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US5148102A Expired / Lapsed US ⏱️ 0.0 years remaining

Apparatus for the electrical function testing of wiring matrices, particularly of printed circuit boards

Assignee: Siemens AG
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Filing: 1990-08-22
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Granted: 1992-09-15
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Expires: 2010-08-22
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Abstract

Abstract An apparatus for testing, for example, printed circuit boards having measuring locations connected by interconnects in which some of the measuring locations are closely spaced, includes a carrier plate having an arrangement of gas discharge channels each provided with an electrode for separate ionic contact with the more widely space measuring locations. The more closely space measuring locations are ionically contacted by a group gas discharge channel having a group electrode which extends over a group of the closely space measuring locations. The group gas discharge channel in one embodiment is an oblong hole in the carrier plate with a wire extending along its length. Current flow and voltage via the ionic contact is measured to identify faults in the interconnects between the measuring locations.

Inventors

  • 👤 Thomas Rose
  • 👤 Detlef Hoffmann

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-01 08:40
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/07; G01R1/072; G01R31/00; G01R31/28; G01R31/2801; G01R31/2805

Claims Analysis

Total Claims: 5
Claim 1
Independent Claim 141 words
An apparatus for the electrical function testing of wiring matrices that comprise a plurality of first measuring locations arranged at a relatively great spacing from one another and comprise at least one group of second measuring locations arranged at a finer spacing from one another, the apparatus comprising: a carrier plate that can be put in place onto the wiring matrices, first gas discharge channels in said carrier plate allocated to the first measuring locations, each of said gas discharge channels being provided with first electrodes, and a group gas discharge channel in said carrier plate allocated to the group of second measuring locations, said group gas discharge channel being provided with a group electrode so that at least respectively two selected measuring locations of a wiring matrix can be ionically contacted via the allocated gas discharge channels and their electrodes.
Claim 2
Independent Claim 141 words
An apparatus for the electrical function testing of wiring matrices that comprise a plurality of first measuring locations arranged at a relatively great spacing from one another and comprise at least one group of second measuring locations arranged at a finer spacing from one another, the apparatus comprising: a carrier plate that can be put in place onto the wiring matrices, first gas discharge channels in said carrier plate allocated to the first measuring locations, each of said gas discharge channels being provided with first electrodes, and a group gas discharge channel in said carrier plate allocated to the group of second measuring locations, said group gas discharge channel being provided with a group electrode so that at least respectively two selected measuring locations of a wiring matrix can be ionically contacted via the allocated gas discharge channels and their electrodes.
Claim 3
Dependent Claim 31 words
An apparatus according to claim 1, wherein the group comprises an oblong hole in said carrier plate for allocation to a group of second measuring locations arranged side-by-side in a row.
Claim 4
Dependent Claim 20 words
An apparatus according to claim 1, wherein the group electrode is a wire that crosses the group gas discharge channel.
Claim 5
Dependent Claim 50 words
An apparatus according to claim 1, further comprising: means for the quantitative acquisition of test current and test voltage between a first electrode and a group electrode and for calculating the overall area or the overall number of contacted, second measuring locations dependent on test current and on test voltage.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1995-09-15 1996-03-16 1996-09-15 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1999-09-15 2000-03-16 2000-09-15 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2003-09-15 2004-03-16 2004-09-15 $7700.00 Window Closed / Lapsed

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