Rectifier test method

Claim 1

A method of testing rectifiers comprising the steps of measuring at least one of the parameters of a rectifier so as to provide an indication of the rectifier operating characteristics when the rectifier junction is at room temperature, heating substantially only the rectifier junction by supplying the rectifier junction with a predetermined current for a predetermined time insufficient to permit significant heat dissipation from the rectifier junction so as to increase the rectifier junction temperature from room temperature to an increased temperature, remeasuring at least one of the parameters of the rectifier so as to provide an indication of the effect heating the rectifier junction has on the parameters measured, and comparing the measured parameters so as to be able to predict the rectifier characteristics.

Claim 2

A method of testing rectifiers comprising the steps of measuring at least one of the parameters of a rectifier so as to provide an indication of the rectifier operating characteristics when the rectifier junction is at room temperature, heating substantially only the rectifier junction by supplying the rectifier junction with a predetermined current for a predetermined time insufficient to permit significant heat dissipation from the rectifier junction so as to increase the rectifier junction temperature from room temperature to an increased temperature, remeasuring at least one of the parameters of the rectifier so as to provide an indication of the effect heating the rectifier junction has on the parameters measured, and comparing the measured parameters so as to be able to predict the rectifier characteristics.

Claim 3

A method of testing rectifiers comprising the steps of measuring the forward voltage across a rectifier when a certain current is passed through the rectifier so as to provide an indication of the rectifier operating characteristics when the rectifier junction is at room temperature, heating substantially only the rectifier junction by supplying the rectifier junction with a predetermined current for a predetermined time insufficient to permit significant heat dissipation from the rectifier junction so as to increase the rectifier junction temperature from room temperature to an increased temperature, remeasuring the forward voltage across the rectifier when only the certain current is passed through the rectifier and the rectifier junction is at the increased temperature so as to provide an indication of the rectifier operating characteristics when the rectifier junction is at the increased temperature, and comparing the voltages measured across the rectifier for evaluating the rectifier reliability and for predicting the operating temperature of the rectifier junction.

Claim 4

A method of testing rectifiers comprising the steps of measuring the forward voltage across a rectifier when a certain current is passed through the rectifier so as to provide an indication of the rectifier operating characteristics when the rectifier junction is at room temperature, heating substantially only the rectifier junction by supplying the rectifier junction with a predetermined current for a predetermined time insufficient to permit significant heat dissipation from the rectifier junction so as to increase the rectifier junction temperature from room temperature to an increased temperature, remeasuring the forward voltage across the rectifier when only the certain current is passed through the rectifier and the rectifier junction is at the increased temperature so as to provide an indication of the rectifier operating characteristics when the rectifier junction is at the increased temperature, and comparing the voltages measured across the rectifier for evaluating the rectifier reliability and for predicting the operating temperature of the rectifier junction.

Claim 5

A method of testing rectifiers comprising the steps of heating substantially only the rectifier junction by supplying the rectifier junction with a predetermined current for a predetermined time insufficient to permit significant heat dissipation from the rectifier junction so as to increase the rectifier junction temperature from room temperature to an increased temperature, supplying the rectifier with a reverse bias voltage when the rectifier junction is at the increased temperature so as to cause a reverse leakage current through the rectifier, and measuring the leakage current through the rectifier so as to be able to predict whether the rectifier will undergo thermal runaway during operation.

Claim 6

A method of testing rectifiers comprising the steps of heating substantially only the rectifier junction by supplying the rectifier junction with a predetermined current for a predetermined time insufficient to permit significant heat dissipation from the rectifier junction so as to increase the rectifier junction temperature from room temperature to an increased temperature, supplying the rectifier with a reverse bias voltage when the rectifier junction is at the increased temperature so as to cause a reverse leakage current through the rectifier, and measuring the leakage current through the rectifier so as to be able to predict whether the rectifier will undergo thermal runaway during operation.

Claim 7

A method of testing rectifiers comprising the steps of heating substantially only the rectifier junction by supplying the rectifier junction with a predetermined current for a predetermined time insufficient to permit significant heat dissipation from the rectifier junction so as to increase the rectifier junction temperature from room temperature to an increased temperature, the predetermined current including a series of current pulses, measuring the forward voltage across the rectifier when one of the first in the series of current pulses is at a maximum and the rectifier junction is at room temperature so as to pRovide an indication of the rectifier operating characteristics at a high current level when the rectifier junction is at room temperature, remeasuring the forward voltage across the rectifier when one of the last in the series of current pulses is at a maximum and the rectifier junction is at the increased temperature so as to provide an indication of the rectifier operating characteristics at a high current level when the rectifier junction is at the increased temperature, and comparing the voltages measured across the rectifier for evaluating the construction quality of the rectifier.

