US5151652A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Measuring position for microwave components
Assignee: Siemens AG
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Filing: 1990-09-28
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Granted: 1992-09-29
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Expires: 2010-09-28
Abstract
Abstract A measuring position for a microwave component having a carrier (10) for the microwave component and having at least one test probe (5). The measuring position provides for non-destructive identification of the properties of microwave circuits on small substrate surfaces even when measuring quasi-planar circuits having connecting lines in asymmetrical microstrip line technology. The spatial position of the test probe (5) is variable and adjustable in three spatial directions relative to the spatial position of the carrier (10).
Inventors
- 👤 Hugo Moschuering
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 14:19
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/06772
Claims Analysis
Total Claims: 15
Claim 1
Independent Claim
93 words
Measuring position for a microwave component, having a carrier for the microwave component and at least one test probe, comprising spatial positions of the at least one test probe being variable and adjustable in three spatial dimensions relative to a spatial position of the carrier, at least the one test probe being variable and adjustable in three spatial dimensions, and the at least one test probe having a structure for exerting mechanical pressure onto the microwave component such that a nose of the at least one test probe substantially contacts the microwave component.
Claim 2
Dependent Claim
93 words
Measuring position for a microwave component, having a carrier for the microwave component and at least one test probe, comprising spatial positions of the at least one test probe being variable and adjustable in three spatial dimensions relative to a spatial position of the carrier, at least the one test probe being variable and adjustable in three spatial dimensions, and the at least one test probe having a structure for exerting mechanical pressure onto the microwave component such that a nose of the at least one test probe substantially contacts the microwave component.
Claim 3
Dependent Claim
21 words
Measuring position according to claim 1, wherein the spatial position of the carrier is variable and adjustable in three spatial dimensions.
Claim 4
Dependent Claim
31 words
Measuring position according to claim 1, wherein said measuring position further comprises a means for automatic adjustment of at least one of the carrier and the at least one test probe.
Claim 5
Dependent Claim
20 words
Measuring position according to claim 1, wherein the at least one test probe has the form of a coaxial line.
Claim 6
Dependent Claim
19 words
Measuring position according to claim 4, wherein a coaxial outer conductor of the coaxial line presses against the carrier.
Claim 7
Dependent Claim
27 words
Measuring position according to claim 1, wherein the at least one test probe is rotatably seated relative to the carrier via a means for providing a hinge.
Claim 8
Dependent Claim
27 words
Measuring position according to claim 1, wherein the measuring position comprises a plurality of test probes and wherein the test probes are chronologically movable in arbitrary combinations.
Claim 9
Dependent Claim
29 words
Measuring position according to claim 1, wherein the measuring position further comprises a means for direct testing of a semiconductor component within a microwave circuit of the microwave component.
Claim 10
Dependent Claim
17 words
Measuring position according to claim 1, wherein the at least one test probe has a multi-conductor structure.
Claim 11
Dependent Claim
22 words
Measuring position according to claim 1, wherein the measuring position further comprises a network integrated into the at least one test probe.
Claim 12
Dependent Claim
93 words
Measuring position for a microwave component, having a carrier for the microwave component and at least one test probe for contacting the microwave component, comprising a spatial position of the at least one test probe relative to a spatial position of the carrier being variable and adjustable in three spatial dimensions; the at least one test probe being a coaxial line having at least a coaxial outer conductor which presses against the carrier; and the at least one test probe being rotatably seated relative to the carrier via means for providing a hinge.
Claim 13
Dependent Claim
93 words
Measuring position for a microwave component, having a carrier for the microwave component and at least one test probe for contacting the microwave component, comprising a spatial position of the at least one test probe relative to a spatial position of the carrier being variable and adjustable in three spatial dimensions; the at least one test probe being a coaxial line having at least a coaxial outer conductor which presses against the carrier; and the at least one test probe being rotatably seated relative to the carrier via means for providing a hinge.
Claim 14
Dependent Claim
21 words
Measuring position according to claim 11, wherein the spatial position of the carrier is variable and adjustable in three spatial dimensions.
Claim 15
Dependent Claim
24 words
Measuring position according to claim 11, wherein the at least one test probe has a structure for exerting mechanical pressure onto the microwave component.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1995-09-29 | 1996-03-30 | 1996-09-29 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1999-09-29 | 2000-03-30 | 2000-09-29 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2003-09-29 | 2004-03-30 | 2004-09-29 | $7700.00 | Window Closed / Lapsed |