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US5093699A Expired / Lapsed US ⏱️ 0.0 years remaining

Gate adjusted resonant tunnel diode device and method of manufacture

Assignee: Texas A&M University System
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Filing: 1990-03-12
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Granted: 1992-03-03
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Expires: 2010-03-12
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Abstract

Abstract A gated resonant tunneling diode has a semiconductor mesa formed on a semiconductor substrate, a tunneling barrier layer between the mesa and the substrate, and a gate layered over the substrate about the mesa and aligned in close proximity to the tunneling barrier layer. A control voltage on the gate laterally constricts a potential well in the tunneling barrier to control the electrical size of a channel within which tunnelling occurs across the tunneling barrier layer. Preferably the gate and the tunneling layer are disposed at the base of the mesa, and the gate makes a rectifying Schottky junction in connection with the tunneling barrier layer. The device is constructed using an anisotropic etch to form the mesa with an undercut wall and a top portion overhanging the undercut wall, and a nonconformal deposition of gate material to align the gate with the top portion of the mesa.

Inventors

  • 👤 Mark H. Weichold
  • 👤 William B. Kinard
  • 👤 Wiley P. Kirk

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 20:08
CPC Classifications
H; H10; H10D; H10D30/00; B; B82; B82Y; B82Y10/00; H10D12/00; H10D12/211

