US4626779A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Spring-stops for a bi-level test fixture
Assignee: Augat Inc
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Filing: 1985-03-19
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Granted: 1986-12-02
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Expires: 2005-03-19
Abstract
Abstract Improved spring-stops for a bi-level test fixture of the type that includes an electronic circuit device receiving face moveable between in-circuit and functional testing levels of a probe support plate are disclosed. A spring-loaded plate is provided below the probe support plate, and a plurality of elongated rods that extend between the electronic circuit device receiving face and the spring-loaded plate are provided for transferring the resilient force of the spring-loaded plate to the electronic circuit device receiving face. The transferred resilient force opposes the force exerted on the electronic circuit device receiving face from either operator or automatic testing equipment selectable vacuum levels such that the electronic circuit device receiving face moves to a selected one of the incircuit and functional testing levels. The rods are individually friction-fit for reciprocating motion in a low coefficient of friction and low compressive strength bushing. Each bushing is friction-fit into a corresponding opening provided therefor in the probe support plate. The low compressive strength and low coefficient of friction material of the bushings normalizes reciprocating rod motion induced strain in such a way as to substantially eliminate rod seizing while maintaining an air-tight seal.
Inventors
- 👤 Michael C. Boyle
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 14:47
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/073; G01R1/07307; G01R1/07314; G01R1/07321; G01R1/07364
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
207 words
A test fixture for providing in-circuit and functional testing of electronic circuit devices by automatic testing equipment, comprising: a probe support plate; a first plurality of spring-loaded contacts fastened to the probe support plate with their contact ends constrained to lie on a first plane defining a functional testing array pattern; a second plurality of upstanding spring-loaded contacts fastened to the probe plate with their contact ends constrained to lie in a second plane different from the first plane defining an in-circuit contact array pattern; an electronic circuit device receiving face; means for mounting the electronic circuit device receiving face for reciprocating motion relative to the probe plate in a direction defined by the normal to its plane; a spring-loaded plate spaced from and generally parallel to the probe plate; means for mounting the spring-loaded plate to the probe plate for reciprocating motion along a direction defined by the normal to its plane; a plurality of elongated rods having ends; and means for mounting the plurality of rods for sliding motion relative to the probe plate with one of the ends of each of the rods confronting the electronic circuit device receiving face and with the other end of each of the rods confronting the spring-loaded plate.
Claim 2
Dependent Claim
207 words
A test fixture for providing in-circuit and functional testing of electronic circuit devices by automatic testing equipment, comprising: a probe support plate; a first plurality of spring-loaded contacts fastened to the probe support plate with their contact ends constrained to lie on a first plane defining a functional testing array pattern; a second plurality of upstanding spring-loaded contacts fastened to the probe plate with their contact ends constrained to lie in a second plane different from the first plane defining an in-circuit contact array pattern; an electronic circuit device receiving face; means for mounting the electronic circuit device receiving face for reciprocating motion relative to the probe plate in a direction defined by the normal to its plane; a spring-loaded plate spaced from and generally parallel to the probe plate; means for mounting the spring-loaded plate to the probe plate for reciprocating motion along a direction defined by the normal to its plane; a plurality of elongated rods having ends; and means for mounting the plurality of rods for sliding motion relative to the probe plate with one of the ends of each of the rods confronting the electronic circuit device receiving face and with the other end of each of the rods confronting the spring-loaded plate.
Claim 3
Dependent Claim
40 words
The invention of claim 1, wherein said upstanding spring-loaded contacts have a center-to-center spacing, and wherein said rods each have a preselected diameter selected to allow their placement within the innerspace defined by the center-to-center spacing of the spring-loaded probes.
Claim 4
Dependent Claim
27 words
The invention of claim 1, wherein said rod mounting means include means for mounting said rods for reciprocating motion in air-tight sealing relation with said probe plate.
Claim 5
Dependent Claim
21 words
The invention of claim 3, wherein said rod mounting means includes a plurality of bushings each having a rod receiving opening.
Claim 6
Dependent Claim
47 words
The invention of claim 4, wherein said probe plate has bushing receiving apertures therethrough, and wherein said rods are press-fit within said rod receiving openings of said bushings and wherein said bushings having said press-fit rods are press-fit into said bushing receiving apertures of the probe plate.
Claim 7
Dependent Claim
21 words
The invention of claim 4, wherein said bushings are fashioned from a low compressive strength and low coefficient of friction material.
Claim 8
Dependent Claim
37 words
The invention of claim 1, wherein said spring-loaded plate mounting means includes a plate having apertures fastened to said probe plate, and a plurality of posts slidably mounted in said apertures and fastened to said spring-loaded plate.
Claim 9
Dependent Claim
32 words
The invention of claim 7, wherein each of said posts have a flange on the ends thereof remote from the ends thereof fastened to the spring-loaded plate that each abut said plate.
Claim 10
Dependent Claim
39 words
The invention of claim 8, wherein a plurality of coil springs are slidably mounted on corresponding posts between and abutting said plate and spring-loaded plated in such a way as to exert a preselected pre-load on said spring-loaded plate.
References Cited (Backward Citations)
US3676776A
Cited
US3757219A
Cited
US3891924A
Cited
US4056777A
Cited
US4099120A
Cited
US4055805A
Cited
US4115735A
Cited
US4164704A
Cited
US4112363A
Cited
US4357062A
Cited
US4536051A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1989-12-01 | 1990-06-02 | 1990-12-02 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1993-12-01 | 1994-06-02 | 1994-12-02 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1997-12-01 | 1998-06-02 | 1998-12-02 | $7700.00 | Window Closed / Lapsed |