US5233161A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for self regulating CMOS digital microcircuit burn-in without ovens
Assignee: Raytheon Co
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Filing: 1991-10-31
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Granted: 1993-08-03
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Expires: 2011-10-31
Abstract
Abstract A burn-in heating circuit for an integrated circuit including a burn-in clock generator for producing a burn-in clock signal that is provided to the clock buffer of the clock distribution system of the integrated circuit. The operating frequency of the burn-in clock is at or close to the maximum frequency that the clock distribution system can reliably sustain with valid logic levels, so that the highest possible self-heating can be achieved by power dissipation in the clock distribution system. A comparator that is responsive to a temperature signal representative of the integrated circuit junction temperature and a signal indicative of the desired burn-in temperature modulates the clock generator so that the junction temperature of the integrated circuit resulting from self heating is close to the desired burn-in temperature.
Inventors
- 👤 William D. Farwell
- 👤 Bradley S. Henson
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 06:15
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/2851; G01R31/2855; G01R31/2872; G01R31/2874; G01R31/2875; G01R31/30; G01R31/2856
Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
126 words
A burn-in heating circuit for an integrated circuit having an internal clock distribution system that includes a clock buffer, comprising: burn-in clock means for producing a fixed frequency burn-in clock signal that is provided to the clock buffer, said fixed frequency selected to cause self-heating such that the junction temperature of the integrated circuit increases to at least a reference temperature; temperature sensing means for providing a voltage indicative of the junction temperature of the integrated circuit; reference means for providing a reference voltage indicative of said reference temperature; and control means responsive to said temperature sensing means and said reference means for selectively enabling and disabling said burn-in clock means so that the junction temperature of the integrated circuit is close to said reference temperature.
Claim 2
Dependent Claim
126 words
A burn-in heating circuit for an integrated circuit having an internal clock distribution system that includes a clock buffer, comprising: burn-in clock means for producing a fixed frequency burn-in clock signal that is provided to the clock buffer, said fixed frequency selected to cause self-heating such that the junction temperature of the integrated circuit increases to at least a reference temperature; temperature sensing means for providing a voltage indicative of the junction temperature of the integrated circuit; reference means for providing a reference voltage indicative of said reference temperature; and control means responsive to said temperature sensing means and said reference means for selectively enabling and disabling said burn-in clock means so that the junction temperature of the integrated circuit is close to said reference temperature.
Claim 3
Dependent Claim
18 words
The burn-in heating circuit of claim 1 wherein said burn-in clock means is incorporated in the integrated circuit.
Claim 4
Dependent Claim
16 words
The burn-in heating circuit of claim 1 wherein said burn-in clock means comprises a ring oscillator.
Claim 5
Dependent Claim
37 words
The burn-in heating circuit of claim 1 wherein said temperature sensing means comprises a temperature dependent voltage source that represents the junction temperature of the integrated circuit, and wherein said reference means is a precision voltage source.
Claim 6
Dependent Claim
52 words
The burn-in heating circuit of claim 4 wherein said temperature dependent voltage source includes a diode that is internal to the integrated circuit and biasing means for forward biasing to produce a substantially constant current, whereby the voltage drop across the diode is representative of the junction temperature of the integrated circuit.
Claim 7
Dependent Claim
24 words
The burn-in heating circuit of claim 5 wherein said diode comprises a clamping diode connected to an input or output of the integrated circuit.
References Cited (Backward Citations)
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1996-08-02 | 1997-02-01 | 1997-08-03 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2000-08-02 | 2001-02-01 | 2001-08-03 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2004-08-02 | 2005-02-01 | 2005-08-03 | $7700.00 | Window Closed / Lapsed |