US3253221A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of measuring the thermal resistance of a semiconductor device by providing a stabilized temperature difference between the case and a pn junction therein and thereafter obtaining measurements of a temperature sensitive parameter
Assignee: RCA Corp
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Filing: 1962-02-07
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Granted: 1966-05-24
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Expires: 1982-02-07
Abstract
No abstract record available.
Inventors
- 👤 Peter A Peckover
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 16:28
CPC Classifications
G; G01; G01N; G01N25/00; G01N25/18
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
163 words
A METHOD OF MEASURING THE THERMAL RESISTANCE OF A SEMICONDUCTOR DEVICE, SAID SEMICONDUCTOR DEVICE BEING ENCLOSED WITHIN A CASE AND HAVING A JUNCTION, SAID METHOD COMPRSING THE STEPS OF (A) APPLYING A RELATIVELY LARGE PULSE OF CONSTANT POWER TO SAID DEVICE FOR A FIRST PERIOD OF TIME UNTIL THE DIFFERENCE IN TEMPERATURE BETWEEN THAT OF SAID CASE AND THAT OF SAID JUNCTION IS SUBSTANTIALLY CONSTANT, (B) REMOVING SAID PULSE OF CONSTANT POWER FROM SAID DEVICE, (C) APPLYING TO SAID DEVICE A RELATIVELY SMALL CURRENT OF A MAGNITUDE AT WHICH A TEMPERATURE-SENSITIVE PARAMETER OF SAID DEVICE VARIES WITH TEMPERATURE AT A CONSTANT RATE, (D) OBTAINING A FIST SAMPLE OF SAID TEMPERATURE-SENSITIVE PARAMETER IMMEDIATELY AFTER SAID POWER IS REMOVED, (E) OBTAINING A SECOND SAMPLE OF SAID TEMPERATURESENSITIVE PARMETER AFTER A SECOND PERIOD WHEN THE TEMPERATURE OF SAID JUNCTION HAS REACHED SUBSTANTIALLY THE TEMPERATURE OF SAID CASE, AND (F) MEASURING THE DIFFERENCE BETWEEN SAID FIRST AND SAID SECOND SAMPLES AS A FUNCTION OF SAID THERMAL RESISTANCE.
Claim 2
Independent Claim
163 words
A METHOD OF MEASURING THE THERMAL RESISTANCE OF A SEMICONDUCTOR DEVICE, SAID SEMICONDUCTOR DEVICE BEING ENCLOSED WITHIN A CASE AND HAVING A JUNCTION, SAID METHOD COMPRSING THE STEPS OF (A) APPLYING A RELATIVELY LARGE PULSE OF CONSTANT POWER TO SAID DEVICE FOR A FIRST PERIOD OF TIME UNTIL THE DIFFERENCE IN TEMPERATURE BETWEEN THAT OF SAID CASE AND THAT OF SAID JUNCTION IS SUBSTANTIALLY CONSTANT, (B) REMOVING SAID PULSE OF CONSTANT POWER FROM SAID DEVICE, (C) APPLYING TO SAID DEVICE A RELATIVELY SMALL CURRENT OF A MAGNITUDE AT WHICH A TEMPERATURE-SENSITIVE PARAMETER OF SAID DEVICE VARIES WITH TEMPERATURE AT A CONSTANT RATE, (D) OBTAINING A FIST SAMPLE OF SAID TEMPERATURE-SENSITIVE PARAMETER IMMEDIATELY AFTER SAID POWER IS REMOVED, (E) OBTAINING A SECOND SAMPLE OF SAID TEMPERATURESENSITIVE PARMETER AFTER A SECOND PERIOD WHEN THE TEMPERATURE OF SAID JUNCTION HAS REACHED SUBSTANTIALLY THE TEMPERATURE OF SAID CASE, AND (F) MEASURING THE DIFFERENCE BETWEEN SAID FIRST AND SAID SECOND SAMPLES AS A FUNCTION OF SAID THERMAL RESISTANCE.
References Cited (Backward Citations)
US2884536A
Cited
US3034051A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1969-05-23 | 1969-11-22 | 1970-05-24 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1973-05-23 | 1973-11-22 | 1974-05-24 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1977-05-23 | 1977-11-22 | 1978-05-24 | $7700.00 | Window Closed / Lapsed |