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System and method for producing electro-optic components integrable with silicon-on-sapphire circuits

Assignee: CALIFORNIA A CORP OF, University of, Regents of
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Filing: 1990-12-21
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Granted: 1993-09-07
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Expires: 2010-12-21
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Abstract

Abstract A system and method are disclosed for producing electro-optic components with transparent, ferroelectric PLZT (perovskite) film characteristics, without lead diffusion. In particular, the fabrication of PLZT-on-sapphire electro-optic components for devices such as spatial light modulators, integrated infrared detectors, and optoelectronic integrated circuits is disclosed, permitting integration of such devices with semiconductor devices having the same substrate, such as silicon-on-sapphire circuits. The system comprises a PLZT film deposition apparatus, a silicon dioxide deposition apparatus, an annealing apparatus, and an optional plasma etching apparatus. During film deposition, material from a PLZT target (source) of suitable (9/65/35) composition is deposited on the substrate and is epitaxially grown on the R-plane (1102) of the substrate, forming a non-ferroelectric, pyrochloric film. The substrate and film are then placed in a silicon dioxide (SiO2) deposition chamber where SiO2 is deposited as an insulating layer covering (capping) the film. The substrate, with film and SiO2 layer, is then placed in an annealing apparatus, at a selected temperature above 550 DEG C. for a selected period of time, to transform the non-ferroelectric, pyrochloric film into a ferroelectric, perovskite film of (9/65/35) composition. The SiO2 layer may then be removed by conventional etching.

Inventors

  • 👤 Sadik C. Esener
  • 👤 Sing H. Lee
  • 👤 Subramania Krishnakumar
  • 👤 Volkan H. Ozguz
  • 👤 Chi Fan

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 03:18
CPC Classifications
C; C23; C23C; C23C14/00; C23C14/22; C23C14/50; C23C14/505; C23C14/06; C23C14/08; C23C14/088; G; G02; G02F; G02F1/00; G02F1/01; G02F1/03; G02F1/055; G02F1/0551; H; H10; H10D; H10D86/00; H10D86/01

