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US5256455A
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Method of forming film of tantalum oxide by plasma chemical vapor deposition
Assignee: NEC Electronics Corp
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Filing: 1992-01-27
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Granted: 1993-10-26
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Expires: 2012-01-27
Abstract
Abstract A method for depositing a thin film of tantalum oxide (Ta 2 O 5 ) with a large capacitance per unit area on a silicon surface by a plasma CVD process. The plasma used in the CVD process is generated by a high-frequency energy with a gas containing tantalum chloride (TaCl 5 ) and dinitrogen oxide (N 2 O). The intensity of the high-frequency energy increases from the start of the formation of the film of tantalum oxide until the end of the formation of the film. Increasing the intensity of the energy causes suppression of the growth of silicon oxide layers which are generated with the reactive plasma sputtering process going at the same time with the CVD process on the silicon surface.
Inventors
- 👤 Youichirou Numasawa
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-04 07:50
CPC Classifications
C; C23; C23C; C23C16/00; C23C16/22; C23C16/30; C23C16/40; C23C16/405; C23C16/44; C23C16/50; C23C16/505; C23C16/509; C23C16/5096
Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
116 words
A method of forming a film of tantalum oxide on a substrate by using a plasma chemical vapor deposition in a plasma which is generated by a high-frequency energy and with a gas containing tantalum chloride and dinitrogen oxide, said method comprising the steps of: increasing the intensity of the high-frequency energy from the start of a formation of the tantalum oxide film until the end of formation of the tantalum oxide film, and maintaining said intensity of the high-frequency at levels which do not decrease during said formation of the film before the termination of said film formation wherein the oxidation of the substrate is reduced during the formation of the film of tantalum oxide.
Claim 2
Independent Claim
116 words
A method of forming a film of tantalum oxide on a substrate by using a plasma chemical vapor deposition in a plasma which is generated by a high-frequency energy and with a gas containing tantalum chloride and dinitrogen oxide, said method comprising the steps of: increasing the intensity of the high-frequency energy from the start of a formation of the tantalum oxide film until the end of formation of the tantalum oxide film, and maintaining said intensity of the high-frequency at levels which do not decrease during said formation of the film before the termination of said film formation wherein the oxidation of the substrate is reduced during the formation of the film of tantalum oxide.
Claim 3
Dependent Claim
79 words
A method according to claim 1, wherein the process of forming the film of tantalum oxide is divided into a plurality of stages, the intensity of the high-frequency energy being increased at the beginning of each of the stages, and the further step of precluding a decrease of said intensity from a time beginning with the start of the formation of the tantalum oxide film and continuing until the end of the formation of the film of tantalum oxide.
Claim 4
Dependent Claim
36 words
A method according to claim 1 or 2, including the further step of applying the high-frequency electric energy to an electrode disposed in a plasma reaction chamber, thereby generating the plasma in the plasma reaction chamber.
Claim 5
Dependent Claim
20 words
A method according to claim 3, wherein said high frequency electric energy has a frequency of at least 4 MHz.
Claim 6
Dependent Claim
16 words
A method according to claim 4, wherein the substrate has at least a surface of silicon.
Claim 7
Dependent Claim
21 words
A method according to claim 2, wherein the intensity of the high-frequency energy is substantially fixed during each of the stages.
Claim 8
Independent Claim
126 words
A method of forming a tantalum oxide film on a substrate by a plasma chemical vapor deposition in a plasma generated by a high-frequency energy with a gas containing tantalum chloride and dinitrogen oxide, said method comprising the step of: dividing the process of film formation into a plurality of stages and increasing the intensity of the high-frequency energy at the beginning of each of the stages, said stages of increasing intensity beginning with a start of the formation of the film and continuing until the end of the formation of the film, said intensity not decreasing between the start and the end of the formation of the film wherein the oxidation of the substrate is reduced during the formation of the film of tantalum oxide.
Claim 9
Independent Claim
126 words
A method of forming a tantalum oxide film on a substrate by a plasma chemical vapor deposition in a plasma generated by a high-frequency energy with a gas containing tantalum chloride and dinitrogen oxide, said method comprising the step of: dividing the process of film formation into a plurality of stages and increasing the intensity of the high-frequency energy at the beginning of each of the stages, said stages of increasing intensity beginning with a start of the formation of the film and continuing until the end of the formation of the film, said intensity not decreasing between the start and the end of the formation of the film wherein the oxidation of the substrate is reduced during the formation of the film of tantalum oxide.
References Cited (Backward Citations)
US4987005A
Cited
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| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 1996-10-25 | 1997-04-26 | 1997-10-26 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2000-10-25 | 2001-04-26 | 2001-10-26 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2004-10-25 | 2005-04-26 | 2005-10-26 | $7700.00 | Window Closed / Lapsed |