US5250455A
Expired / Lapsed
US
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Method of making a nonvolatile semiconductor memory device by implanting into the gate insulating film
Assignee: Panasonic Holdings Corp
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Filing: 1992-06-18
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Granted: 1993-10-05
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Expires: 2012-06-18
Abstract
Abstract A nonvolatile semiconductor memory comprising a silicon semiconductor substrate and formed thereon a gate insulating film, wherein an ion belonging to the same Group IV in the periodic table as the ion of said silicon semiconductor substrate belongs is shot into said gate insulating film by ion implantation in a dose of not less than 10 16 cm -2 to form an ion-implanted region therein in such a way that a peak of impurity density of the ion is present at the gate insulating film side from the interface between said semiconductor substrate and said gate insulating film. Also disclosed are an MOS integrated circuit comprising the nonvolatile semiconductor memory, and a method of making the nonvolatile semiconductor memory.
Inventors
- 👤 Takashi Ohzone
- 👤 Takashi Hori
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 23:29
CPC Classifications
H; H10; H10D; H10D64/00; H10D64/01; H10D64/013; H10D64/01302; H10D64/01332; H10D64/01336; H10D64/0134; H10B; H10B41/00; H10B41/40; H10B41/42; H10B41/43; H10B41/48; H10D30/00; H10D30/60; H10D30/68; H10D30/6891; H10D30/6893; H10D30/69; H10D64/031; H10D64/035; H10D64/037; H10D64/60; H10D64/66; H10D64/68; Y; Y10; Y10S; Y10S438/00; Y10S438/91
Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
86 words
A method of preparing a nonvolatile semiconductor memory, comprising the steps of: forming a gate insulating film on a silicon semiconductor substrate; implanting a Group IV ion in said gate insulating film to form an ion-implanted region which is parallel to an interface between said silicon substrate and said gate insulating film, said ion-implanted region having a peak of impurity density of said implanted Group IV which is parallel to and located at said interface; forming a gate electrode, a source region, and a drain region.
Claim 2
Independent Claim
86 words
A method of preparing a nonvolatile semiconductor memory, comprising the steps of: forming a gate insulating film on a silicon semiconductor substrate; implanting a Group IV ion in said gate insulating film to form an ion-implanted region which is parallel to an interface between said silicon substrate and said gate insulating film, said ion-implanted region having a peak of impurity density of said implanted Group IV which is parallel to and located at said interface; forming a gate electrode, a source region, and a drain region.
Claim 3
Dependent Claim
45 words
A method of preparing a nonvolatile semiconductor memory according to claim 1, wherein an Si + ion is used as said Group IV ion, and said ion is implanted in a dose of not less than 10 16 cm -2 to form said ion-implanted region.
Claim 4
Independent Claim
130 words
A method of preparing a nonvolatile semiconductor memory, comprising the steps of forming a gate insulating film on a silicon semiconductor substrate, implanting and Si + ion in said gate insulating film in a dose of not less than 10 16 cm -2 to form an ion-implanted region, and forming a gate electrode, a source region, and a drain region, said ion-implanted region and a horizontally adjacent non-implanted region are selectively formed in a portion of said gate insulating film between said source region and said drain region, with at least one end of the ion-implanted region extending from either said source region or said drain region, with the proviso that said ion-implanted region does not extend across said gate insulating film between said source region and said drain region.
Claim 5
Independent Claim
130 words
A method of preparing a nonvolatile semiconductor memory, comprising the steps of forming a gate insulating film on a silicon semiconductor substrate, implanting and Si + ion in said gate insulating film in a dose of not less than 10 16 cm -2 to form an ion-implanted region, and forming a gate electrode, a source region, and a drain region, said ion-implanted region and a horizontally adjacent non-implanted region are selectively formed in a portion of said gate insulating film between said source region and said drain region, with at least one end of the ion-implanted region extending from either said source region or said drain region, with the proviso that said ion-implanted region does not extend across said gate insulating film between said source region and said drain region.
References Cited (Backward Citations)
US3328210A
Cited
US3649884A
Cited
US4043024A
Cited
US4297782A
Cited
US4466839A
Cited
US4717943A
Cited
US4978631A
Cited
US4868618A
Cited
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