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Method of manufacturing photovoltaic device

Assignee: Sanyo Electric Co Ltd
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Filing: 1991-06-20
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Granted: 1992-10-13
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Expires: 2011-06-20
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Abstract

Abstract A method of manufacturing a photovoltaic device, wherein an amorphous semiconductor layer of one conductivity type doped with impurities which determine the conductivity type is formed on a substrate having a conductive surface, an insulating film is formed on this amorphous semiconductor layer, the insulating film is patterned to partially form aperture regions where the surface of said amorphous semiconductor layer is exposed, an intrinsic amorphous semiconductor layer on said insulating film and the aperture regions formed over the substrate, the amorphous semiconductor layer of one conductivity type and the intrinsic amorphous semiconductor layer are thermally treated, crystallization is advanced using the amorphous semiconductor layer of one conductivity type located beneath said aperture region as a core to form a polycrystal semiconductor layer of one conductivity type, a semiconductor layer of the other conductivity type is formed on this polycrystal semiconductor layer, and an electrode is formed in contact with the semiconductor layer region of the other conductivity type located over said aperture regions.

Inventors

  • 👤 Shigeru Noguchi
  • 👤 Hiroshi Iwata
  • 👤 Keiichi Sano

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-05 19:05
CPC Classifications
H; H10; H10F; H10F71/00; H10F71/10; H10F71/103; H10F10/00; H10F10/10; H10F10/17; H10F19/00; H10F19/20; H10F71/131; H10F77/00; H10F77/10; H10F77/16; H10F77/169; H10F77/1692; Y; Y02; Y02E; Y02E10/00; Y02E10/50; Y02E10/548; Y02P; Y02P70/00; Y02P70/50