Claim 8

A method of testing rectifiers comprising the steps of heating substantially only the rectifier junction by supplying the rectifier junction with a predetermined current for a predetermined time insufficient to permit significant heat dissipation from the rectifier junction so as to increase the rectifier junction temperature from room temperature to an increased temperature, the predetermined current including a series of current pulses, measuring the forward voltage across the rectifier when one of the first in the series of current pulses is at a maximum and the rectifier junction is at room temperature so as to pRovide an indication of the rectifier operating characteristics at a high current level when the rectifier junction is at room temperature, remeasuring the forward voltage across the rectifier when one of the last in the series of current pulses is at a maximum and the rectifier junction is at the increased temperature so as to provide an indication of the rectifier operating characteristics at a high current level when the rectifier junction is at the increased temperature, and comparing the voltages measured across the rectifier for evaluating the construction quality of the rectifier.

Claim 9

A method of testing rectifiers comprising the steps of measuring the forward voltage across a rectifier when a certain current is passed through the rectifier so as to provide an indication of the rectifier operating characteristics at a low current level when the rectifier junction is at room temperature, heating substantially only the rectifier junction by supplying the rectifier junction with a predetermined current for a predetermined time insufficient to permit significant heat dissipation from the rectifier junction so as to increase the rectifier junction temperature from room temperature to an increased temperature, the predetermined current including a series of current pulses having a magnitude several times greater than the magnitude of the certain current, remeasuring the forward voltage across the rectifier when one of the first in the series of current pulses is at a maximum so as to provide an indication of the rectifier operating characteristics at a high current level when the rectifier junction is at room temperature, remeasuring the forward voltage across the rectifier when only the certain current is passed through the rectifier and the rectifier junction is at the increased temperature so as to provide an indication of the rectifier operating characteristics at a low current level when the rectifier junction is at the increased temperature, comparing the forward voltages measured across the rectifier at a low current level for evaluating the rectifier reliability and for predicting the rectifier operating temperature, remeasuring the forward voltage across the rectifier when one of the last in the series of current pulses is at a maximum and the rectifier junction is at the increased temperature so as to provide an indication of the rectifier operating characteristics at a high current level when the rectifier junction is at the increased temperature, and comparing the forward voltages measured across the rectifier at a high current level for evaluating the construction quality of the rectifier.

Claim 10

A method of testing rectifiers comprising the steps of measuring the forward voltage across a rectifier when a certain current is passed through the rectifier so as to provide an indication of the rectifier operating characteristics at a low current level when the rectifier junction is at room temperature, heating substantially only the rectifier junction by supplying the rectifier junction with a predetermined current for a predetermined time insufficient to permit significant heat dissipation from the rectifier junction so as to increase the rectifier junction temperature from room temperature to an increased temperature, the predetermined current including a series of current pulses having a magnitude several times greater than the magnitude of the certain current, remeasuring the forward voltage across the rectifier when one of the first in the series of current pulses is at a maximum so as to provide an indication of the rectifier operating characteristics at a high current level when the rectifier junction is at room temperature, remeasuring the forward voltage across the rectifier when only the certain current is passed through the rectifier and the rectifier junction is at the increased temperature so as to provide an indication of the rectifier operating characteristics at a low current level when the rectifier junction is at the increased temperature, comparing the forward voltages measured across the rectifier at a low current level for evaluating the rectifier reliability and for predicting the rectifier operating temperature, remeasuring the forward voltage across the rectifier when one of the last in the series of current pulses is at a maximum and the rectifier junction is at the increased temperature so as to provide an indication of the rectifier operating characteristics at a high current level when the rectifier junction is at the increased temperature, and comparing the forward voltages measured across the rectifier at a high current level for evaluating the construction quality of the rectifier.

