US5266518A
Expired / Lapsed
US
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Method of manufacturing a semiconductor body comprising a mesa
Assignee: Viavi Solutions Inc
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Filing: 1990-08-29
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Granted: 1993-11-30
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Expires: 2010-08-29
Abstract
Abstract In the method according to the invention, the upper and thicker of two semiconductor layers is etched by means of a selective and preferential etchant, substantially no underetching occurring with respect to the mask. Subsequently, the lower and thinner semiconductor layer and a part of the upper semiconductor layer are converted by a substantially non-selective anodic oxidation into semiconductor material oxides, which are removed by means of an etchant which is non-selective with respect to the oxides formed, but is selective with respect to the semiconductor materials. As a result, mesas are obtained having a substantially flat side wall, the lateral dimension of these mesas being accurately determined by the size of the mask. Thus, particularly favourable results are obtained, especially in the InP/InGaAsP material system. The method according to the invention can be used very advantageously when the thinner layer forms part of a so-called multilayer quantum well structure.
Inventors
- 👤 Johannes J. M. Binsma
- 👤 Rudolf P. Tijburg
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-06 12:26
CPC Classifications
H; H10; H10D; H10D48/00; H10D48/30; H10D48/32; B; B82; B82Y; B82Y20/00; H10P; H10P14/00; H10P14/60; H10P14/63; H10P14/6302; H10P14/6324; G; G02; G02B; G02B6/00; G02B6/10; G02B6/12; G02B6/13; G02B6/131; H01; H01S; H01S5/00; H01S5/20; H01S5/22; H01S5/227; H01S5/30; H01S5/34; H01S5/343; H01S5/3434; H10H; H10H20/00; H10H20/01; H10H20/011; H10H20/013; H10P14/20; H10P14/24; H10P14/29; H10P14/2901; H10P14/2907; H10P14/2909; H10P14/32; H10P14/3202; H10P14/3214; H10P14/3218; H10P14/3221; H10P14/34; H10P14/3402; H10P14/3414; H10P14/3418; H10P14/3421; H10P50/00; H10P50/60; H10P50/61; H10P50/617; H10P50/64; H10P50/642; H10P50/646; H10P50/69; H10P50/691; H10P50/693; H10P50/694; H01S5/2054; H01S5/2081; H01S5/2275; H01S5/32; H01S5/323; H01S5/3235; H01S5/32391; H01S5/34306; H10P14/6326; H10P14/6328; H10P14/6334; H10P14/6336; H10P14/68; H10P14/69; H10P14/694; H10P14/6943; H10P14/69433; Y; Y10; Y10S; Y10S438/00; Y10S438/911; Y10S438/978
Claims Analysis
Total Claims: 20
Claim 1
Independent Claim
195 words
A method of manufacturing a semiconductor body comprising the steps of (a) providing a first semiconductor layer of a first semiconductor material on a semiconductor substrate (b) providing a second semiconductor layer of a second semiconducting material on said first semiconductor layer, said second semiconducting material being different than said first semiconducting material, said first semiconductor layer having a thickness smaller than the thickness of said second semiconductor layer, (c) forming a mask on at least said second semiconductor layer, (d) etching said second semiconductor layer about said mask with a wet chemical etchant, said etchant being a selective and preferential etchant providing no underetching of said second semiconductor layer beneath said mask, (e) converting a portion of said second semiconductor layer into semiconductor material oxide by a substantially non-selective anodic oxidation, (f) removing said semiconductor material oxide by etching with an etchant non-selective with said semiconductor material oxide but selective with said first and second semiconductive material, such that at least said second semiconductor layer is formed underetched beneath said mask with straight edges, and (g) etching said first semiconductor layer to form a mesa of at least said first and second semiconductor layers.
Claim 2
Independent Claim
195 words
A method of manufacturing a semiconductor body comprising the steps of (a) providing a first semiconductor layer of a first semiconductor material on a semiconductor substrate (b) providing a second semiconductor layer of a second semiconducting material on said first semiconductor layer, said second semiconducting material being different than said first semiconducting material, said first semiconductor layer having a thickness smaller than the thickness of said second semiconductor layer, (c) forming a mask on at least said second semiconductor layer, (d) etching said second semiconductor layer about said mask with a wet chemical etchant, said etchant being a selective and preferential etchant providing no underetching of said second semiconductor layer beneath said mask, (e) converting a portion of said second semiconductor layer into semiconductor material oxide by a substantially non-selective anodic oxidation, (f) removing said semiconductor material oxide by etching with an etchant non-selective with said semiconductor material oxide but selective with said first and second semiconductive material, such that at least said second semiconductor layer is formed underetched beneath said mask with straight edges, and (g) etching said first semiconductor layer to form a mesa of at least said first and second semiconductor layers.
