Ic measuring device

Abstract

Abstract PURPOSE:To attain simple and precise measurement of electric characteristics without using a thermostatic oven by using a heating means for applying overvoltage to an IC to be measured. CONSTITUTION:In addition to an IC power supply of a normal voltage V0, a power supply on an overvoltage VA is prepared as the heating means for raising a chip temperature without using a thermostatic oven to increase the chip temperature higher than that of the normal operating state. A temperature detecting means 3 is obtained by separating a specific constitutional element of the IC from an IC power supply system and using a transistor built in an input circuit for the detection of the chip temperature. A control part 4 actuates the heating means to raise the temperature of the IC to be measured suddenly, switches the heating means to the temperature detecting means 3 in the process of temperature rise and inputs a detecting output corresponding to the temperature from the constitutional element. The tip temperature is estimated from the chip temperature. If the chip temperature is less than a specified temperature, the control part 4 switches the means 3 to the heating means again. When the chip temperature reaches a prescribed value after repeating said operation, control is switched to a characteristic measuring means 2 to measure the characteristics of the IC.

Inventors

• 👤 Kimio Meguro
• 👤 目黒　喜美男

Bibliographic Details