Claim 11

A method of testing rectifiers comprising the steps of measuring the forward voltage across a rectifier when a certain current is passed through the rectifier so as to provide an indication of the rectifier operating characteristics at a low current level when the rectifier junction is at room temperature, heating substantially only the rectifier junction by supplying the rectifier junction with a predetermined current for a predetermined time insufficient to permit significant heat dissipation from the rectifier junction so as to increase the rectifier junction temperature from room temperature to an increased temperature, the predetermined current including a series of current pulses having a magnitude several times greater than the magnitude of the certain current, remeasuring the forward voltage across the rectifier when one of the first in the series of current pulses is at a maximum so as to provide an indication of the rectifier operating characteristics at a high current level when the rectifier junction is at room temperature, comparing the measured voltages so as to provide an indication of the rectifier forward voltage characteristic slope, remeasuring the forward voltage across the rectifier when only the certain current is passed through the rectifier and the rectifier junction is at the increased temperature so as to provide an indication of the rectifieR operating characteristics at a low current level when the rectifier junction is at the increased temperature, and comparing the forward voltages measured across the rectifier at a low current level for evaluating the rectifier reliability and for predicting the rectifier operating temperature.

Claim 12

A method of testing rectifiers comprising the steps of measuring the forward voltage across a rectifier when a certain current is passed through the rectifier so as to provide an indication of the rectifier operating characteristics at a low current level when the rectifier junction is at room temperature, heating substantially only the rectifier junction by supplying the rectifier junction with a predetermined current for a predetermined time insufficient to permit significant heat dissipation from the rectifier junction so as to increase the rectifier junction temperature from room temperature to an increased temperature, the predetermined current including a series of current pulses having a magnitude several times greater than the magnitude of the certain current, remeasuring the forward voltage across the rectifier when one of the first in the series of current pulses is at a maximum so as to provide an indication of the rectifier operating characteristics at a high current level when the rectifier junction is at room temperature, comparing the measured voltages so as to provide an indication of the rectifier forward voltage characteristic slope, remeasuring the forward voltage across the rectifier when only the certain current is passed through the rectifier and the rectifier junction is at the increased temperature so as to provide an indication of the rectifieR operating characteristics at a low current level when the rectifier junction is at the increased temperature, and comparing the forward voltages measured across the rectifier at a low current level for evaluating the rectifier reliability and for predicting the rectifier operating temperature.

Claim 13

A method of testing rectifiers comprising the steps of measuring the forward voltage across a rectifier when a certain current is passed through the rectifier so as to provide an indication of the rectifier operating characteristics at a low current level when the rectifier junction is at room temperature, heating substantially only the rectifier junction by supplying the rectifier junction with a predetermined current for a predetermined time insufficient to permit significant heat dissipation from the rectifier junction so as to increase the rectifier junction temperature from room temperature to an increased temperature, the predetermined current including a series of current pulses having a magnitude several times greater than the magnitude of the certain current, remeasuring the forward voltage across the rectifier when one of the first in the series of current pulses is at a maximum so as to provide an indication of the rectifier operating characteristics at a high current level when the rectifier junction is at room temperature, comparing the measured voltages so as to provide an indication of the rectifier forward voltage characteristic slope, remeasuring the forward voltage across the rectifier when one of the last in the series of current pulses is at a maximum and the rectifier junction is at the increased temperature so as to provide an indication of the rectifier operating characteristics at a high current level when the rectifier junction is at the increased temperature, comparing the forward voltages measured across the rectifier at a high current level for evaluating the construction quality of the rectifier.

Claim 14

A method of testing rectifiers comprising the steps of measuring the forward voltage across a rectifier when a certain current is passed through the rectifier so as to provide an indication of the rectifier operating characteristics at a low current level when the rectifier junction is at room temperature, heating substantially only the rectifier junction by supplying the rectifier junction with a predetermined current for a predetermined time insufficient to permit significant heat dissipation from the rectifier junction so as to increase the rectifier junction temperature from room temperature to an increased temperature, the predetermined current including a series of current pulses having a magnitude several times greater than the magnitude of the certain current, remeasuring the forward voltage across the rectifier when one of the first in the series of current pulses is at a maximum so as to provide an indication of the rectifier operating characteristics at a high current level when the rectifier junction is at room temperature, comparing the measured voltages so as to provide an indication of the rectifier forward voltage characteristic slope, remeasuring the forward voltage across the rectifier when one of the last in the series of current pulses is at a maximum and the rectifier junction is at the increased temperature so as to provide an indication of the rectifier operating characteristics at a high current level when the rectifier junction is at the increased temperature, comparing the forward voltages measured across the rectifier at a high current level for evaluating the construction quality of the rectifier.

