Patent US5205900A successfully refreshed from Google Patents.
US5205900A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of monitoring surface roughness of crystal, and crystal growth equipment
Assignee: Panasonic Holdings Corp
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Filing: 1991-05-21
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Granted: 1993-04-27
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Expires: 2011-05-21
Abstract
Abstract Changes in the formation of crystal surface roughness are monitored by making a laser beam incident on the surface of a growing crystal and detecting a reflected laser beam diffracted at the surface of the growing crystal, at a position standing apart from the optical axis of mirror face reflected light of the incident laser beam. A crystal growth equipment making use of this method is also disclosed.
Inventors
- 👤 Kaoru Inoue
- 👤 Jean C. Harmand
- 👤 Toshinobu Matsuno
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 14:29
CPC Classifications
C; C30; C30B; C30B25/00; C30B25/02; C30B23/00; C30B23/02; Y; Y10; Y10S; Y10S117/00; Y10S117/913
Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
141 words
A method of monitoring the surface roughness of a crystal, said crystal being grown on a main plane of a first-material substrate crystal provided on a surface of a rotatable substrate holder in a vacuum chamber, said surface generally perpendicular to an axis of said rotatable substrate holder, said crystal grown as a second-material thin-film crystal being different from said first-material substrate crystal, which comprises making a laser beam incident on the surface of the second-material thin-film crystal which is growing, and detecting a diffracted laser beam from the surface of the second-material thin-film crystal by a diffracted laser beam-detecting device provided at a position standing apart from the optical axis of mirror face reflected light of said incident laser beam while rotating the substrate holder about said axis, to detect the change in the intensity of the diffracted laser beam.
Claim 2
Independent Claim
141 words
A method of monitoring the surface roughness of a crystal, said crystal being grown on a main plane of a first-material substrate crystal provided on a surface of a rotatable substrate holder in a vacuum chamber, said surface generally perpendicular to an axis of said rotatable substrate holder, said crystal grown as a second-material thin-film crystal being different from said first-material substrate crystal, which comprises making a laser beam incident on the surface of the second-material thin-film crystal which is growing, and detecting a diffracted laser beam from the surface of the second-material thin-film crystal by a diffracted laser beam-detecting device provided at a position standing apart from the optical axis of mirror face reflected light of said incident laser beam while rotating the substrate holder about said axis, to detect the change in the intensity of the diffracted laser beam.
Claim 3
Dependent Claim
26 words
The method according to claim 1 including the step of providing on an irregular surface roughness on the first-material crystal substrate prior to growing said crystal.
Claim 4
Dependent Claim
198 words
A crystal surface roughness-monitoring equipment comprising: a vacuum chamber; a substrate holder having a surface and an axis generally perpendicular to said surface provided in the vacuum chamber; at least one crystal growth vessel for carrying out growth of a crystal on a substrate provided on the surface of the substrate holder, said crystal being composed of a material different from the material of the substrate; a first view port provided in the wall of the vacuum chamber; a laser beam source for irradiating the crystal with a laser beam through the first view port; a second view port provided in the wall of the vacuum chamber at a position standing apart from the optical axis of a mirror face reflected light of the laser beam, a detecting device for detecting a diffracted laser beam which is diffracted at the crystal surface, through the second view port; wherein the crystal surface roughness is monitored by carrying out the growth of the crystal on the substrate, detecting the diffracted laser beam while rotating the substrate, and monitoring the change in the intensity of the diffracted laser beam to monitor the surface roughness of the crystal growing on the substrate.
Claim 5
Dependent Claim
198 words
A crystal surface roughness-monitoring equipment comprising: a vacuum chamber; a substrate holder having a surface and an axis generally perpendicular to said surface provided in the vacuum chamber; at least one crystal growth vessel for carrying out growth of a crystal on a substrate provided on the surface of the substrate holder, said crystal being composed of a material different from the material of the substrate; a first view port provided in the wall of the vacuum chamber; a laser beam source for irradiating the crystal with a laser beam through the first view port; a second view port provided in the wall of the vacuum chamber at a position standing apart from the optical axis of a mirror face reflected light of the laser beam, a detecting device for detecting a diffracted laser beam which is diffracted at the crystal surface, through the second view port; wherein the crystal surface roughness is monitored by carrying out the growth of the crystal on the substrate, detecting the diffracted laser beam while rotating the substrate, and monitoring the change in the intensity of the diffracted laser beam to monitor the surface roughness of the crystal growing on the substrate.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1996-04-26 | 1996-10-26 | 1997-04-27 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2000-04-26 | 2000-10-26 | 2001-04-27 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2004-04-26 | 2004-10-26 | 2005-04-27 | $7700.00 | Window Closed / Lapsed |