US5227191A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of forming multilayer interconnection structure
Assignee: Sony Corp
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Filing: 1992-06-23
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Granted: 1993-07-13
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Expires: 2012-06-23
Abstract
Abstract The disclosure relates to a method of forming a multilayer interconnection structure. The structure is a laminated body having a first conductive layer, a first insulating layer, a second conductive layer and a second insulating layer in an ascending order. In the method, firstly, a through-hole is formed on the laminated body so as to expose a surface of the first conductive layer and two opposed surfaces of the second conductive layer. Then, the two opposed surfaces of the second conductive layer is masked with a masking film, so as not to deposit thereon a metal which has a strong and selective adhesion on the first and second conductive layers. Then, the metal is deposited on the surface of the first conductive layer by a chemical vapor deposition method so as to fill a lower portion of the through-hole with the metal. Then, the masking film is removed so as to expose the two opposed surfaces of the second conductive layer. Then, the metal is deposited on the two opposed surfaces of the second conductive layer by the chemical vapor deposition method so as to fill an upper portion of the through-hole with the metal, such that the through-hole is filled with the metal and that the first and second conductive layers are interconnected with each other. Even if a through-hole has a high aspect ratio, the through-hole is filled with a metal, without having a void space therein.
Inventors
- 👤 Naoki Nagashima
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-08 14:52
CPC Classifications
H; H10; H10P; H10P95/00; C; C23; C23C; C23C16/00; C23C16/04; C23C16/042; H10P14/00; H10P14/40; H10P14/42; H10P14/43; H10W; H10W20/00; H10W20/01; H10W20/031; H10W20/056; H10W20/071; H10W20/074
Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
205 words
A method of forming a multilayer interconnection structure, comprising the steps of: providing a first conductive layer; forming a first insulating layer on said first conductive layer; forming a second conductive layer on said first insulating layer; forming a second insulating layer on said second conductive layer; forming a through hole in said second insulating, said second conductive and said first insulating layers so as to expose a portion of said first conductive layer and a portion of said second conductive layer, said through hole having sidewalls extending through said second insulating, second conductive and first insulating layers; masking at least the exposed portion of the second conductive layer with a masking film effective to prevent deposit thereon of a metal which has a strong and selective adhesion on said first and second conductive layers; partially filling the through hole with a metal which contacts the exposed portion of said first conductive layer; re-exposing said portion of said second conductive layer masked by said masking film by removing said masking film from said portion of said second conductive layer; and substantially filling a remainder of said through hole with said metal so that said first and second conductive layers are electrically interconnected with each other.
Claim 2
Independent Claim
205 words
A method of forming a multilayer interconnection structure, comprising the steps of: providing a first conductive layer; forming a first insulating layer on said first conductive layer; forming a second conductive layer on said first insulating layer; forming a second insulating layer on said second conductive layer; forming a through hole in said second insulating, said second conductive and said first insulating layers so as to expose a portion of said first conductive layer and a portion of said second conductive layer, said through hole having sidewalls extending through said second insulating, second conductive and first insulating layers; masking at least the exposed portion of the second conductive layer with a masking film effective to prevent deposit thereon of a metal which has a strong and selective adhesion on said first and second conductive layers; partially filling the through hole with a metal which contacts the exposed portion of said first conductive layer; re-exposing said portion of said second conductive layer masked by said masking film by removing said masking film from said portion of said second conductive layer; and substantially filling a remainder of said through hole with said metal so that said first and second conductive layers are electrically interconnected with each other.
Claim 3
Dependent Claim
17 words
A method according to claim 1, wherein said first and second conductive layers are made of polysilicon.
Claim 4
Dependent Claim
19 words
A method according to claim 1, wherein said first and second insulating layers are made of SiO 2 .
Claim 5
Dependent Claim
16 words
A method according to claim 1, wherein said masking film is made of SiO 2 .
Claim 6
Dependent Claim
11 words
A method according to claim 1, wherein said metal is tungsten.
Claim 7
Dependent Claim
17 words
A method according to claim 1, wherein said through-hole is formed by photolithography and dry etching techniques.
Claim 8
Dependent Claim
37 words
A method according to claim 1, wherein said masking film is initially deposited on an upper exposed surface of said second insulating layer, the sidewalls of said through-hole and the exposed portions of said first conductive layer.
Claim 9
Dependent Claim
50 words
A method according to claim 7, wherein in the step of re-exposing said masked portion of said conductive layer, said masking film deposited on the upper exposed surface of said second insulating layer and the exposed portion of said first conductive layer is removed by an ion reactive etching step.
Claim 10
Dependent Claim
41 words
A method according to claim 8, wherein two portions of said masking film deposited on the opposed wall portions of said through-hole are removed by an isotropic etching so as to expose the two opposed surfaces of said second conductive layer.
Claim 11
Dependent Claim
43 words
A method according to claim 1, wherein the deposition of said metal on the surface of said first conductive layer is continued until an end surface of the deposited metal reaches a position close to the opposed surfaces of said second conductive layer.
Claim 12
Independent Claim
243 words
A method of forming a multilayer interconnection structure, comprising the steps of: providing a first conductive layer made of polysilicon; forming a first insulating layer made of SiO 2 on said first conductive layer; forming a second conductive layer made of polysilicon on said first insulating layer; forming a second insulating layer made of SiO 2 on said second conductive layer; forming a through hole in said second insulating, said second conductive and said first insulating layers so as to expose a portion of said first conductive layer and a portion of said second conductive layer, said through hole having sidewalls extending through said second insulating, second conductive and first insulating layers; masking at least the exposed portion of the second conductive layer with a masking film effective to prevent deposit thereon of a metal which has a strong and selective adhesion on said first and second conductive layers by oxidizing or nitriding said exposed portion of said second conductive layer; partially filling the through hole with a metal which contacts the exposed portion of said first conductive layer by depositing said metal by chemical vapor disposition; re-exposing said portion of said second conductive layer masked by said masking film by removing said making film from said portion of said second conductive layer; and substantially filling a remainder of said through hole with said metal by chemical vapor deposition so that said first and second conductive layers are electrically interconnected with each other.
Claim 13
Independent Claim
243 words
A method of forming a multilayer interconnection structure, comprising the steps of: providing a first conductive layer made of polysilicon; forming a first insulating layer made of SiO 2 on said first conductive layer; forming a second conductive layer made of polysilicon on said first insulating layer; forming a second insulating layer made of SiO 2 on said second conductive layer; forming a through hole in said second insulating, said second conductive and said first insulating layers so as to expose a portion of said first conductive layer and a portion of said second conductive layer, said through hole having sidewalls extending through said second insulating, second conductive and first insulating layers; masking at least the exposed portion of the second conductive layer with a masking film effective to prevent deposit thereon of a metal which has a strong and selective adhesion on said first and second conductive layers by oxidizing or nitriding said exposed portion of said second conductive layer; partially filling the through hole with a metal which contacts the exposed portion of said first conductive layer by depositing said metal by chemical vapor disposition; re-exposing said portion of said second conductive layer masked by said masking film by removing said making film from said portion of said second conductive layer; and substantially filling a remainder of said through hole with said metal by chemical vapor deposition so that said first and second conductive layers are electrically interconnected with each other.
References Cited (Backward Citations)
US3691632A
Cited
US4650696A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 1996-07-12 | 1997-01-11 | 1997-07-13 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2000-07-12 | 2001-01-11 | 2001-07-13 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2004-07-12 | 2005-01-11 | 2005-07-13 | $7700.00 | Window Closed / Lapsed |