon epitaxial device layer and having a surface exposed at the second surface of said single crystal silicon epitaxial device layer; a polysilicon gate situated on only a portion of said region of low fixed charge density silicon dioxide gate dielectric; at least one drain-source implantation at the second surface of said single crystal silicon epitaxial device layer and adjacent to said region of low fixed charge density silicon dioxide gate dielectric, having a depth greater than a depth of said region of low fixed charge density silicon dioxide gate electric, relative to the second surface of said single crystal silicon epitaxial device layer; and a drain-source metalization in contact with each drain-source implantation of said plurality of drain-source implantations.
Claim 3
Dependent Claim
65 words
The transistors of claim 1 further comprising: a glass coating formed on the surface of said glass substrate and surfaces of said each island of said plurality of islands up to the drain-source implantations; and an intermetal dielectric coating formed on said glass coating, a plurality of portions of said drain-source implantations, said polysilicon gates and a first plurality of portions of said drain-source metalization.
Claim 4
Dependent Claim
48 words
The transistors of claim 2 further comprising: a passivation coating formed on said intermetal dielectric coating and a second plurality of portions of said drain-source metalization; and a plurality of light shield coatings formed on a plurality of areas proximate to each island of said plurality of islands.
Claim 5
Dependent Claim
63 words
The transistors of claim 3 wherein: said light shield layer of said each island of said plurality of islands, has a thickness between b 0.01 and 2 microns; said barrier layer of said each island, has a thickness between 0.1 and 2 microns; and said single crystal silicon epitaxial device layer of said each island has a thickness between 0.01 and 5 microns.
Claim 6
Dependent Claim
18 words
The transistors of claim 1 wherein: said transistors are N-channel transistors; and said drain-source implantation is of phosphorus.
Claim 7
Dependent Claim
18 words
The transistors of claim 1 wherein: said transistors are P-channel transistors; and said drain-source implantations are of boron.
Claim 8
Dependent Claim
79 words
The transistors of claim 1 wherein: some of said transistors are N-channel transistors; some of said transistors are P-channel transistors; said drain-source implantation of each of said N-channel transistors is of phosphorus; said drain-source implantation of each of said P-channel transistors is of boron; said single crystal silicon epitaxial device layer of each of said n-channel transistors has a boron concentration; and said single crystal silicon epitaxial device layer of each of said P-cnannel transistors has a phosphorus concentration.
Claim 9
Dependent Claim
92 words
The transistors of claim 7 wherein each of said N-channel transistors is matched with each of said P-channel transistors due to an appropriate amount of phosphorus in said drain-source implantation of each of said N-channel transistors, an appropriate amount of boron in said drain-source implantation of each of said P-channel transistors, an appropriate amount of boron concentration in said single crystal silicon epitaxial device layer of each of said N-channel transistors, and an appropriate amount of phosphorus concentration in said single crystal silicon epitaxial device layer of each of said P-channel transistors.
Claim 10
Dependent Claim
218 words
A plurality of high mobility thin film transistors comprising: a low temperature glass substrate having a strain point temperature less than 700° C.; and a plurality of islands situated on a surface of said glass substrate, wherein each island comprises: a barrier layer situated on said glass substrate; a single crystal silicon epitaxial device layer having a first surface situated on said barrier layer and having a second surface; a region of low fixed charge density silicon dioxide gate dielectric having a fixed charge density less than 1×10 11 charts per square centimeter, embedded in the single crystal silicon epitaxial device layer and having a surface exposed at the second surface of said single crystal silicon epitaxial device layer; a polysilicon gate situated on only a portion of said region of low fixed charge density silicon dioxide gate dielectric; at least one drain-source implantation at the second surface of said single crystal silicon epitaxial device layer and adjacent to said region of low fixed charge density silicon dioxide gate dielectric, having a depth greater than a depth of said region of low fixed charge density silicon dioxide gate dielectric, relative to the second surface of said single crystal silicon epitaxial device layer ;and a drain-source metalization in contact with each rain-source implantation of said plurality of drain-source implantations.
Claim 11
Dependent Claim
218 words
A plurality of high mobility thin film transistors comprising: a low temperature glass substrate having a strain point temperature less than 700° C.; and a plurality of islands situated on a surface of said glass substrate, wherein each island comprises: a barrier layer situated on said glass substrate; a single crystal silicon epitaxial device layer having a first surface situated on said barrier layer and having a second surface; a region of low fixed charge density silicon dioxide gate dielectric having a fixed charge density less than 1×10 11 charts per square centimeter, embedded in the single crystal silicon epitaxial device layer and having a surface exposed at the second surface of said single crystal silicon epitaxial device layer; a polysilicon gate situated on only a portion of said region of low fixed charge density silicon dioxide gate dielectric; at least one drain-source implantation at the second surface of said single crystal silicon epitaxial device layer and adjacent to said region of low fixed charge density silicon dioxide gate dielectric, having a depth greater than a depth of said region of low fixed charge density silicon dioxide gate dielectric, relative to the second surface of said single crystal silicon epitaxial device layer ;and a drain-source metalization in contact with each rain-source implantation of said plurality of drain-source implantations.
Claim 12
Dependent Claim
79 words
The transistors of claim 9 wherein: some of said transistors are N-channel transistors; some of said transistors are P-channel transistors; said drain-source implantation of each of said N-channel transistors is of phosphorus; said drain-source implantation of each of said P-channel transistors is of boron; said single crystal silicon epitaxial device layer of each of said N-channel transistors has a boron concentration; and said signal crystal silicon epitaxial device layer of each of said P-channel transistors has a phosphorus concentration.
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