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Method for heat-treating gallium arsenide monocrystals

Assignee: Shin-Etsu Handotai Co Ltd
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Filing: 1991-03-29
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Granted: 1993-07-20
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Expires: 2011-03-29
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Abstract

Abstract A heat-treating method for an indium-doped dislocation-free gallium arsenide monocrystal having a low carbon concentration and grown in the Liquid Encapsulated Czochralski method, comprising a two-step heat treatment: (i) heating the monocrystal at a temperature between 1050 DEG C. and 1200 DEG C. for a predetermined time length, and cooling the monocrystal quickly; and (ii) heating the monocrystal at a temperature between 750 DEG C. and 950 DEG C. for a predetermined time length, and cooling the monocrystal quickly.

Inventors

  • 👤 Yutaka Kitagawara
  • 👤 Susumu Kuwahara
  • 👤 Takao Takenaka

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-05 09:16
CPC Classifications
C; C30; C30B; C30B33/00; C30B29/00; C30B29/10; C30B29/40; C30B29/42; Y; Y10; Y10S; Y10S148/00; Y10S148/003; Y10S148/024; Y10S148/056

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 137 words
A semiconductor device made from an indium-doped dislocation-free gallium arsenide monocrystal which has a low carbon concentration of 2×10 15 cm -3 or lower and which is grown in a liquid encapsulated Czochralski method, and then subjected to a heat-treatment process which comprises the steps of: (i) heating said monocrystal to a temperature between 1050° C. and 1200° C. for at least 30 minutes; (ii) cooling said monocrystal to a temperature of 950° C. or lower at a cooling rate of from 10° C. per minute to 200° C. per minute; (iii) heating said monocrystal to a temperature between 750° C. and 950° C. for at least 30 minutes; and (iv) cooling said monocrystal to a temperature of 300° C. or lower at a cooling rate of from 10° C. per minute to 200° C. per minute.
Claim 2
Dependent Claim 137 words
A semiconductor device made from an indium-doped dislocation-free gallium arsenide monocrystal which has a low carbon concentration of 2×10 15 cm -3 or lower and which is grown in a liquid encapsulated Czochralski method, and then subjected to a heat-treatment process which comprises the steps of: (i) heating said monocrystal to a temperature between 1050° C. and 1200° C. for at least 30 minutes; (ii) cooling said monocrystal to a temperature of 950° C. or lower at a cooling rate of from 10° C. per minute to 200° C. per minute; (iii) heating said monocrystal to a temperature between 750° C. and 950° C. for at least 30 minutes; and (iv) cooling said monocrystal to a temperature of 300° C. or lower at a cooling rate of from 10° C. per minute to 200° C. per minute.

References Cited (Backward Citations)

US3729348A Cited
US4376657A Cited
GB2137524A Cited
EP0176130A1 Cited
US5051376A Cited
US4889493A Cited
JPH01102932A Cited
US4851358A Cited
US4868133A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1996-07-19 1997-01-18 1997-07-20 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2000-07-19 2001-01-18 2001-07-20 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2004-07-19 2005-01-18 2005-07-20 $7700.00 Window Closed / Lapsed

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