Dual level test fixture

Claim 2

Apparatus for testing a circuit board having a plurality of spaced apart test points, the apparatus comprising: a vacuum well having a bottom plate and a plurality of bores in a bottom plate in a pattern corresponding to that of the test points on the printed circuit board; a first plurality of elongated and spaced apart test probes each extending through a first plurality of bores in the vacuum well and extending a first distance from the top surface of the bottom plate; a second plurality of elongated and spaced apart test probes each extending through a second plurality of bores in the vacuum well and extending a second distance from the top surface of the bottom plate; a stripper plate disposed above and substantially parallel to the top surface of the bottom plate, the stripper plate having bores in a pattern corresponding to that of the test probes; means for holding the circuit board in a testing position above and substantially parallel to the stripper plate so the first plurality of test probes extend through respective bores in the stripper plate and contact the circuit board and so the second plurality of test probes do not contact the circuit board, when the circuit board is in a first position, and so the first and second plurality of test probes extend through respective bores in the stripper plate and contact the circuit board when the circuit board is in a second position; a movable top plate for moving the stripper plate and the circuit board to the first position; an outer gasket contacting the movable top plate in said first position of the stripper plate and the circuit board; a first inner gasket disposed inside the outer gasket to engage the top plate and form a first vacuum chamber between the bottom plate, the outer gasket, the first inner gasket, and the top plate when the circuit board is in the first position; a second inner gasket disposed inside the first inner gasket to engage the stripper plate and form a second vacuum chamber between the bottom plate and the stripper plate, within the boundary of the second inner gasket, when the circuit board is in the second position; and means for applying fluid pressure to the first vacuum chamber to maintain the stripper plate and the circuit board in the first position, and means for applying a fluid pressure to the second vacuum chamber to cause the stripper plate and the circuit board to move from the first to the second position.

Claim 3

Apparatus according to claim 1, in which electrical test signals are applied to the first plurality of test probes and the test signals are detected for conducting a functional test, and electrical test signals are applied to the second plurality of test probes and the test signals are detected for conducting in-circuit testing.

Claim 4

Apparatus according to claim 1, including a first fixed stop in the first vacuum chamber for engaging the top plate to hold the circuit board in the first position, and a second fixed stop in the second vacuum chamber at a level spaced from the level of the first stop for engaging the stripper plate to hold the circuit board in the second position.

Claim 5

Apparatus for testing a circuit board having a plurality of spaced apart test points, the apparatus comprising: a vacuum well having a bottom plate and a plurality of bores in a bottom plate in a pattern corresponding to that of the test points on the printed circuit board; a first plurality of elongated and spaced apart test probes each extending through a first plurality of bores in the vacuum well and extending a first distance from the top surface of the bottom plate; a second plurality of elongated and spaced apart test probes each extending through a second plurality of bores in the vacuum well and extending a second distance from the top surface of the bottom plate; a stripper plate disposed above and substantially parallel to the top surface of the bottom plate, the stripper plate having bores in a pattern corresponding to that of the test probes; a hold down gate for holding the circuit board in a testing position above and substantially parallel to the stripper plate so the first plurality of test probes extend through respective bores in the stripper plate and contact the circuit board and so the second plurality of test probes do not contact the circuit board when the circuit board is in a first position, and so the first and second plurality of test probes extend through respective bores in the stripper plate and contact the circuit board when the circuit board is in a second position; a movable top plate for moving the stripper plate and the circuit board to the first position; an outer gasket contacting the movable top plate in said first position of the circuit board; a first inner gasket disposed inside the outer gasket to engage the top plate and form a first vacuum chamber between the bottom plate, the outer gasket, the first inner gasket, and the top plate when the circuit board is in the first position; a second inner gasket disposed inside the first inner gasket to engage the stripper plate and form a second vacuum chamber between the bottom plate and the stripper plate, within the boundary of the second inner gasket, when the circuit board is in the second position; and a vacuum source for changing the fluid pressure in the first and second vacuum chambers to cause the stripper plate and the circuit board to move from the first to the second position.

Claim 6

Apparatus for testing a circuit board having a plurality of spaced apart test points, the apparatus comprising: a vacuum well having a bottom plate and a plurality of bores in a bottom plate in a pattern corresponding to that of the test points on the printed circuit board; a first plurality of elongated and spaced apart test probes each extending through a first plurality of bores in the vacuum well and extending a first distance from the top surface of the bottom plate; a second plurality of elongated and spaced apart test probes each extending through a second plurality of bores in the vacuum well and extending a second distance from the top surface of the bottom plate; a stripper plate disposed above and substantially parallel to the top surface of the bottom plate, the stripper plate having bores in a pattern corresponding to that of the test probes; a hold down gate for holding the circuit board in a testing position above and substantially parallel to the stripper plate so the first plurality of test probes extend through respective bores in the stripper plate and contact the circuit board and so the second plurality of test probes do not contact the circuit board when the circuit board is in a first position, and so the first and second plurality of test probes extend through respective bores in the stripper plate and contact the circuit board when the circuit board is in a second position; a movable top plate for moving the stripper plate and the circuit board to the first position; an outer gasket contacting the movable top plate in said first position of the circuit board; a first inner gasket disposed inside the outer gasket to engage the top plate and form a first vacuum chamber between the bottom plate, the outer gasket, the first inner gasket, and the top plate when the circuit board is in the first position; a second inner gasket disposed inside the first inner gasket to engage the stripper plate and form a second vacuum chamber between the bottom plate and the stripper plate, within the boundary of the second inner gasket, when the circuit board is in the second position; and a vacuum source for changing the fluid pressure in the first and second vacuum chambers to cause the stripper plate and the circuit board to move from the first to the second position.