Claim 15

A method of testing rectifiers comprising the steps of measuring the forward voltage across a rectifier when a certain current is passed through the rectifier so as to provide an indication of the rectifier operating characteristics at a low current level when the rectifier junction is at room temperature, heating substantially only the rectifier junction by supplying the rectifier junction with a predetermined current for a predetermined time insufficient to permit significant heat dissipation from the rectifier junction so as to increase the rectifier junction temperature from room temperature to an increased temperature, the predetermined current including a series of current pulses having a magnitude several times greater than the magnitude of the certain current, remeasuring the forward voltage across the rectifier when only the certain current is passed through the rectifier and the rectifier junction is at the increased temperature so as to provide an indication of the rectifier operating characteristics at a low current level when the rectifier junction is at the increased temperature, comparing the forward voltages measured across the rectifier at a low current level for evaluating the rectifier reliability and for predicting the rectifier operating temperature, supplying the rectifier with a reverse bias voltage when the rectifier junction is at the increased temperature so as to cause a reverse leakage current through the rectifier, and measuring the reverse leakage current through the rectifier so as to be able to predict whether the rectifier will undergo thermal runaway.

Claim 16

A method of testing rectifiers comprising the steps of measuring the forward voltage across a rectifier when a certain current is passed through the rectifier so as to provide an indication of the rectifier operating characteristics at a low current level when the rectifier junction is at room temperature, heating substantially only the rectifier junction by supplying the rectifier junction with a predetermined current for a predetermined time insufficient to permit significant heat dissipation from the rectifier junction so as to increase the rectifier junction temperature from room temperature to an increased temperature, the predetermined current including a series of current pulses having a magnitude several times greater than the magnitude of the certain current, remeasuring the forward voltage across the rectifier when only the certain current is passed through the rectifier and the rectifier junction is at the increased temperature so as to provide an indication of the rectifier operating characteristics at a low current level when the rectifier junction is at the increased temperature, comparing the forward voltages measured across the rectifier at a low current level for evaluating the rectifier reliability and for predicting the rectifier operating temperature, supplying the rectifier with a reverse bias voltage when the rectifier junction is at the increased temperature so as to cause a reverse leakage current through the rectifier, and measuring the reverse leakage current through the rectifier so as to be able to predict whether the rectifier will undergo thermal runaway.

Claim 17

A method of testing rectifiers comprising the steps of measuring the forward voltage across a rectifier when a certain current is passed through the rectifier so as to provide an indication of the rectifier operating characteristics at a low current level when the rectifier junction is at room temperature, heating substantially only the rectifier junction by supplying the rectifier junction with a predetermined current for a predetermined time insufficient to permit signiFicant heat dissipation from the rectifier junction so as to increase the rectifier junction temperature from room temperature to an increased temperature, the predetermined current including a series of current pulses having a magnitude several times greater than the magnitude of the certain current, remeasuring the forward voltage across the rectifier when one of the first in the series of current pulses is at a maximum so as to provide an indication of the rectifier operating characteristics at a high current level when the rectifier junction is at room temperature, comparing the measured voltages so as to provide an indication of the rectifier forward voltage characteristic slope, remeasuring the forward voltage across the rectifier when only the certain current is passed through the rectifier and the rectifier junction is at the increased temperature so as to provide an indication of the rectifier operating characteristics at a low current level when the rectifier junction is at the increased temperature, comparing the forward voltages measured across the rectifier at a low current level for evaluating the rectifier reliability and for predicting the rectifier operating temperature, remeasuring the forward voltage across the rectifier when one of the last in the series of current pulses is at a maximum and the rectifier junction is at the increased temperature so as to provide an indication of the rectifier operating characteristics at a high current level when the rectifier junction is at the increased temperature, and comparing the forward voltages measured across the rectifier at a high current level for evaluating the construction quality of the rectifier.