Claims Analysis

Total Claims: 22
Claim 1
Independent Claim 97 words
A method of producing an electro-optic circuit component, the method comprising the steps of: providing a substrate; providing an electro-optic material for deposition on the substrate, the material having a predetermined composition of elements; depositing the material as a paraelectric film on the substrate at a first temperature suitable to minimize diffusion of elements from the film while accruing such a deposition as will support a strong electro-optic effect, the film and substrate forming a circuit component; annealing the component at a higher, second, temperature in order to transform the paraelectric film into a transparent, ferroelectric film.
Claim 2
Independent Claim 97 words
A method of producing an electro-optic circuit component, the method comprising the steps of: providing a substrate; providing an electro-optic material for deposition on the substrate, the material having a predetermined composition of elements; depositing the material as a paraelectric film on the substrate at a first temperature suitable to minimize diffusion of elements from the film while accruing such a deposition as will support a strong electro-optic effect, the film and substrate forming a circuit component; annealing the component at a higher, second, temperature in order to transform the paraelectric film into a transparent, ferroelectric film.
Claim 3
Dependent Claim 12 words
The method of claim 1, where the substrate is a sapphire substrate.
Claim 4
Dependent Claim 37 words
The method of claim 1, where the electro-optic material is PLZT having a composition of elements: lead, lanthanum, zirconate, and titanate, the transparent ferroelectric phase of the material being perovskite, and the non-transparent paraelectric phase being pyrochloric.
Claim 5
Dependent Claim 44 words
The method of claim 1 where the predetermined temperature is any temperature in the range from 400° C. to 500° C. for minimizing diffusion of the element lead, and the higher temperature is any temperature in the range from 500° C. to 700° C.
Claim 6
Dependent Claim 23 words
The method of claim 1 where the annealing transpires for a period of time in the range from 20 minutes to 60 minutes.
Claim 7
Dependent Claim 15 words
The method of claim 2, where the sapphire substrate is an R-plane (1102) sapphire substrate.
Claim 8
Independent Claim 105 words
A method of producing an electro-optic circuit component, the method comprising the steps of: providing a substrate; providing an electro-optic material for deposition on the substrate, the material having a predetermined composition of elements; depositing the material as a paraelectric film on the substrate at a first temperature suitable to minimize diffusion of elements from the film, the film and substrate forming a circuit component; depositing an insulating layer on the film for controlling diffusion of one or more of the elements during annealing; and annealing the component at a higher, second, temperature in order to transform the paraelectric film into a transparent, ferroelectric film.
Claim 9
Independent Claim 105 words
A method of producing an electro-optic circuit component, the method comprising the steps of: providing a substrate; providing an electro-optic material for deposition on the substrate, the material having a predetermined composition of elements; depositing the material as a paraelectric film on the substrate at a first temperature suitable to minimize diffusion of elements from the film, the film and substrate forming a circuit component; depositing an insulating layer on the film for controlling diffusion of one or more of the elements during annealing; and annealing the component at a higher, second, temperature in order to transform the paraelectric film into a transparent, ferroelectric film.
Claim 10
Independent Claim 93 words
A method of producing an electro-optic circuit component, the method comprising the steps of: providing a substrate; providing an electro-optic material for deposition on the substrate, the material having a predetermined composition of elements; depositing the material as a paraelectric film on the substrate at a first temperature below 500° C. for minimizing diffusion of the element lead from the film, the film and substrate forming a circuit component; and annealing the component at a higher, second, temperature above 500° C. in order to transform the paraelectric film into a transparent, ferroelectric film.
Claim 11
Independent Claim 93 words
A method of producing an electro-optic circuit component, the method comprising the steps of: providing a substrate; providing an electro-optic material for deposition on the substrate, the material having a predetermined composition of elements; depositing the material as a paraelectric film on the substrate at a first temperature below 500° C. for minimizing diffusion of the element lead from the film, the film and substrate forming a circuit component; and annealing the component at a higher, second, temperature above 500° C. in order to transform the paraelectric film into a transparent, ferroelectric film.
Claim 12
Dependent Claim 14 words
The method of claim 8 where the insulating layer is a silicon dioxide layer.
Claim 13
Independent Claim 113 words
A method of producing a circuit component having an electro-optic PLZT film of perovskite composition on a sapphire substrate, the method comprising the steps of: maintaining the substrate at a selected first temperature; depositing the PLZT film on the substrate at the first temperature, said first temperature being suitably low to minimize lead diffusion from the film, to produce a pyrochloric film, the pyrochloric film and substrate forming a circuit component; then annealing the component at a selected second temperature for a period of time, said second temperature being higher than the first temperature, for transforming the pyrochloric film to a substantially transparent, ferroelectric film with perovskite composition and without substantial lead diffusion.
Claim 14
Independent Claim 113 words
A method of producing a circuit component having an electro-optic PLZT film of perovskite composition on a sapphire substrate, the method comprising the steps of: maintaining the substrate at a selected first temperature; depositing the PLZT film on the substrate at the first temperature, said first temperature being suitably low to minimize lead diffusion from the film, to produce a pyrochloric film, the pyrochloric film and substrate forming a circuit component; then annealing the component at a selected second temperature for a period of time, said second temperature being higher than the first temperature, for transforming the pyrochloric film to a substantially transparent, ferroelectric film with perovskite composition and without substantial lead diffusion.
Claim 15
Dependent Claim 39 words
The method of claim 10 including an additional step of capping the component before annealing by depositing a silicon dioxide layer over the deposited pyrochloric film before annealing in order to prevent lead diffusion from the film during annealing.
Claim 16
Independent Claim 57 words
A method of producing film of a perovskite phase of a composition of elements lead, lanthanum, zirconate and titanate on a substrate, the method comprising: depositing a film of a composition of elements lead, lanthanum, zirconate and titanate in their pyrochloric phase on a substrate; and annealing the pyrochloric-phase film to change it to the perovskite phase.
Claim 17
Independent Claim 57 words
A method of producing film of a perovskite phase of a composition of elements lead, lanthanum, zirconate and titanate on a substrate, the method comprising: depositing a film of a composition of elements lead, lanthanum, zirconate and titanate in their pyrochloric phase on a substrate; and annealing the pyrochloric-phase film to change it to the perovskite phase.
Claim 18
Dependent Claim 33 words
The method according to claim 12 which, as a step prior to the annealing, further comprises: depositing upon the pyrochloric phase film a covering film that is resistant to the diffusion of lead.
Claim 19
Dependent Claim 28 words
The method according to claim 12 wherein the depositing transpires at a temperature less than 550° Centigrade and the annealing transpires at a temperature greater than 550 Centigrade.
Claim 20
Independent Claim 89 words
A method of producing transparent electro-optic film of a perovskite phase of a composition of elements lead, lanthanum, zirconate and titanate on a R-plane sapphire substrate, the method comprising: epitaxially growing a film of a composition of elements lead, lanthanum, zirconate and titanate in their pyrochloric phase on an R-plane sapphire substrate at a temperature less than 500° Centigrade to produce a non-ferroelectric pyrochloric film; and annealing the non-ferroelectric pyrochloric film at a temperature greater than 550° Centigrade to transform it into a ferroelectric perovskite film of (9/65/35) composition.
Claim 21
Independent Claim 89 words
A method of producing transparent electro-optic film of a perovskite phase of a composition of elements lead, lanthanum, zirconate and titanate on a R-plane sapphire substrate, the method comprising: epitaxially growing a film of a composition of elements lead, lanthanum, zirconate and titanate in their pyrochloric phase on an R-plane sapphire substrate at a temperature less than 500° Centigrade to produce a non-ferroelectric pyrochloric film; and annealing the non-ferroelectric pyrochloric film at a temperature greater than 550° Centigrade to transform it into a ferroelectric perovskite film of (9/65/35) composition.
Claim 22
Dependent Claim 47 words
The method according to claim 15 which, as a step prior to the annealing, further comprises: depositing a covering film of silicon dioxide upon the pyrochloric phase film which silicon dioxide film is resistant to the diffusion of lead from the pyrochloric phase film during the annealing.

References Cited (Backward Citations)

US4266265A Cited
US4701592A Cited
US5043049A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1996-09-06 1997-03-08 1997-09-07 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2000-09-06 2001-03-08 2001-09-07 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2004-09-06 2005-03-08 2005-09-07 $7700.00 Window Closed / Lapsed

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