Claim 3
Dependent Claim
73 words
A method according to claim 1, further comprising before said step (a) a step of providing a third semiconductor layer of said second semiconductor material, wherein said mesa is formed at least into said third semiconductor layer, said third semiconductor layer being etched after said step (g) by a selective and preferential etchant, and wherein said first semiconductor material has a band gap smaller than a band gap of said second semiconductor material.
Claim 4
Dependent Claim
48 words
A method according to claim 2, wherein said step (g) is carried out to form said mesa in a strip-shape having a longitudinal direction in the [110] crystal direction, said mesa being provided with side walls substantially at right angles to said first, second and third semiconductor layers.
Claim 5
Dependent Claim
30 words
A method according to claim 2, wherein said step (c) is carried out by depositing a layer of an insulator material and by etching a strip-shape of said insulator material.
Claim 6
Dependent Claim
18 words
A method according to claim 4, wherein said layer of insulator material is silicon nitride deposited by CVD.
Claim 7
Dependent Claim
63 words
A method according to claim 2, further comprising after step (b) the step of providing a fourth semiconductor layer of said first semiconductor material; said step (c) being carried out on said fourth semiconductor layer, wherein said steps (d), (e) and (f) are also carried out on said fourth layer such that said mask projects beyond said fourth, second and first semiconductor layers.
Claim 8
Dependent Claim
64 words
A method according to claim 6, wherein said first semiconductor layer is formed as a multilayer quantum well layer structure of a stack of thin semiconductor layers, each of said thin semiconductor layers, forming said quantum well structure, being surrounded by at least one semiconductor layer of a semiconductor material having a larger band gap than said thin semiconductor layers forming said quantum well.
Claim 9
Dependent Claim
30 words
A method according to claim 6, wherein said step (c) is carried out by depositing a layer of an insulator material and by etching a strip-shape of said insulator material.
Claim 10
Dependent Claim
18 words
A method according to claim 8, wherein said layer of insulator material is SiO 2 deposited by sputtering.
Claim 11
Dependent Claim
21 words
A method according to claim 6, wherein said fourth semiconductor layer is etched selectively with respect to said second semiconductor material.
Claim 12
Dependent Claim
41 words
A method according to claim 6, wherein said fourth semiconductor layer is formed of indium gallium arsenic phosphide, and wherein said fourth semiconductor layer is etched by an etchant including sulphuric acid, hydrogen peroxide and water in a ratio of 1:1:9.
Claim 13
Dependent Claim
157 words
A method according to claim 6, wherein said semiconductor substrate and said third semiconductor layer are formed of a first conductivity type, said second and said fourth semiconductor layers are formed of a second conductivity type, and said first semiconductor layer is not intentionally doped, and wherein after said step (g) is carried out, a current blocking structure is provided beside said mesa by forming a semi-isolating semiconductor layer or by forming at least two semiconductor layers providing a blocking p-n junction; contacts are respectively provided at a lower side of said semiconductor substrate and an upper side of said fourth semiconductor layer; the semiconductor body is cleft at right angles to said mesa; and mirror surfaces limiting said mesa are formed such that upon electrical connection in a forward direction laser operation is carried out with a portion of said first semiconductor layer within said mesa forming a resonant cavity to provide an active radiation-emitting region.
Claim 14
Dependent Claim
40 words
A method according to claim 11, wherein said semiconductor substrate is formed of indium phosphide, said first semiconductor material is one of indium gallium arsenic or indium gallium arsenic phosphide, and said second semiconductor material is formed of indium phosphide.
Claim 15
Dependent Claim
26 words
A method according to claim 13, wherein said indium phosphide is etched by an etchant including hydrochloric acid and phosphoric acid in a ration of 1:4.
Claim 16
Dependent Claim
22 words
A method according to claim 11, wherein at least one semiconductor layer is formed beside said mesa by Organo-Metallic Vapor Phase Epitaxy.
Claim 17
Dependent Claim
21 words
A method according to claim 11, wherein said first semiconductor layer is formed with a thickness of at most 0.2 μm.
Claim 18
Dependent Claim
43 words
A method according to claim 11, wherein said steps (e) and (f) are carried out simultaneously in a 3% solution of citric acid in water, having a pH of about 1 by addition of phosphoric acid, diluted with 2 parts of ethylene glycol.
Claim 19
Dependent Claim
37 words
A method according to claim 1, wherein said step (e) is carried out in a 3% solution of citric acid, having a pH of about 6 by addition of ammonia, diluted with 2 parts of ethylene glycol.
Claim 20
Dependent Claim
23 words
A method according to claim 17, wherein said step (f) is carried out by etching in a 1.5 molar solution of phosphoric acid.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 1996-11-29 | 1997-05-31 | 1997-11-30 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2000-11-29 | 2001-05-31 | 2001-11-30 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2004-11-29 | 2005-05-31 | 2005-11-30 | $7700.00 | Window Closed / Lapsed |