Claims Analysis

Total Claims: 16
Claim 1
Independent Claim 162 words
A method of manufacturing a photovoltaic device, comprising the steps of: forming an amorphous semiconductor layer of one conductivity type doped with impurities determining the conductivity type on a substrate having a conductive surface; forming an insulating film on said amorphous semiconductor layer; patterning said insulating film and partially forming aperture regions where the surface of said amorphous semiconductor layer is exposed; forming an intrinsic amorphous semiconductor layer on said insulating film and the aperture regions formed over the substrate; applying thermal treatment to said amorphous semiconductor layer of one conductivity type and the intrinsic amorphous semiconductor layer, advancing crystallization using the amorphous semiconductor layer of one conductivity type located beneath said aperture regions as a core, and forming a polycrystalline semiconductor layer of one conductivity type; forming a semiconductor layer of opposite conductivity type on this polycrystalline semiconductor layer; and forming an electrode which comes in contact with the semiconductor layer region of opposite conductivity type located over said aperture regions.
Claim 2
Independent Claim 162 words
A method of manufacturing a photovoltaic device, comprising the steps of: forming an amorphous semiconductor layer of one conductivity type doped with impurities determining the conductivity type on a substrate having a conductive surface; forming an insulating film on said amorphous semiconductor layer; patterning said insulating film and partially forming aperture regions where the surface of said amorphous semiconductor layer is exposed; forming an intrinsic amorphous semiconductor layer on said insulating film and the aperture regions formed over the substrate; applying thermal treatment to said amorphous semiconductor layer of one conductivity type and the intrinsic amorphous semiconductor layer, advancing crystallization using the amorphous semiconductor layer of one conductivity type located beneath said aperture regions as a core, and forming a polycrystalline semiconductor layer of one conductivity type; forming a semiconductor layer of opposite conductivity type on this polycrystalline semiconductor layer; and forming an electrode which comes in contact with the semiconductor layer region of opposite conductivity type located over said aperture regions.
Claim 3
Dependent Claim 22 words
The method of manufacturing the photovoltaic device according to claim 1, wherein said aperture regions include holes formed in said insulating film.
Claim 4
Dependent Claim 27 words
The method of manufacturing the photovoltaic device according to claim 1, wherein said aperture regions include strait regions surrounding said insulating film arranged in an island manner.
Claim 5
Dependent Claim 22 words
The method of manufacturing the photovoltaic device according to claim 1, wherein the distance between said aperture regions arranged is 1-500 μm.
Claim 6
Independent Claim 158 words
A method of manufacturing a photovoltaic device, comprising the steps of: forming an insulating film on a substrate having a conductive surface; patterning this insulating film and partially forming aperture regions where the surface of said substrate is exposed; forming an amorphous semiconductor layer of one conductivity type doped with impurities determining the conductivity type only in the aperture regions; forming an intrinsic amorphous semiconductor layer on said insulating film and the amorphous semiconductor layer of one conductivity type formed over said substrate; thermally treating said amorphous semiconductor layer of one conductivity type and the intrinsic amorphous semiconductor layer, advancing crystallization using said amorphous semiconductor layer of one conductivity type as a core and forming a polycrystalline semiconductor layer of one conductivity type; forming a semiconductor layer of opposite conductivity type on this polycrystalline semiconductor layer; and forming an electrode which comes in contact with the semiconductor layer region of opposite conductivity type located over said aperture regions.
Claim 7
Independent Claim 158 words
A method of manufacturing a photovoltaic device, comprising the steps of: forming an insulating film on a substrate having a conductive surface; patterning this insulating film and partially forming aperture regions where the surface of said substrate is exposed; forming an amorphous semiconductor layer of one conductivity type doped with impurities determining the conductivity type only in the aperture regions; forming an intrinsic amorphous semiconductor layer on said insulating film and the amorphous semiconductor layer of one conductivity type formed over said substrate; thermally treating said amorphous semiconductor layer of one conductivity type and the intrinsic amorphous semiconductor layer, advancing crystallization using said amorphous semiconductor layer of one conductivity type as a core and forming a polycrystalline semiconductor layer of one conductivity type; forming a semiconductor layer of opposite conductivity type on this polycrystalline semiconductor layer; and forming an electrode which comes in contact with the semiconductor layer region of opposite conductivity type located over said aperture regions.
Claim 8
Dependent Claim 22 words
The method of manufacturing the photovoltaic device according to claim 5, wherein said aperture regions include holes formed in said insulating film.
Claim 9
Dependent Claim 27 words
The method of manufacturing the photovoltaic device according to claim 5, wherein said aperture regions include strait regions surrounding said insulating film arranged in an island manner.
Claim 10
Dependent Claim 22 words
The method of manufacturing the photovoltaic device according to claim 5, wherein the distance between said aperture regions arranged is 1-500 μm.
Claim 11
Independent Claim 154 words
A method of manufacturing a photovoltaic device, comprising the steps of: forming a semiconductor layer of one conductivity type and an intrinsic amorphous semiconductor layer layered in this order on a substrate having a conductive surface; forming an insulating film on said amorphous semiconductor layer; patterning said insulating film and partially forming aperture regions where the surface of said intrinsic amorphous semiconductor layer is exposed; forming an amorphous semiconductor layer of opposite conductivity type on said insulating film and the aperture regions formed over the substrate; thermally treating said intrinsic amorphous semiconductor layer and the amorphous semiconductor layer of opposite conductivity type, advancing crystallization using the amorphous semiconductor layer of opposite conductivity type located in said aperture regions as a core, and forming a polycrystalline semiconductor layer of opposite conductivity type; and forming an electrode which comes in contact with said polycrystalline semiconductor layer region of opposite conductivity type located over said aperture regions.
Claim 12
Independent Claim 154 words
A method of manufacturing a photovoltaic device, comprising the steps of: forming a semiconductor layer of one conductivity type and an intrinsic amorphous semiconductor layer layered in this order on a substrate having a conductive surface; forming an insulating film on said amorphous semiconductor layer; patterning said insulating film and partially forming aperture regions where the surface of said intrinsic amorphous semiconductor layer is exposed; forming an amorphous semiconductor layer of opposite conductivity type on said insulating film and the aperture regions formed over the substrate; thermally treating said intrinsic amorphous semiconductor layer and the amorphous semiconductor layer of opposite conductivity type, advancing crystallization using the amorphous semiconductor layer of opposite conductivity type located in said aperture regions as a core, and forming a polycrystalline semiconductor layer of opposite conductivity type; and forming an electrode which comes in contact with said polycrystalline semiconductor layer region of opposite conductivity type located over said aperture regions.
Claim 13
Dependent Claim 22 words
The method of manufacturing the photovoltaic device according to claim 9, wherein said aperture regions include holes formed in said insulating film.
Claim 14
Dependent Claim 27 words
The method of manufacturing the photovoltaic device according to claim 9, wherein said aperture regions include strait regions surrounding said insulating film arranged in an island manner.
Claim 15
Dependent Claim 22 words
The method of manufacturing the photovoltaic device according to claim 9, wherein the distance between said aperture regions arranged is 1-500 μm.
Claim 16
Dependent Claim 24 words
The method of manufacturing the photovoltaic device according to claim 9, wherein said semiconductor layer of one conductivity type includes a polycrystalline semiconductor layer.

References Cited (Backward Citations)

US4062038A Cited
US4431858A Cited
DE3441044A1 Cited
JPS63152177A Cited
JPS63170976A Cited
EP0334110A2 Cited
JPH0230766A Cited
JPH02185072A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1995-10-13 1996-04-13 1996-10-13 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1999-10-13 2000-04-13 2000-10-13 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2003-10-13 2004-04-13 2004-10-13 $7700.00 Window Closed / Lapsed

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