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US5278784A Expired / Lapsed US ⏱️ 0.0 years remaining

Non-volatile memory

Assignee: Sharp Corp
•
Filing: 1992-11-24
•
Granted: 1994-01-11
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Expires: 2012-11-24
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Abstract

Abstract A non-volatile programmable memory having: a plurality of unit cells disposed therein, each of said unit cells including an anti-fuse that can write in data by electrically breaking down an insulating film, a select transistor individually connected to said anti-fuse, and a wiring connected to each anti-fuse; and an auxiliary transistor connected between mutually adjacent unit cells, said auxiliary transistor having a source region and a drain region respectively connected between said anti-fuse and said select transistor together incorporated in mutually adjacent unit cells.

Inventors

  • 👤 Hiroshi Ishihara
  • 👤 Norihiro Tokuyama
  • 👤 Masaru Yuki

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-03 06:48
CPC Classifications
G; G11; G11C; G11C17/00; G11C17/14; G11C17/16

Claims Analysis

Total Claims: 3
Claim 1
Independent Claim 88 words
A non-volatile programmable memory having: a plurality of unit cells disposed therein, each of said unit cells including an anti-fuse that can write in data by electrically breaking down an insulating film of the anti-fuse, a select transistor individually connected to said anti-fuse, and a wiring connected to each of anti-fuse; and an auxiliary transistor connected between mutually adjacent unit cells, said auxiliary transistor having a source region and a drain region respectively connected between said anti-fuse and said select transistor together incorporated in mutually adjacent unit cells.
Claim 2
Dependent Claim 88 words
A non-volatile programmable memory having: a plurality of unit cells disposed therein, each of said unit cells including an anti-fuse that can write in data by electrically breaking down an insulating film of the anti-fuse, a select transistor individually connected to said anti-fuse, and a wiring connected to each of anti-fuse; and an auxiliary transistor connected between mutually adjacent unit cells, said auxiliary transistor having a source region and a drain region respectively connected between said anti-fuse and said select transistor together incorporated in mutually adjacent unit cells.
Claim 3
Dependent Claim 32 words
A non-volatile programmable memory of claim 1, wherein both the select transistor and the auxiliary transistor respectively comprise a gate electrode, said electrodes of both being formed on an identical conductive layer.

References Cited (Backward Citations)

JPS6148609A Cited
US4943538A Cited
JPS6322435A Cited
US4970686A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1997-01-10 1997-07-12 1998-01-11 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2001-01-10 2001-07-12 2002-01-11 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2005-01-10 2005-07-12 2006-01-11 $7700.00 Window Closed / Lapsed

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