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US5215940A Expired / Lapsed US ⏱️ 0.0 years remaining

Wire looping method during wire bonding

Assignee: Texas Instruments Inc
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Filing: 1990-02-05
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Granted: 1993-06-01
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Expires: 2010-02-05
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Abstract

Abstract A method for looping the bond wires used to connected a semiconductor bond pad to a lead frame finger during bonding to improve the clearance between adjacent bond wires.

Inventors

  • 👤 John W. Orcutt
  • 👤 Randy O. Burrows

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-07 14:15
CPC Classifications
B; B23; B23K; B23K20/00; B23K20/002; B23K20/004; B23K20/005; B23K20/007; B23K2101/00; B23K2101/36; B23K2101/40; H; H10; H10W; H10W72/00; H10W72/071; H10W72/0711; H10W72/07141; H10W72/075; H10W72/07521; H10W72/07531; H10W72/07532; H10W72/07551; H10W72/07552; H10W72/07553; H10W72/50; H10W72/521; H10W72/527; H10W72/531; H10W72/536; H10W72/5363; H10W72/537; H10W72/541; H10W72/5449; H10W72/90; H10W72/931; H10W72/932; H10W90/00; H10W90/701; H10W90/751; H10W90/756

Claims Analysis

Total Claims: 11
Claim 1
Independent Claim 113 words
A method of wire looping with a wire bond head, during wire bonding of semiconductor devices to lead frames, to improve clearance between adjacent bond sites, including the steps of: identifying at least one specific bond wire, the direction of which is to be altered; moving the bond head in a direction to alter the path of the at least one specific bond wire to the lead frame, to move the identified at least one specific bond wire away from an adjacent bond wire prior to looping the identified at least one specific bond wire to the lead frame; and bonding the identified at least one specific bond wire to the lead frame.
Claim 2
Independent Claim 113 words
A method of wire looping with a wire bond head, during wire bonding of semiconductor devices to lead frames, to improve clearance between adjacent bond sites, including the steps of: identifying at least one specific bond wire, the direction of which is to be altered; moving the bond head in a direction to alter the path of the at least one specific bond wire to the lead frame, to move the identified at least one specific bond wire away from an adjacent bond wire prior to looping the identified at least one specific bond wire to the lead frame; and bonding the identified at least one specific bond wire to the lead frame.
Claim 3
Dependent Claim 28 words
The method according to claim 1, including the step of visually inspecting a semiconductor device and lead frame to determine which bond wire paths are to be altered.
Claim 4
Dependent Claim 27 words
The method according to claim 1, including the step of mapping the semiconductor device and lead frame to determine which bond wire paths are to be altered.
Claim 5
Dependent Claim 45 words
The method according to claim 3, including determining the altered paths of identified bond wires, based on the mapping of the semiconductor device and lead frame, and moving the bonder bond head in a direction to place the identified bond wires in the altered path.
Claim 6
Dependent Claim 34 words
The method according to claim 4, wherein the bond head is moved in a direction at an angle to the normal direction of the bond head to alter the path of the bond wire.
Claim 7
Independent Claim 123 words
A method of wire looping with a wire bonder bond head, during wire bonding of semiconductor devices to lead frames, to improve clearance between adjacent bond wire, including the steps of: identifying at least one specific bond wire, the direction of which is to be altered; moving the bond head at an angle to the normal direction of the bond head to alter the path of the identified at least one specific bond wire to the lead frame, to move the identified at least one specific bond wire away from an adjacent bond wire prior to looping the identified at least one specific bond wire to the lead frame; and bonding the identified at least one specific bond wire to the lead frame.
Claim 8
Independent Claim 123 words
A method of wire looping with a wire bonder bond head, during wire bonding of semiconductor devices to lead frames, to improve clearance between adjacent bond wire, including the steps of: identifying at least one specific bond wire, the direction of which is to be altered; moving the bond head at an angle to the normal direction of the bond head to alter the path of the identified at least one specific bond wire to the lead frame, to move the identified at least one specific bond wire away from an adjacent bond wire prior to looping the identified at least one specific bond wire to the lead frame; and bonding the identified at least one specific bond wire to the lead frame.
Claim 9
Dependent Claim 28 words
The method according to claim 6, including the step of visually inspecting a semiconductor device and lead frame to determine which bond wire paths are to be altered.
Claim 10
Dependent Claim 27 words
The method according to claim 6, including the step of mapping the semiconductor device and lead frame to determine which bond wire paths are to be altered.
Claim 11
Dependent Claim 45 words
The method according to claim 8, including determining the altered paths of identified bond wires, based on the mapping of the semiconductor device and lead frame, and moving the bonder bond head in a direction to place the identified bond wires in the altered path.

References Cited (Backward Citations)

US3819102A Cited
DD211906A1 Cited
JPS59218745A Cited
JPS6098634A Cited
JPS61248530A Cited
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JPS63269539A Cited
JPS647530A Cited
JPS6448436A Cited
JPH01211932A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1996-05-31 1996-11-30 1997-06-01 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2000-05-31 2000-11-30 2001-06-01 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2004-05-31 2004-11-30 2005-06-01 $7700.00 Window Closed / Lapsed

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