Claim 18

A method of testing rectifiers comprising the steps of measuring the forward voltage across a rectifier when a certain current is passed through the rectifier so as to provide an indication of the rectifier operating characteristics at a low current level when the rectifier junction is at room temperature, heating substantially only the rectifier junction by supplying the rectifier junction with a predetermined current for a predetermined time insufficient to permit signiFicant heat dissipation from the rectifier junction so as to increase the rectifier junction temperature from room temperature to an increased temperature, the predetermined current including a series of current pulses having a magnitude several times greater than the magnitude of the certain current, remeasuring the forward voltage across the rectifier when one of the first in the series of current pulses is at a maximum so as to provide an indication of the rectifier operating characteristics at a high current level when the rectifier junction is at room temperature, comparing the measured voltages so as to provide an indication of the rectifier forward voltage characteristic slope, remeasuring the forward voltage across the rectifier when only the certain current is passed through the rectifier and the rectifier junction is at the increased temperature so as to provide an indication of the rectifier operating characteristics at a low current level when the rectifier junction is at the increased temperature, comparing the forward voltages measured across the rectifier at a low current level for evaluating the rectifier reliability and for predicting the rectifier operating temperature, remeasuring the forward voltage across the rectifier when one of the last in the series of current pulses is at a maximum and the rectifier junction is at the increased temperature so as to provide an indication of the rectifier operating characteristics at a high current level when the rectifier junction is at the increased temperature, and comparing the forward voltages measured across the rectifier at a high current level for evaluating the construction quality of the rectifier.

Claim 19

A method of testing rectifiers comprising the steps of measuring the forward voltage across a rectifier when a certain current is passed through the rectifier so as to provide an indication of the rectifier operating characteristics at a low current level when the rectifier junction is at room temperature, heating substantially only the rectifier junction by supplying the rectifier junction with a predetermined current for a predetermined time insufficient to permit significant heat dissipation from the rectifier junction so as to provide an indication of the rectifier operating characteristics at a high current level when the rectifier junction is at room temperature, comparing the measured voltages so as to provide an indication of the rectifier forward voltage characteristic slope, remeasuring the forward voltage across the rectifier when only the certain current is passed through the rectifier and the rectifier junction is at the increased temperature so as to provide an indication of the rectifier operating characteristics at a low current level when the rectifier junction is at the increased temperature, comparing the forward voltages measured across the rectifier at a low current level for evaluating the rectifier reliability and for predicting the rectifier operating temperature, remeasuring the forward voltage across the rectifier when one of the last in the series of current pulses is at a maximum and the rectifier junction is at the increased temperature so as to provide an indication of the rectifier operating characteristics at a high current level when the rectifier junction is at the increased temperature, comparing the forward voltages measured across the rectifier at a high current level for evaluating the construction quality of the rectifier, supplying the rectifier with a reverse bias voltage when the rectifier junction is at the increased temperature so as to cause a reverse leakage current through the rectifier, and measuring the reverse leakage current through the rectifier so as to be able to predict whether the rectifier will undergo thermal runaway.

Claim 20

A method of testing rectifiers comprising the steps of measuring the forward voltage across a rectifier when a certain current is passed through the rectifier so as to provide an indication of the rectifier operating characteristics at a low current level when the rectifier junction is at room temperature, heating substantially only the rectifier junction by supplying the rectifier junction with a predetermined current for a predetermined time insufficient to permit significant heat dissipation from the rectifier junction so as to provide an indication of the rectifier operating characteristics at a high current level when the rectifier junction is at room temperature, comparing the measured voltages so as to provide an indication of the rectifier forward voltage characteristic slope, remeasuring the forward voltage across the rectifier when only the certain current is passed through the rectifier and the rectifier junction is at the increased temperature so as to provide an indication of the rectifier operating characteristics at a low current level when the rectifier junction is at the increased temperature, comparing the forward voltages measured across the rectifier at a low current level for evaluating the rectifier reliability and for predicting the rectifier operating temperature, remeasuring the forward voltage across the rectifier when one of the last in the series of current pulses is at a maximum and the rectifier junction is at the increased temperature so as to provide an indication of the rectifier operating characteristics at a high current level when the rectifier junction is at the increased temperature, comparing the forward voltages measured across the rectifier at a high current level for evaluating the construction quality of the rectifier, supplying the rectifier with a reverse bias voltage when the rectifier junction is at the increased temperature so as to cause a reverse leakage current through the rectifier, and measuring the reverse leakage current through the rectifier so as to be able to predict whether the rectifier will undergo thermal runaway.