Claims Analysis

Total Claims: 21
Claim 1
Independent Claim 120 words
A gated tunnel diode comprising, in combination: a plurality of parallel planar layers including a source layer; a drain layer; and a tunneling double-barrier layer separating said source layer and said drain layer and defining a planar potential well between said source layer and said drain layer for confining tunneling current carriers tunneling between said source layer and said drain layer in a direction perpendicular to said layers, and gate means for constricting said planar potential well in a lateral direction parallel to said planar potential well in response to said control voltage to substantially reduce the lateral area of said planar potential well existing between said source layer and said drain layer and thereby substantially reduce said tunneling current.
Claim 2
Dependent Claim 120 words
A gated tunnel diode comprising, in combination: a plurality of parallel planar layers including a source layer; a drain layer; and a tunneling double-barrier layer separating said source layer and said drain layer and defining a planar potential well between said source layer and said drain layer for confining tunneling current carriers tunneling between said source layer and said drain layer in a direction perpendicular to said layers, and gate means for constricting said planar potential well in a lateral direction parallel to said planar potential well in response to said control voltage to substantially reduce the lateral area of said planar potential well existing between said source layer and said drain layer and thereby substantially reduce said tunneling current.
Claim 3
Dependent Claim 19 words
The gated tunnel diode as claimed in claim 1, wherein said tunneling double-barrier layer includes a semiconductor double heterojunction.
Claim 4
Dependent Claim 147 words
A gated tunnel diode comprising, in combination: a plurality of parallel planar layers including a source layer; a drain layer; and a tunneling double-barrier layer separating said source layer and said drain layer and defining a planar potential well between said source layer and said drain layer for confining tunneling current carriers tunneling between said source layer and said drain layer in a direction perpendicular to said layers, and gate means for constricting said planar potential well in a lateral direction parallel to said planar potential well in response to said control voltage to substantially reduce the lateral area of said planar potential well existing between said source layer and said drain layer and thereby substantially reduce said tunneling current, wherein said gate means includes an electrically conductive gate surrounding a channel region of said tunneling double-barrier layer for constricting said potential well in a radial direction.
Claim 5
Dependent Claim 147 words
A gated tunnel diode comprising, in combination: a plurality of parallel planar layers including a source layer; a drain layer; and a tunneling double-barrier layer separating said source layer and said drain layer and defining a planar potential well between said source layer and said drain layer for confining tunneling current carriers tunneling between said source layer and said drain layer in a direction perpendicular to said layers, and gate means for constricting said planar potential well in a lateral direction parallel to said planar potential well in response to said control voltage to substantially reduce the lateral area of said planar potential well existing between said source layer and said drain layer and thereby substantially reduce said tunneling current, wherein said gate means includes an electrically conductive gate surrounding a channel region of said tunneling double-barrier layer for constricting said potential well in a radial direction.
Claim 6
Dependent Claim 148 words
A gated tunnel diode comprising, in combination: a plurality of parallel planar layers including a source layer; a drain layer; and a tunneling double-barrier layer separating said source layer and said drain layer and defining a planar potential well between said source layer and said drain layer for confining tunneling current carriers tunneling between said source layer and said drain layer in a direction perpendicular to said layers, and gate means for constricting said planar potential well in a lateral direction parallel to said planar potential well in response to said control voltage to substantially reduce the lateral area of said planar potential well existing between said source layer and said drain layer and thereby substantially reduce said tunneling current, wherein said tunneling double-barrier layer consists of semiconductor material, and said gate means includes a metallic gate which makes a Schottky-metal semiconductor junction with said tunneling double-barrier layer.
Claim 7
Dependent Claim 148 words
A gated tunnel diode comprising, in combination: a plurality of parallel planar layers including a source layer; a drain layer; and a tunneling double-barrier layer separating said source layer and said drain layer and defining a planar potential well between said source layer and said drain layer for confining tunneling current carriers tunneling between said source layer and said drain layer in a direction perpendicular to said layers, and gate means for constricting said planar potential well in a lateral direction parallel to said planar potential well in response to said control voltage to substantially reduce the lateral area of said planar potential well existing between said source layer and said drain layer and thereby substantially reduce said tunneling current, wherein said tunneling double-barrier layer consists of semiconductor material, and said gate means includes a metallic gate which makes a Schottky-metal semiconductor junction with said tunneling double-barrier layer.
Claim 8
Dependent Claim 179 words
A gated tunnel diode comprising, in combination: a plurality of parallel planar layers including a source layer; a drain layer; and a tunneling double-barrier layer separating said source layer and said drain layer and defining a planar potential well between said source layer and said drain layer for confining tunneling current carriers tunneling between said source layer and said drain layer in a direction perpendicular to said layers, and gate means for constricting said planar potential well in a lateral direction parallel to said planar potential well in response to said control voltage to substantially reduce the lateral area of said planar potential well existing between said source layer and said drain layer and thereby substantially reduce said tunneling current, wherein one of said source and drain layers is formed as a mesa upon the tunneling double-barrier layer, said mesa has an undercut wall and a top portion overhanging said undercut wall, and said gate means includes a gate layer that is disposed about the base of said mesa and is aligned with the top portion of said mesa.
Claim 9
Dependent Claim 179 words
A gated tunnel diode comprising, in combination: a plurality of parallel planar layers including a source layer; a drain layer; and a tunneling double-barrier layer separating said source layer and said drain layer and defining a planar potential well between said source layer and said drain layer for confining tunneling current carriers tunneling between said source layer and said drain layer in a direction perpendicular to said layers, and gate means for constricting said planar potential well in a lateral direction parallel to said planar potential well in response to said control voltage to substantially reduce the lateral area of said planar potential well existing between said source layer and said drain layer and thereby substantially reduce said tunneling current, wherein one of said source and drain layers is formed as a mesa upon the tunneling double-barrier layer, said mesa has an undercut wall and a top portion overhanging said undercut wall, and said gate means includes a gate layer that is disposed about the base of said mesa and is aligned with the top portion of said mesa.
Claim 10
Dependent Claim 67 words
A gated resonant tunneling diode comprising a planar semiconductor substrate, a semiconductor mesa above said substrate, a tunneling barrier layer separating said mesa from said substrate, and at least one gate layered over said substrate about said mesa and aligned in close proximity to said tunneling barrier layer, wherein said gate is metallic and makes a Schottky metal-semiconductor rectifying junction in connection with said tunneling barrier layer.
Claim 11
Dependent Claim 67 words
A gated resonant tunneling diode comprising a planar semiconductor substrate, a semiconductor mesa above said substrate, a tunneling barrier layer separating said mesa from said substrate, and at least one gate layered over said substrate about said mesa and aligned in close proximity to said tunneling barrier layer, wherein said gate is metallic and makes a Schottky metal-semiconductor rectifying junction in connection with said tunneling barrier layer.
Claim 12
Dependent Claim 19 words
The gated resonant tunneling diode as claimed in claim 6, wherein said tunneling barrier layer includes a double-barrier heterostructure.
Claim 13
Dependent Claim 16 words
The gated resonant tunneling diode as claimed in claim 7, wherein said double-barrier heterostructure is unipolar.
Claim 14
Dependent Claim 21 words
The gated resonant tunneling diode as claimed in claim 6, wherein the gate is disposed at the base of said mesa.
Claim 15
Dependent Claim 25 words
The gated resonant tunneling diode as claimed in claim 6, wherein said gate is disposed over at least a portion of said tunneling barrier layer.
Claim 16
Dependent Claim 37 words
The gated resonant tunneling diode as claimed in claim 6, wherein said mesa has an undercut wall and a top portion overhanging said undercut wall, sand said gate is aligned with the top portion of said mesa.
Claim 17
Dependent Claim 75 words
A gated resonant tunneling diode comprising a planar semiconductor substrate, a semiconductor mesa above said substrate, a tunneling barrier layer separating said mesa from said substrate, and at least one gate layered over said substrate about said mesa and aligned in close proximity to said tunneling barrier layer, wherein said mesa has an undercut wall and a top portion overhanging said undercut wall, and said gate is aligned with the top portion of said mesa.
Claim 18
Dependent Claim 75 words
A gated resonant tunneling diode comprising a planar semiconductor substrate, a semiconductor mesa above said substrate, a tunneling barrier layer separating said mesa from said substrate, and at least one gate layered over said substrate about said mesa and aligned in close proximity to said tunneling barrier layer, wherein said mesa has an undercut wall and a top portion overhanging said undercut wall, and said gate is aligned with the top portion of said mesa.
Claim 19
Dependent Claim 31 words
The gated resonant tunneling diode as claimed in claim 12, wherein said gate is metallic and forms a Schottky metal-semiconductor junction with an intrinsic semiconductor layer over said tunneling barrier layer.
Claim 20
Dependent Claim 20 words
The gated resonant tunneling diode as claimed in claim 12, wherein said tunneling barrier layer includes a unipolar double-barrier heterostructure.
Claim 21
Dependent Claim 20 words
The gated resonant tunneling diode as claimed in claim 12, wherein said substrate and said mesa consist of gallium arsenide.

References Cited (Backward Citations)

US3272989A Cited
USRE29578E Cited
US4575924A Cited
US4581621A Cited
US4814837A Cited
US4907045A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1995-03-03 1995-09-02 1996-03-03 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1999-03-03 1999-09-02 2000-03-03 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2003-03-03 2003-09-02 2004-03-03 $7700.00 Window Closed / Lapsed

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