Claim 7

Apparatus according to claim 4, including a first fixed stop in the first vacuum chamber for engaging the top plate to hold the circuit board in the first position, and a second fixed stop in the second vacuum chamber at a level spaced from the level of the first stop for engaging the stripper plate to hold the circuit board in the second position.

Claim 8

Apparatus for testing a circuit board having a plurality of spaced apart test points, the apparatus comprising: a vacuum well having a bottom plate and a plurality of bores in a bottom plate in a pattern corresponding to that of the test points on the printed circuit board; a first plurality of elongated and spaced apart test probes each extending through a first plurality of bores in the vacuum well and extending a first distance from the top surface of the bottom plate; a second plurality of elongated and spaced apart test probes each extending through a second plurality of bores in the vacuum well and extending a second distance from the top surface of the bottom plate; a stripper plate disposed above and substantially parallel to the top surface of the bottom plate, the stripper plate having bores in a pattern corresponding to that of the test probes; means for holding the circuit board in a testing position above and substantially parallel to the stripper plate so the first plurality of test probes extend through respective bores in the stripper plate and contact the circuit board and so the second plurality of test probes do not contact the circuit board when the circuit board is in a first position, and so the first and second plurality of test probes extend through respective bores in the stripper plate and contact the circuit board when the circuit board is in a second position, the first and second plurality of test probes being spaced from contact with the circuit board when the circuit board is in a third position; a movable top plate for moving the stripper plate and the circuit board in unison between the first and second position; an outer gasket contacting the movable to plate in said first and second positions of the circuit board; a first inner gasket disposed inside the outer gasket to engage the top plate and form a first vacuum chamber between the bottom plate, the outer gasket, the first inner gasket, and the top plate when the circuit board is in the first position; a second inner gasket disposed inside the first inner gasket to engage the stripper plate and form a second vacuum chamber between the bottom plate and the stripper plate, within the boundary of the second inner gasket, when the circuit board is in the second position; and means for applying a fluid pressure to the first vacuum chamber to cause the stripper plate and the circuit board to move between the first and the second positions, and means for applying a fluid pressure to the second vacuum chamber to cause the stripper plate and the circuit board to move from the second to the third positions.

Claim 9

Apparatus for testing a circuit board having a plurality of spaced apart test points, the apparatus comprising: a vacuum well having a bottom plate and a plurality of bores in a bottom plate in a pattern corresponding to that of the test points on the printed circuit board; a first plurality of elongated and spaced apart test probes each extending through a first plurality of bores in the vacuum well and extending a first distance from the top surface of the bottom plate; a second plurality of elongated and spaced apart test probes each extending through a second plurality of bores in the vacuum well and extending a second distance from the top surface of the bottom plate; a stripper plate disposed above and substantially parallel to the top surface of the bottom plate, the stripper plate having bores in a pattern corresponding to that of the test probes; means for holding the circuit board in a testing position above and substantially parallel to the stripper plate so the first plurality of test probes extend through respective bores in the stripper plate and contact the circuit board and so the second plurality of test probes do not contact the circuit board when the circuit board is in a first position, and so the first and second plurality of test probes extend through respective bores in the stripper plate and contact the circuit board when the circuit board is in a second position, the first and second plurality of test probes being spaced from contact with the circuit board when the circuit board is in a third position; a movable top plate for moving the stripper plate and the circuit board in unison between the first and second position; an outer gasket contacting the movable to plate in said first and second positions of the circuit board; a first inner gasket disposed inside the outer gasket to engage the top plate and form a first vacuum chamber between the bottom plate, the outer gasket, the first inner gasket, and the top plate when the circuit board is in the first position; a second inner gasket disposed inside the first inner gasket to engage the stripper plate and form a second vacuum chamber between the bottom plate and the stripper plate, within the boundary of the second inner gasket, when the circuit board is in the second position; and means for applying a fluid pressure to the first vacuum chamber to cause the stripper plate and the circuit board to move between the first and the second positions, and means for applying a fluid pressure to the second vacuum chamber to cause the stripper plate and the circuit board to move from the second to the third positions.

Claim 10

Apparatus according to claim 6, including a first fixed stop in the first vacuum chamber for engaging the top plate to hold the circuit board in the first position, and a second fixed stop in the second vacuum chamber at a level spaced from the level of the first stop for engaging the stripper plate to hold the circuit board in the second position.

