Patent US5218294A successfully refreshed from Google Patents.
US5218294A
Expired / Lapsed
US
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Contactless test method for testing printed circuit boards
Assignee: Advanced Test Technologies Inc
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Filing: 1992-03-30
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Granted: 1993-06-08
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Expires: 2012-03-30
Abstract
Abstract This application describes a novel method and its implementation for testing unpopulated and populated electronic printed circuit boards (PCBs). This method can be used to develop a new contactless test system (CTS). While eliminating drawbacks of existing test systems, this method measures electromagnetic near field distribution in the vicinity of a PCB, contactlessly, by using suitable sensors (possibly printed near field planar antennas) and sensitive measuring and processing devices. The electromagnetic fields (EMF) are generated by the distribution of charges and currents on paths and elements of the board under test (BUT). Therefore, accurate and repeatable measurements of these fields produce a specific pattern for the BUT. Such a pattern is then compared to a known pattern for the same type of board to determine whether the BUT is faulty or nonfaulty.
Inventors
- 👤 Jacob Soiferman
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 12:00
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/302; G01R31/308; G01R31/309; G01R31/315
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
204 words
A method for testing an unpopulated circuit board including a test arrangement of electrically conductive paths, parts, and surfaces whose electrical and physical continuity and conformance to a known standard of a sample arrangement of unpopulated circuit board is to be verified, the sample arrangement having a predetermined required structure for carrying out a predetermined required function, the method comprising providing said known sample arrangement having said required structure and said required function, applying to the sample arrangement an electrical signal, the signal being independent of the predetermined function, providing an array of non-contact sensors for detecting the electromagnetic near field distribution generated by the sample arrangement in response to the signal, using the array to create a sample pattern representative of the electromagnetic near field distribution of the sample arrangement, applying to said test arrangement said electrical signal, using said array to create a test pattern representative of the electromagnetic near field distribution of the test arrangement, making a comparison of the test pattern with said sample pattern of said known sample arrangement and determining from said comparison whether the test arrangement is in conformance to the known standard, the non-contact sensors of the array each comprising a planar printed spiral loop antenna.
Claim 2
Independent Claim
204 words
A method for testing an unpopulated circuit board including a test arrangement of electrically conductive paths, parts, and surfaces whose electrical and physical continuity and conformance to a known standard of a sample arrangement of unpopulated circuit board is to be verified, the sample arrangement having a predetermined required structure for carrying out a predetermined required function, the method comprising providing said known sample arrangement having said required structure and said required function, applying to the sample arrangement an electrical signal, the signal being independent of the predetermined function, providing an array of non-contact sensors for detecting the electromagnetic near field distribution generated by the sample arrangement in response to the signal, using the array to create a sample pattern representative of the electromagnetic near field distribution of the sample arrangement, applying to said test arrangement said electrical signal, using said array to create a test pattern representative of the electromagnetic near field distribution of the test arrangement, making a comparison of the test pattern with said sample pattern of said known sample arrangement and determining from said comparison whether the test arrangement is in conformance to the known standard, the non-contact sensors of the array each comprising a planar printed spiral loop antenna.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1996-06-07 | 1996-12-07 | 1997-06-08 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2000-06-07 | 2000-12-07 | 2001-06-08 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2004-06-07 | 2004-12-07 | 2005-06-08 | $7700.00 | Window Closed / Lapsed |