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US5101152A
Expired / Lapsed
US
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Integrated circuit transfer test device system utilizing lateral transistors
Assignee: Agilent Technologies Inc
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Filing: 1990-01-31
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Granted: 1992-03-31
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Expires: 2010-01-31
Abstract
Abstract Disclosed is a system for determining whether semiconductor components are present and properly connected to a printed circuit board. The semi-conductor material between two pins of an integrated circuit forms a lateral NPN transistor, having its base connected directly to the substrate connection pin of the component. A constant voltage source is applied to the lateral transistor collector pin of the component being tested, and allowed to stabilize. A current or voltage source is then connected to the emitter pin of the lateral transistor, typically an adjacent pin, and a current or voltage pulse is applied to this pin. The current on the collector pin is then monitored and if a corresponding current pulse is detected, the emitter and collector pins, as well as the substrate connection pin of the component, are properly connected to the printed circuit board.
Inventors
- 👤 Vance R. Harwood
- 👤 Kevin W. Keirn
- 👤 John J. Keller
- 👤 Ronald J. Peiffer
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 19:53
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/2801; G01R31/281; G01R31/2813
Claims Analysis
Total Claims: 16
Claim 1
Independent Claim
147 words
A system for testing a semiconductor integrated circuit component to determine whether first and second connector pins and a substrate connection pin of said semiconductor integrated circuit component are conductively connected to a circuit and whether proper conductive paths exist between said pins through said semiconductor integrated circuit component, said system comprising: constant voltage source means having a first connection to said substrate connection pin of said semiconductor integrated circuit component; current source means connected between said second connector pin of said semiconductor integrated circuit component and said substrate connection pin of said semiconductor integrated circuit component; and current measuring means connected between a second connection of said constant voltage source means and said first connector pin of said semiconductor integrated circuit component for measuring a current change whenever said current source supplies a current pulse to said second connector pin of said semiconductor integrated circuit component.
Claim 2
Independent Claim
147 words
A system for testing a semiconductor integrated circuit component to determine whether first and second connector pins and a substrate connection pin of said semiconductor integrated circuit component are conductively connected to a circuit and whether proper conductive paths exist between said pins through said semiconductor integrated circuit component, said system comprising: constant voltage source means having a first connection to said substrate connection pin of said semiconductor integrated circuit component; current source means connected between said second connector pin of said semiconductor integrated circuit component and said substrate connection pin of said semiconductor integrated circuit component; and current measuring means connected between a second connection of said constant voltage source means and said first connector pin of said semiconductor integrated circuit component for measuring a current change whenever said current source supplies a current pulse to said second connector pin of said semiconductor integrated circuit component.
Claim 3
Dependent Claim
23 words
The system of claim 1 further comprising indicator means for indicating an error condition whenever said current measuring means indicates no current change.
Claim 4
Dependent Claim
27 words
The system of claim 1 wherein said constant voltage means and said current source means are connected to adjacent connector pins of said semiconductor integrated circuit component.
Claim 5
Independent Claim
150 words
A system for testing a semiconductor integrated circuit component to determine whether first and second connector pins and a substrate connection pin of said semiconductor integrated circuit component are conductively connected to a circuit and whether proper conductive paths exist between said pins through said semiconductor integrated circuit component, said system comprising: first constant voltage source means having a first connection to said substrate connection pin of said semiconductor integrated circuit component; second voltage source means connected between said substrate connection pin of said semiconductor integrated circuit component and said second connector pin of said semiconductor integrated circuit component; and current measuring means connected between a second connection of said first constant voltage source means and said first connector pin of said semiconductor integrated circuit component for measuring a current change whenever said second voltage source supplies a pulse to said second connector pin of said semiconductor integrated circuit component.
Claim 6
Independent Claim
150 words
A system for testing a semiconductor integrated circuit component to determine whether first and second connector pins and a substrate connection pin of said semiconductor integrated circuit component are conductively connected to a circuit and whether proper conductive paths exist between said pins through said semiconductor integrated circuit component, said system comprising: first constant voltage source means having a first connection to said substrate connection pin of said semiconductor integrated circuit component; second voltage source means connected between said substrate connection pin of said semiconductor integrated circuit component and said second connector pin of said semiconductor integrated circuit component; and current measuring means connected between a second connection of said first constant voltage source means and said first connector pin of said semiconductor integrated circuit component for measuring a current change whenever said second voltage source supplies a pulse to said second connector pin of said semiconductor integrated circuit component.
Claim 7
Dependent Claim
23 words
The system of claim 4 further comprising indicator means for indicating an error condition whenever said current measuring means indicates no current change.
