Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
93 words
A test circuit for an integrated circuit having output buffer for providing output signal on associated signal pad, comprising: a first test bus; a second test bus; current sensing means connected to said output buffers; selection means respectively associated with respective current sensing means for controllably coupling said current sensing means to said first and second test busses; and comparator means responsive to the signals on said first and second test busses for providing an indication of whether the current flow sensed by a selected current sensing means is outside a predetermined range.
Claim 2
Dependent Claim
93 words
A test circuit for an integrated circuit having output buffer for providing output signal on associated signal pad, comprising: a first test bus; a second test bus; current sensing means connected to said output buffers; selection means respectively associated with respective current sensing means for controllably coupling said current sensing means to said first and second test busses; and comparator means responsive to the signals on said first and second test busses for providing an indication of whether the current flow sensed by a selected current sensing means is outside a predetermined range.
Claim 3
Dependent Claim
83 words
The test circuit of claim 1 wherein: said current sensing means includes a current sensing resistor; said selection means includes (a) a first transmission gate connected between one side of said current sensing resistor and said first test bus, and (b) a second transmission gate connected between the other side of the associated current sensing resistor and said second test bus; and said comparator means includes first and second comparators having inputs connected to said first test bus and said second test bus.
Claim 4
Dependent Claim
25 words
The test circuit of claim 2 wherein the first and second transmission gates said an output buffer are controlled in parallel via a scan register.
Claim 5
Dependent Claim
121 words
A test circuit for an integrated circuit having an output buffer for providing output signal on an associated signal pad, comprising: a first test bus; a second test bus; current sensing means connected to said output buffer; selection means respectively associated with respective current sensing means for controllably coupling a selected current sensing means to said first and second test busses; and comparator means responsive to the signals on said first and second test busses for providing an indication of whether current in a first direction sensed by said current sensing means is greater than a first direction current limit, and whether current in a second direction sensed by said current sensing means is greater than a second direction current limit.
Claim 6
Dependent Claim
121 words
A test circuit for an integrated circuit having an output buffer for providing output signal on an associated signal pad, comprising: a first test bus; a second test bus; current sensing means connected to said output buffer; selection means respectively associated with respective current sensing means for controllably coupling a selected current sensing means to said first and second test busses; and comparator means responsive to the signals on said first and second test busses for providing an indication of whether current in a first direction sensed by said current sensing means is greater than a first direction current limit, and whether current in a second direction sensed by said current sensing means is greater than a second direction current limit.
Claim 7
Dependent Claim
75 words
A test circuit for an integrated circuit having output buffer for providing output signal on associated signal pads, comprising: current sensing means connected to said output buffer; comparator means selectively connectable to said current sensing means for providing an indication of whether current sensed by said current sensing means is outside a predetermined range; and selection means connected to said current sensing means for controllably connecting a selected current sensing means to said comparison means.
Claim 8
Dependent Claim
75 words
A test circuit for an integrated circuit having output buffer for providing output signal on associated signal pads, comprising: current sensing means connected to said output buffer; comparator means selectively connectable to said current sensing means for providing an indication of whether current sensed by said current sensing means is outside a predetermined range; and selection means connected to said current sensing means for controllably connecting a selected current sensing means to said comparison means.