Claim 11

A process for performing electrical testing of a printed circuit board in a test fixture electrically connected to an electronic circuit tester for performing high speed testing of circuits on the board, the process comprising: mounting a printed circuit board in a fixed position on a movable support disposed in the test fixture, the support having a first portion and a second portion; positioning a first array of test probes adjacent the support for contact with a first set of test points on the printed circuit board; positioning a second array of test probes adjacent the support for contact with a second set of test points on the printed circuit board, the second array of probes having ends spaced from the ends of the first array of probes; applying a first vacuum to the first portion of the support to move the first and second portions of the support and the circuit board in unison toward the probes to produce contact between the first test probes and the first set of test points on the board; communicating electrical test signals from the first array of test probes to the electronic circuit tester when the first vacuum is applied; applying a second vacuum to the second portion of the support to move the board and the second portion of the support independently of the first portion of the support toward the probes to produce contact between the second test probes and the second set of test points of the board; and communicating electrical test signals from at least the second array of test probes to the electronic circuit tester when the second vacuum is being applied.

Claim 12

A process for performing electrical testing of a printed circuit board in a test fixture electrically connected to an electronic circuit tester for performing high speed testing of circuits on the board, the process comprising: mounting a printed circuit board in a fixed position on a movable support disposed in the test fixture, the support having a first portion and a second portion; positioning a first array of test probes adjacent the support for contact with a first set of test points on the printed circuit board; positioning a second array of test probes adjacent the support for contact with a second set of test points on the printed circuit board, the second array of probes having ends spaced from the ends of the first array of probes; applying a first vacuum to the first portion of the support to move the first and second portions of the support and the circuit board in unison toward the probes to produce contact between the first test probes and the first set of test points on the board; communicating electrical test signals from the first array of test probes to the electronic circuit tester when the first vacuum is applied; applying a second vacuum to the second portion of the support to move the board and the second portion of the support independently of the first portion of the support toward the probes to produce contact between the second test probes and the second set of test points of the board; and communicating electrical test signals from at least the second array of test probes to the electronic circuit tester when the second vacuum is being applied.

Claim 13

The process according to claim 8, in which the top plate engages a first fixed stop in the first vacuum chamber to hold the circuit board in the first portion, and engaging a second fixed stop in the second vacuum chamber at a level spaced from the level of the top plate to hold the circuit board in the second position.

Claim 14

The process according to claim 8 including conducting a functional test with the first array of probes and conducting an in-circuit test with the second array of probes.

Claim 15

A dual-level test fixture for testing a circuit board comprising: a movable support plate for supporting a printed circuit board under test; a probe plate spaced below the support plate, the probe plate mounting a first set of test probes and a second set of test probes, the first and second sets of probes extending generally perpendicular to the board under test for contacting corresponding test points on the board, the first set of test probes extending to a first level above the probe plate and the second set of test probes extending to a second level above the probe plate spaced from the first level; a movable top plate disposed around an outer boundary of the movable support plate; means for moving the top plate and the support plate in unison; means for forming a first vacuum chamber adjacent the top plate so that air withdrawn from the first chamber draws the top plate and the support in unison toward the test probes and to said first level so the first set of probes contact corresponding test points on the board while the second set of probes remain out of contact with the board; and means for forming a second vacuum chamber adjacent the support plate and isolated from the first chamber so that air withdrawn from the second chamber moves the support plate independently of the top plate to the second level so the second set of probes contact corresponding test points on the board.

Claim 16

A dual-level test fixture for testing a circuit board comprising: a movable support plate for supporting a printed circuit board under test; a probe plate spaced below the support plate, the probe plate mounting a first set of test probes and a second set of test probes, the first and second sets of probes extending generally perpendicular to the board under test for contacting corresponding test points on the board, the first set of test probes extending to a first level above the probe plate and the second set of test probes extending to a second level above the probe plate spaced from the first level; a movable top plate disposed around an outer boundary of the movable support plate; means for moving the top plate and the support plate in unison; means for forming a first vacuum chamber adjacent the top plate so that air withdrawn from the first chamber draws the top plate and the support in unison toward the test probes and to said first level so the first set of probes contact corresponding test points on the board while the second set of probes remain out of contact with the board; and means for forming a second vacuum chamber adjacent the support plate and isolated from the first chamber so that air withdrawn from the second chamber moves the support plate independently of the top plate to the second level so the second set of probes contact corresponding test points on the board.

Claim 17

Apparatus according to claim 11 in which the first set of probes remain in contact with the board during evacuation of the second vacuum chamber.

Claim 18

Apparatus according to claim 11 in which the first set of probes are functional test probes and the second set of probes are in-circuit test probes.

Claim 19

Apparatus according to claim 11 including a hold-down means affixed to the top plate and releasably engaged with the support plate to move the support plate with the top plate when the first chamber is evacuated, the support plate being released from the hold-down means when the second chamber is evacuated.

Claim 20

Apparatus according to claim 11 including a first fixed stop in the first vacuum chamber for engaging the top plate to hold the circuit board at the first level, and a second fixed stop in the second vacuum chamber spaced from the first stop for engaging the support plate to hold the circuit board at the second level.