US5112435A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Materials and methods for etching silicides, polycrystalline silicon and polycides
Assignee: Applied Materials Inc
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Filing: 1989-11-29
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Granted: 1992-05-12
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Expires: 2009-11-29
Abstract
Abstract Gas chemistry and a related RIE mode process is described for etching silicides of the refractory metals titanium, tantalum, tungsten and aluminum and for etching composites of these silicides on polycrystalline silicon layers. BCl3 is added to the HCl/Cl2 gas chemistry used for the polysilicon etch along with additives selected from fluorinated gases and oxygen to satisfy the multiple requirement of the two-step silicide-polysilicon etch process, including the silicide-to-polysilicon etch ratio requirement.
Inventors
- 👤 David N. Wang
- 👤 Mei Cheng
- 👤 Toung K. Leong, deceased
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 13:51
CPC Classifications
H; H10; H10P; H10P50/00; H10P50/20; H10P50/26; H10P50/264; H10P50/266; H10P50/267; H10P50/268
Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
158 words
A method for residue-free etching of a non-planar stepped topography of a layer of refractory metal silicide selected from molybdenum silicide and tungsten silicide formed on a layer of polysilicon on silicon oxide, comprising: supplying RF electrical energy between a pair of electrodes in a chamber, one of which electrodes supports a masked, non-planar stepped composite comprising an organic mask over silicide selected from molybdenum silicide and tungsten silicide over polysilicon over silicon oxide; and communicating into said chamber a reactive gas mixture comprising principally a mixture of chlorine and BCl 3 along with HCl and a small amount of dopant gas, not exceeding twenty volume percent of the total gas flow, selected from the group consisting of fluorine-containing gas, oxygen, and a mixture of fluorine-containing gas and oxygen, for etching the silicide anisotropically with a high selectivity to the organic mask for preserving the mask, and with a silicide to polysilicon selectivity of at least about 2/1.
Claim 2
Independent Claim
158 words
A method for residue-free etching of a non-planar stepped topography of a layer of refractory metal silicide selected from molybdenum silicide and tungsten silicide formed on a layer of polysilicon on silicon oxide, comprising: supplying RF electrical energy between a pair of electrodes in a chamber, one of which electrodes supports a masked, non-planar stepped composite comprising an organic mask over silicide selected from molybdenum silicide and tungsten silicide over polysilicon over silicon oxide; and communicating into said chamber a reactive gas mixture comprising principally a mixture of chlorine and BCl 3 along with HCl and a small amount of dopant gas, not exceeding twenty volume percent of the total gas flow, selected from the group consisting of fluorine-containing gas, oxygen, and a mixture of fluorine-containing gas and oxygen, for etching the silicide anisotropically with a high selectivity to the organic mask for preserving the mask, and with a silicide to polysilicon selectivity of at least about 2/1.
Claim 3
Dependent Claim
33 words
The method for etching refractory metal silicide set forth in claim 1, wherein said reactive gas mixture supplied to said chamber comprises relative gas flow ratios of about (40-75): (80-40):(60-40) HCl:BCl 3 :chlorine.
Claim 4
Dependent Claim
38 words
The method for etching refractory metal silicide set forth in claim 2, wherein said reactive gas mixture comprises HCl:BCl 3 :chlorine:(a fluorine-containing gas selected from NF 3 and CF 4 ) in a volumetric ratio of about 75:40:40:20.
Claim 5
Dependent Claim
36 words
The method for etching refractory metal silicide set forth in claim 2, wherein the metal silicide is molybdenum silicide and wherein said reactive gas mixture comprises HCl:BCl 3 :chlorine:oxygen in a flow rate of about 75:40:40:(4-10).
Claim 6
Dependent Claim
27 words
The method for etching refractory metal silicide of claim 1, wherein the fluorine-containing gas is selected from the group consisting of CF 4 and NF 3 .
Claim 7
Dependent Claim
35 words
The method for etching refractory metal silicide set forth in claim 1, wherein the dopant gas is a mixture of oxygen and CF 4 containing at least about 90 percent by volume CF 4 .
Claim 8
Dependent Claim
28 words
The method for etching refractory metal silicide set forth in claim 1, wherein the refractory metal silicide is tungsten silicide and the dopant gas is NF 3 .
Claim 9
Dependent Claim
28 words
The method for etching refractory metal silicide set forth in claim 1, wherein the refractory metal silicide is tungsten silicide and the dopant gas is CF 4 .
Claim 10
Dependent Claim
26 words
The method for etching refractory metal silicide set forth in claim 1, wherein the refractory metal silicide is molybdenum silicide and the dopant gas is oxygen.
Claim 11
Dependent Claim
41 words
The method of claim 1 for anistropically etching refractory metal silicide, further comprising, after the silicide etch step, the step of communicating into said chamber HCl and chlorine for anisotropically etching the polysilicon underlayer selectively with respect to the silicon oxide.
Claim 12
Independent Claim
124 words
A method for residue-free etching of a non-planar stepped topography of a layer of refractory metal silicide selected from titanium silicide and tantalum silicide formed on a layer of polysilicon on silicon oxide, comprising: supplying RF electrical energy between a pair of electrodes in a chamber, one of which electrodes supports a masked, non-planar stepped composite comprising an organic mask over silicide selected from titanium silicide and tantalum silicide over polysilicon over silicon oxide; and communicating into said chamber a reactive gas mixture comprising principally a mixture of chlorine and BCl 3 along with HCl for etching the silicide anisotropically with a high selectivity to the organic mask for preserving the mask, and with a silicide to polysilicon selectivity of at least about 2/1.
Claim 13
Independent Claim
124 words
A method for residue-free etching of a non-planar stepped topography of a layer of refractory metal silicide selected from titanium silicide and tantalum silicide formed on a layer of polysilicon on silicon oxide, comprising: supplying RF electrical energy between a pair of electrodes in a chamber, one of which electrodes supports a masked, non-planar stepped composite comprising an organic mask over silicide selected from titanium silicide and tantalum silicide over polysilicon over silicon oxide; and communicating into said chamber a reactive gas mixture comprising principally a mixture of chlorine and BCl 3 along with HCl for etching the silicide anisotropically with a high selectivity to the organic mask for preserving the mask, and with a silicide to polysilicon selectivity of at least about 2/1.
Claim 14
Dependent Claim
41 words
The method of claim 11 for anistropically etching refractory metal silicide, further comprising, after the silicide etch step, the step of communicating into said chamber HCl and chlorine for anisotropically etching the polysilicon underlayer selectively with respect to the silicon oxide.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1995-05-12 | 1995-11-11 | 1996-05-12 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1999-05-12 | 1999-11-11 | 2000-05-12 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2003-05-12 | 2003-11-11 | 2004-05-12 | $7700.00 | Window Closed / Lapsed |