US5095207A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of three-dimensional atomic imaging
Assignee: University of Wisconsin System
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Filing: 1991-01-07
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Granted: 1992-03-10
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Expires: 2011-01-07
Abstract
Abstract A method of three-dimensional imaging of the atomic environment of atoms near the surface of the sample involves forming a localized source electron diffraction pattern, detecting the intensity of the distribution of the pattern, and generating data corresponding to the intensity distribution. The intensity data is normalized and corrected for a phase shift error to produce data corresponding to a hologram. The process may be repeated at a several predetermined emitted electron energies, and the data at each energy is combined to yield a composite image intensity having improved resolution. The method of the invention can provide a lenseless electron microscope having a resolution better than one angstrom and which overcomes distortions caused by multiple scattering.
Inventors
- 👤 David S. Y. Tong
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-25 02:03
CPC Classifications
G; G03; G03H; G03H5/00; H; H01; H01J; H01J37/00; H01J37/26; H01J37/295; H01J2237/00; H01J2237/22; H01J2237/226; H01J2237/228; H01J2237/26; H01J2237/2614
Claims Analysis
Total Claims: 17
Claim 1
Independent Claim
105 words
In a method for three-dimensional imaging of the atomic environment of a sample, including the steps of directing a beam against said surface to form a localized source electron diffraction interference pattern, detecting the intensity distribution of said pattern, calculating numerical image intensity data corresponding to said intensity distribution, and reconstructing the interference data to form a pattern indicating the location of a scatterer atom on said surface relative to an associated emitter atom on said surface, the improvement which comprises: phase shift-correcting the data using a function P i (k) dependent on the polar angle between the emitter atom and a scatterer atom i.
Claim 2
Dependent Claim
105 words
In a method for three-dimensional imaging of the atomic environment of a sample, including the steps of directing a beam against said surface to form a localized source electron diffraction interference pattern, detecting the intensity distribution of said pattern, calculating numerical image intensity data corresponding to said intensity distribution, and reconstructing the interference data to form a pattern indicating the location of a scatterer atom on said surface relative to an associated emitter atom on said surface, the improvement which comprises: phase shift-correcting the data using a function P i (k) dependent on the polar angle between the emitter atom and a scatterer atom i.
Claim 3
Independent Claim
92 words
A method for three-dimensional imaging of the atomic environment of a sample, comprising the steps of: (a) directing a beam against said surface to form a localized source electron diffraction interference pattern; (b) detecting the intensity distribution of said pattern; (c) calculating numerical image intensity data corresponding to said intensity distribution; (d) normalizing the intensity data; (e) phase shift-correcting the normalized data; and (f) reconstructing the corrected interference data to form an image indicating the location of a scatterer atom on said surface relative to an associated emitter atom on said surface.
Claim 4
Independent Claim
92 words
A method for three-dimensional imaging of the atomic environment of a sample, comprising the steps of: (a) directing a beam against said surface to form a localized source electron diffraction interference pattern; (b) detecting the intensity distribution of said pattern; (c) calculating numerical image intensity data corresponding to said intensity distribution; (d) normalizing the intensity data; (e) phase shift-correcting the normalized data; and (f) reconstructing the corrected interference data to form an image indicating the location of a scatterer atom on said surface relative to an associated emitter atom on said surface.
Claim 5
Dependent Claim
15 words
The method of claim 2, wherein the sample is a crystal having short range order.
Claim 6
Dependent Claim
12 words
The method of claim 3, wherein said beam is an X-ray beam.
Claim 7
Dependent Claim
12 words
The method of claim 4, wherein said beam is an electron beam.
Claim 8
Dependent Claim
46 words
The method of claim 2, wherein step (e) further comprises determining the polar angle of the scatterer relative to the emitter, and dividing the data χ(k) by a function P i (k) dependent on the polar angle between the emitter atom and the scatterer atom (i).
Claim 9
Dependent Claim
26 words
The method of claim 6, further comprising repeating steps (e) and (f) for each different polar angle of each scatterer atom relative to the emitter atom.
Claim 10
Dependent Claim
39 words
The method of claim 2, wherein step (f) further comprises forming a holographic image of said atoms on said surface by multiplying the corrected data by a function corresponding to the amplitude distribution of a reconstructing coherent electron beam.
Claim 11
Dependent Claim
32 words
The method of claim 2, further comprising repeating steps (a)-(d) at several predetermined localized source electron energies, and step (f) further comprises combining data from each such repetition to form the image.
Claim 12
Dependent Claim
41 words
The method of claim 9, wherein the emitter and scatterer atoms have forward-scattering geometry, further comprising reconstructing the image of each scatterer atom using only diffraction data in an angular cone oriented in the forward-scattering focusing direction of each scatterer atom.
Claim 13
Dependent Claim
16 words
The method of claim 10, wherein said cone is described by an angle θ c .
Claim 14
Independent Claim
95 words
An apparatus for three-dimensional imaging of the atomic environment of a sample, comprising: means for directing a beam against said surface to form a localized source electron diffraction interference pattern; means for detecting the intensity distribution of said pattern; means for calculating numerical image intensity data corresponding to said intensity distribution; means for normalizing the intensity data; means for phase shift-correcting the normalized data; and means for reconstructing the corrected interference data to form an image indicating the location of a scatterer atom on said surface relative to an associated emitter atom on said surface.
Claim 15
Independent Claim
95 words
An apparatus for three-dimensional imaging of the atomic environment of a sample, comprising: means for directing a beam against said surface to form a localized source electron diffraction interference pattern; means for detecting the intensity distribution of said pattern; means for calculating numerical image intensity data corresponding to said intensity distribution; means for normalizing the intensity data; means for phase shift-correcting the normalized data; and means for reconstructing the corrected interference data to form an image indicating the location of a scatterer atom on said surface relative to an associated emitter atom on said surface.
Claim 16
Dependent Claim
23 words
The apparatus of claim 12, further comprising means for combining data generated at several predetermined localized source electron energies to form the image.
Claim 17
Dependent Claim
34 words
The apparatus of claim 12, further comprising means for reconstructing the image of each scatterer atom using only diffraction data in an angular cone oriented in the forward-scattering focusing direction of each scatterer atom.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1995-03-10 | 1995-09-09 | 1996-03-10 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1999-03-10 | 1999-09-09 | 2000-03-10 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2003-03-10 | 2003-09-09 | 2004-03-10 | $7700.00 | Window Closed / Lapsed |