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US5245212A Expired / Lapsed US ⏱️ 0.0 years remaining

Self-aligned field-plate isolation between active elements

Assignee: Texas Instruments Inc
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Filing: 1991-11-04
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Granted: 1993-09-14
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Expires: 2011-11-04
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Abstract

Abstract The structure and method of this invention provide, for example, electrical isolation between active elements in adjacent rows and/or columns of an integrated circuit by use of a self-aligned field-plate conductor formed over and insulated from the substrate regions that are bounded by the channel regions of field-effect transistors in adjacent rows and that are bounded by the bitlines forming those transistors in a column. The field-plate conductor is formed, for example, in a strip that extends over the isolation areas and thermal insulator regions between row lines of the memory cell array. The field-plate conductor strip is connected to a voltage supply that has a potential with respect to the potential of the semiconductor substrate which causes the isolation areas to be nonconductive. Component density may be increased over that of prior-art structures and methods.

Inventors

  • 👤 Manzur Gill

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 04:13
CPC Classifications
H; H10; H10D; H10D64/00; H10D64/111; H10B; H10B69/00

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 95 words
An isolating structure between control electrodes of active elements of an integrated circuit, each of said control electrodes having at least one edge and having a sidewall insulator adjacent said edge, comprising: a semiconductor substrate region between a said edge of a said control electrode and a said edge of an adjacent said control electrode; an insulator layer overlying said semiconductor substrate region; and a field-plate conductor overlying said insulator layer and abutting said sidewall insulator, said field-plate conductor electrically insulated from at least a said edge of said control electrode by said sidewall insulator.
Claim 2
Dependent Claim 95 words
An isolating structure between control electrodes of active elements of an integrated circuit, each of said control electrodes having at least one edge and having a sidewall insulator adjacent said edge, comprising: a semiconductor substrate region between a said edge of a said control electrode and a said edge of an adjacent said control electrode; an insulator layer overlying said semiconductor substrate region; and a field-plate conductor overlying said insulator layer and abutting said sidewall insulator, said field-plate conductor electrically insulated from at least a said edge of said control electrode by said sidewall insulator.
Claim 3
Dependent Claim 83 words
An isolating structure between control electrodes of active elements of memory cells in an array of said cells, said control electrodes having sidewall insulators, comprising: a semiconductor layer between said control electrodes; a field-plate formed over and insulated from said semiconductor layer, insulated from said control electrodes by said sidewall insulators, and abutting said sidewall insulators; said field-plate connected to a source of electric potential that, in relation to the electric potential of said semiconductor layer, causes said semiconductor layer to be nonconductive.
Claim 4
Dependent Claim 83 words
An isolating structure between control electrodes of active elements of memory cells in an array of said cells, said control electrodes having sidewall insulators, comprising: a semiconductor layer between said control electrodes; a field-plate formed over and insulated from said semiconductor layer, insulated from said control electrodes by said sidewall insulators, and abutting said sidewall insulators; said field-plate connected to a source of electric potential that, in relation to the electric potential of said semiconductor layer, causes said semiconductor layer to be nonconductive.
Claim 5
Dependent Claim 90 words
A nonvolatile memory array comprising rows and columns of active elements formed on the surface of said semiconductor layer, each said element having a control electrode defining a channel region in said surface, said control electrode having adjacent sidewall insulators, said channel region spaced apart by a semiconductor region from a channel region of a said active element of an adjacent row, including: a field-plate formed over and insulated from said semiconductor region, said field-plate abutting said sidewall insulators and electrically insulated from said control electrodes by said sidewall insulators.
Claim 6
Dependent Claim 90 words
A nonvolatile memory array comprising rows and columns of active elements formed on the surface of said semiconductor layer, each said element having a control electrode defining a channel region in said surface, said control electrode having adjacent sidewall insulators, said channel region spaced apart by a semiconductor region from a channel region of a said active element of an adjacent row, including: a field-plate formed over and insulated from said semiconductor region, said field-plate abutting said sidewall insulators and electrically insulated from said control electrodes by said sidewall insulators.

References Cited (Backward Citations)

US4455565A Cited
US4458262A Cited
US4561170A Cited
US4652898A Cited
US4825278A Cited
US4947222A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1996-09-13 1997-03-15 1997-09-14 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2000-09-13 2001-03-15 2001-09-14 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2004-09-13 2005-03-15 2005-09-14 $7700.00 Window Closed / Lapsed

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