Claim 8
Dependent Claim
30 words
The system of claim 4 wherein said first constant voltage source means and said second voltage source means are connected to adjacent connector pins of said semiconductor integrated circuit component.
Claim 9
Independent Claim
159 words
A method for testing a semiconductor integrated circuit component to determine whether first and second connector pins and a substrate connection pin of said semiconductor integrated circuit component are conductively connected to a circuit and whether proper conductive paths exist between said connector pins and said substrate connection pin through said semiconductor integrated circuit component, said method comprising the steps of: applying a constant voltage between said first connector pin of said semiconductor integrated circuit component and said substrate connection pin of said semiconductor integrated circuit component, said voltage being sufficient to reverse bias a collector-base junction of a lateral transistor formed in said semiconductor integrated circuit component; waiting a predetermined amount of time; applying a predetermined current pulse between said second connector pin of said semiconductor integrated circuit component and said substrate connection pin of said semiconductor integrated circuit component; and measuring any increase in current flowing into said first connector pin of said semiconductor integrated circuit component.
Claim 10
Independent Claim
159 words
A method for testing a semiconductor integrated circuit component to determine whether first and second connector pins and a substrate connection pin of said semiconductor integrated circuit component are conductively connected to a circuit and whether proper conductive paths exist between said connector pins and said substrate connection pin through said semiconductor integrated circuit component, said method comprising the steps of: applying a constant voltage between said first connector pin of said semiconductor integrated circuit component and said substrate connection pin of said semiconductor integrated circuit component, said voltage being sufficient to reverse bias a collector-base junction of a lateral transistor formed in said semiconductor integrated circuit component; waiting a predetermined amount of time; applying a predetermined current pulse between said second connector pin of said semiconductor integrated circuit component and said substrate connection pin of said semiconductor integrated circuit component; and measuring any increase in current flowing into said first connector pin of said semiconductor integrated circuit component.
Claim 11
Dependent Claim
22 words
The system of claim 7 further comprising the step of indicating an error condition whenever said measuring step indicates no current change.
Claim 12
Dependent Claim
28 words
The system of claim 7 further comprising the step of connecting said constant voltage and said current pulse to adjacent connector pins of said semiconductor integrated circuit component.
Claim 13
Independent Claim
159 words
A method for testing a semiconductor integrated circuit component to determine whether first and second connector pins and a substrate connection pin of said semiconductor integrated circuit component are conductively connected to a circuit and whether proper conductive paths exist between said connector pins and said substrate connection pin through said semiconductor integrated circuit component, said method comprising the steps of: applying a constant voltage between said first connector pin of said semiconductor integrated circuit component and said substrate connection pin of said semiconductor integrated circuit component, said voltage being sufficient to reverse bias a collector-base junction of a lateral transistor formed in said semiconductor integrated circuit component; waiting a predetermined amount of time; applying a predetermined voltage pulse between said second connector pin of said semiconductor integrated circuit component and said substrate connection pin of said semiconductor integrated circuit component; and measuring any increase in current flowing into said first connector pin of said semiconductor integrated circuit component.
Claim 14
Independent Claim
159 words
A method for testing a semiconductor integrated circuit component to determine whether first and second connector pins and a substrate connection pin of said semiconductor integrated circuit component are conductively connected to a circuit and whether proper conductive paths exist between said connector pins and said substrate connection pin through said semiconductor integrated circuit component, said method comprising the steps of: applying a constant voltage between said first connector pin of said semiconductor integrated circuit component and said substrate connection pin of said semiconductor integrated circuit component, said voltage being sufficient to reverse bias a collector-base junction of a lateral transistor formed in said semiconductor integrated circuit component; waiting a predetermined amount of time; applying a predetermined voltage pulse between said second connector pin of said semiconductor integrated circuit component and said substrate connection pin of said semiconductor integrated circuit component; and measuring any increase in current flowing into said first connector pin of said semiconductor integrated circuit component.
Claim 15
Dependent Claim
22 words
The system of claim 10 further comprising the step of indicating an error condition whenever said measuring step indicates no current change.
Claim 16
Dependent Claim
28 words
The system of claim 10 further comprising the step of connecting said constant voltage and said voltage pulse to adjacent connector pins of said semiconductor integrated circuit component.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 1995-03-31 | 1995-09-30 | 1996-03-31 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1999-03-31 | 1999-09-30 | 2000-03-31 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2003-03-31 | 2003-09-30 | 2004-03-31 | $7700.00 | Window Closed / Lapsed |