Plasma process apparatus and plasma processing method

Claim 2

A plasma processing apparatus comprising: a cylindrical plasma generating chamber having openings at the opposite ends thereof; a cylindrical processing chamber communicating with said plasma generating chamber via the opening at one end of said plasma chamber; means for evacuating said plasma generating chamber and said processing chamber; a microwave generator for generating pulses of microwaves; a waveguide means for transferring said pulses of microwaves through an opening at the end of said plasma chamber; a means for supplying a gas into said plasma generating chamber; an excitation solenoid surrounding said plasma generating chamber for generating a magnetic field within said plasma chamber for transforming said gas, by resonance effects with said microwaves, into a plasma of active atoms, molecules or ions; support means positioned within said processing chamber for supporting a substrate to be processed in a position to be bombarded by active atoms, molecules or ions flowing out of said plasma chamber along lines of magnetic force; controllable means for generating an RF bias voltage to be applied to said substrate; controllable for generating a DC bias voltage to be applied to said substrate; synchronizing means for generating synchronizing signals for keying said RF bias voltage and said DC bias voltage during periods when said microwave pulses are generated; and mixing means, coupled to said means for generating an RF bias voltage and said means for generating a DC bias voltage, for applying the RF bias voltage and the DC bias voltage to the substrate; said RF bias voltage and the DC bias voltage being independently controllable for allowing variance of processing conditions, and being applied to the substrate only when the microwaves have been introduced into the plasma generating chamber and plasma is being generated, thereby preventing damage to the substrate surface.

Claim 3

A plasma processing apparatus as set forth in claim 1, wherein said synchronizing means comprises: a synchronization pulse generating means for generating said synchronizing signals; and a pulse signal transmitting means for transferring said synchronizing signals to said RF generating means, to said DC generating means, and to said microwave generator such that said RF bias voltage and said DC bias voltage are applied to said substrate in synchronism with the generation of said plasma.

Claim 4

A plasma processing apparatus as set forth in claim 2, wherein said synchronization pulse generation means comprises: an oscillation circuit for generating an alternating current at a predetermined frequency; a pulse transforming circuit, coupled to said oscillation circuit, for transforming the alternating current into rectangular waves; and first and second output buffers, coupled to said pulse transforming circuit, for transferring said rectangular waves to said pulse signal transmitting means.

Claim 5

A plasma processing apparatus as set forth in claim 3, wherein said means for generating an RF bias voltage comprises an RF bias modulation circuit comprising a trigger circuit for receiving the rectangular waves, a modulation circuit coupled to said trigger circuit, a setting circuit containing preset data coupled to said modulation circuit, and an output circuit; and an RF generator.

Claim 6

A plasma processing apparatus as set forth in claim 3, wherein said means for generating a DC bias voltage comprises: a DC bias modulation circuit comprising a trigger circuit for receiving the rectangular waves, a modulation circuit coupled to said trigger circuit, a setting circuit containing preset data coupled to said modulation circuit, and an output circuit; and an DC generator.

Claim 7

A plasma processing apparatus as set forth in claim 1, wherein said mixing means comprises an inductor of a predetermined value, one lead coupled to the output of said DC generating means, and the other lead coupled to the output of said RF generating means.

Claim 8

A plasma processing apparatus as set forth in claim 6, wherein said mixing means further comprises a capacitor of predetermined value coupled across said inductor.

Claim 9

A plasma processing apparatus comprising: a cylindrical plasma generating chamber having openings at the opposite ends thereof; a cylindrical processing chamber communicating with said plasma generating chamber via the opening at one end of said plasma chamber; means for evacuating said plasma generating chamber and said processing chamber; a microwave generator for generating pulses of microwaves; a waveguide means for transferring said pulses of microwaves through an opening at the end of said plasma chamber; means for supplying a gas into said plasma generating chamber; an excitation solenoid surrounding said plasma generating chamber for generating a magnetic field within said plasma chamber for transforming said gas, by resonance effects with said microwaves, into a plasma of active atoms, molecules of ions; support means positioned within said processing chamber for supporting a substrate to be processed in a position to be bombarded by active atoms, molecules or ions flowing out of said plasma chamber along lines of magnetic force; a controllable RF generator for generating controllable amplitudes of an RF bias voltage to be applied to said substrate; synchronizing means for generating synchronization signals for keying said RF bias voltage during periods when said microwave pulses are generated; RF-bias-modulation means comprising a trigger circuit, a modulation signal generating circuit, a modulating circuit, and an output circuit having a current amplifying function, said RF-bias-modulation means coupled to said synchronizing means and to said RF generator, for varying the RF bias voltage in a predetermined pattern during periods when said microwave pulses are generated; and the amplitude of the RF bias voltage being controllable for allowing variance of processing conditions, and being applied to the substrate only when the microwaves have been introduced into the plasma generating chamber and plasma is being generated, thereby preventing damage to the substrate.

Claim 10

A plasma processing apparatus comprising: a cylindrical plasma generating chamber having openings at the opposite ends thereof; a cylindrical processing chamber communicating with said plasma generating chamber via the opening at one end of said plasma chamber; means for evacuating said plasma generating chamber and said processing chamber; a microwave generator for generating pulses of microwaves; a waveguide means for transferring said pulses of microwaves through an opening at the end of said plasma chamber; means for supplying a gas into said plasma generating chamber; an excitation solenoid surrounding said plasma generating chamber for generating a magnetic field within said plasma chamber for transforming said gas, by resonance effects with said microwaves, into a plasma of active atoms, molecules of ions; support means positioned within said processing chamber for supporting a substrate to be processed in a position to be bombarded by active atoms, molecules or ions flowing out of said plasma chamber along lines of magnetic force; a controllable RF generator for generating controllable amplitudes of an RF bias voltage to be applied to said substrate; synchronizing means for generating synchronization signals for keying said RF bias voltage during periods when said microwave pulses are generated; RF-bias-modulation means comprising a trigger circuit, a modulation signal generating circuit, a modulating circuit, and an output circuit having a current amplifying function, said RF-bias-modulation means coupled to said synchronizing means and to said RF generator, for varying the RF bias voltage in a predetermined pattern during periods when said microwave pulses are generated; and the amplitude of the RF bias voltage being controllable for allowing variance of processing conditions, and being applied to the substrate only when the microwaves have been introduced into the plasma generating chamber and plasma is being generated, thereby preventing damage to the substrate.

Claim 11

A plasma processing apparatus as set forth in claim 8, wherein said synchronizing means comprises: a synchronization pulse generating means for generating said synchronizing signals; and a pulse signal transmitting means for transferring said synchronizing signals to said RF generating means, to said DC generating means, and to said microwave generator such that said RF bias voltage and said DC bias voltage are applied to said substrate in synchronism with the generation of said plasma.

Claim 12

A plasma processing apparatus as set forth in claim 9, wherein said synchronization pulse generation means comprises: an oscillation circuit for generating an alternating current at a predetermined frequency; a pulse transforming circuit, coupled to said oscillation circuit, for transforming the alternating current into rectangular waves; and first and second output buffers, coupled to said pulse transforming circuit, for transferring said rectangular waves to said pulse signal transmitting means.

Claim 13

A plasma processing apparatus as set forth in claim 8 wherein said RF bias modulation means varies the RF voltage so as to provide a pulse of RF of decreasing amplitude.

Claim 14

A plasma processing apparatus as set forth in claim 8 wherein the said RF bias modulation means varies the RF voltage so as to provide a narrow pulse of RF comprising a base portion and a peak portion.