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US5095483A Expired / Lapsed US ⏱️ 0.0 years remaining

Signature analysis in physical modeling

Assignee: International Business Machines Corp
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Filing: 1991-07-26
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Granted: 1992-03-10
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Expires: 2011-07-26
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Abstract

Abstract In performing a series of device evaluation cycles relative to pins of a physical electronic model, a signature associated with an immediately preceding device evaluation cycle is compared to the corresponding signature that exists just prior to the last pattern for the current device evaluation cycle. If the signatures compare, the new pattern of the current evaluation cycle is completed. If the signatures do not compare, an error has occurred and the operator is notified so that this series of device evaluation cycles will not be considered valid. Computer simulation information is employed to determine the optimal times to clock signatures with each signal pin having its own programmable clocking circuit. These optimally generated signatures are used to verify the consistent operation of the physical model.

Inventors

  • 👤 James F. Dubler
  • 👤 Steven G. Robinson
  • 👤 David A. Valashinas

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-05 13:56
CPC Classifications
G; G06; G06F; G06F11/00; G06F11/22; G06F11/26; G06F11/273; G06F11/277

Claims Analysis

Total Claims: 12
Claim 1
Independent Claim 140 words
In a system for simulating or testing an electronic device including a physical model, a method for assuring integrity of a series of device evaluation cycles, comprising: a) automatically generating a first signature summation of bits from a first pin of said model in response to application of a first set of patterns to said model; b) appending another pattern to said first set of patterns to form a second set of patterns; c) automatically generating a second signature summation of bits from said first pin of said model in response to application of said second set of patterns to said model before said another pattern is applied to said model during a next device evaluation cycle; and d) comparing said first signature summation of bits to said second signature summation of bits prior to application of said another pattern.
Claim 2
Dependent Claim 140 words
In a system for simulating or testing an electronic device including a physical model, a method for assuring integrity of a series of device evaluation cycles, comprising: a) automatically generating a first signature summation of bits from a first pin of said model in response to application of a first set of patterns to said model; b) appending another pattern to said first set of patterns to form a second set of patterns; c) automatically generating a second signature summation of bits from said first pin of said model in response to application of said second set of patterns to said model before said another pattern is applied to said model during a next device evaluation cycle; and d) comparing said first signature summation of bits to said second signature summation of bits prior to application of said another pattern.
Claim 3
Dependent Claim 22 words
The method of claim 1 further comprising: e) repeating steps a)-d) a predefined number of times if said comparing is not true.
Claim 4
Dependent Claim 17 words
The method of claim 2 further comprising: f) halting steps a)-d) if said predefined number is reached.
Claim 5
Dependent Claim 21 words
The method of claim 3 wherein each of said patterns includes signature clock generation data for providing generation of said signatures.
Claim 6
Dependent Claim 17 words
The method of claim 4 wherein said signature clock generation data is derived from simulation signal values.
Claim 7
Dependent Claim 29 words
The method of claim 4 wherein said clock generation data is included with each of said patterns when said pin is at a stable one or zero logic state.
Claim 8
Dependent Claim 166 words
In a system for simulating or testing an electronic device including a physical model, the improvement for assuring integrity of a series of device evaluation cycles, comprising: a) first means for automatically generating a first signature summation of bits from a first pin of said model in response to application of a first set of patterns to said model; b) means connected to said first means for appending another pattern to said first set of patterns to form a second set of patterns; c) second means connected to said first means for automatically generating a second signature summation of bits from said first pin of said model in response to application of said second set of patterns to said model before said another pattern is applied to said model during a next model evaluation cycle; and d) means connected to said first and second means for comparing said first signature summation of bits to said second signature summation of bits prior to applying said another pattern.
Claim 9
Dependent Claim 166 words
In a system for simulating or testing an electronic device including a physical model, the improvement for assuring integrity of a series of device evaluation cycles, comprising: a) first means for automatically generating a first signature summation of bits from a first pin of said model in response to application of a first set of patterns to said model; b) means connected to said first means for appending another pattern to said first set of patterns to form a second set of patterns; c) second means connected to said first means for automatically generating a second signature summation of bits from said first pin of said model in response to application of said second set of patterns to said model before said another pattern is applied to said model during a next model evaluation cycle; and d) means connected to said first and second means for comparing said first signature summation of bits to said second signature summation of bits prior to applying said another pattern.
Claim 10
Dependent Claim 21 words
The system of claim 7 wherein each of said patterns includes signature clock generation data for providing generation of said signatures.
Claim 11
Dependent Claim 17 words
The system of claim 8 wherein said signature clock generation data is derived from simulation signal values.
Claim 12
Dependent Claim 29 words
The system of claim 8 wherein said clock generation data is included with each of said patterns when said pin is at a stable one or zero logic state.

References Cited (Backward Citations)

US3961250A Cited
US3976864A Cited
US4682246A Cited
US4587614A Cited
US4571724A Cited
US4801870A Cited
US4769761A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1995-03-10 1995-09-09 1996-03-10 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1999-03-10 1999-09-09 2000-03-10 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2003-03-10 2003-09-09 2004-03-10 $7700.00 Window Closed / Lapsed

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