US5087585A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of stacking semiconductor substrates for fabrication of three-dimensional integrated circuit
Assignee: NEC Corp
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Filing: 1990-07-11
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Granted: 1992-02-11
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Expires: 2010-07-11
Abstract
Abstract A semiconductor substrate stacking method comprises the steps of preparing first and second thin film devices each in the form of a thin film having a connection electrode formed on an upper surface thereof and a connection electrode formed on an undersurface thereof, each of the thin film devices being bonded at its upper surface thereof to a support plate by adhesive. The first thin film device is stacked and bonded onto a base substrate having a device formed thereon and a connection electrode formed on the device, in such a manner that the device formed on the base substrate faces the undersurface of the first thin film device and the connection electrode formed on the device formed on the base substrate is in alignment with and in contact with the undersurface connection electrode formed on the first thin film device. The support plate and the adhesive of the first thin film device are removed so that the upper surface of the first thin film device and the upper surface connection electrode formed on the upper surface of the first thin film device are exposed. Similarly, the second thin film device is stacked and bonded onto the first thin film device stacked on the base substrate and the support plate and the adhesive of the second thin film device is removed.
Inventors
- 👤 Yoshihiro Hayashi
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 13:20
CPC Classifications
H; H10; H10P; H10P72/00; H10P72/70; H10P72/74; H10W; H10W90/00; H10P72/7422; H10P72/7434; H10W72/00; H10W72/071; H10W72/072; H10W72/07251; H10W72/20; H10W90/20; H10W90/26; H10W90/701; H10W90/721; H10W90/722
Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
310 words
A semiconductor substrate stacking method comprising the steps of: preparing first and second thin film devices each in the form of a thin film having an upper surface connection electrode formed on an upper surface thereof and an undersurface connection electrode formed on an undersurface thereof, each of the thin film devices being bonded at its upper surface thereof to a support plate by adhesive; stacking and bonding the first thin film device onto a base substrate having a device formed thereon and a connection electrode formed on the device, in such a manner that the device formed on the base substrate faces the undersurface of the first thin film device and the connection electrode formed on the device formed on the base substrate is in alignment with and in contact with the undersurface connection electrode formed on the first thin film device; removing the support plate and the adhesive of the first thin film device so that the upper surface of the first thin film device and the upper surface connection electrode formed on the the upper surface of the first thin film device are exposed; stacking and bonding the second thin film device onto the first thin film device stacked on the base substrate, in such a manner that the device formed on the first thin film device faces the undersurface of the second thin film device and the upper surface connection electrode formed on the device formed on the first thin film device is in alignment with and in contact with the undersurface connection electrode formed on the second thin film device; and removing the support plate and the adhesive of the second thin film device so that the upper surface of the second thin film device and the upper surface connection electrode formed on the the upper surface of the second thin film device are exposed.
Claim 2
Dependent Claim
310 words
A semiconductor substrate stacking method comprising the steps of: preparing first and second thin film devices each in the form of a thin film having an upper surface connection electrode formed on an upper surface thereof and an undersurface connection electrode formed on an undersurface thereof, each of the thin film devices being bonded at its upper surface thereof to a support plate by adhesive; stacking and bonding the first thin film device onto a base substrate having a device formed thereon and a connection electrode formed on the device, in such a manner that the device formed on the base substrate faces the undersurface of the first thin film device and the connection electrode formed on the device formed on the base substrate is in alignment with and in contact with the undersurface connection electrode formed on the first thin film device; removing the support plate and the adhesive of the first thin film device so that the upper surface of the first thin film device and the upper surface connection electrode formed on the the upper surface of the first thin film device are exposed; stacking and bonding the second thin film device onto the first thin film device stacked on the base substrate, in such a manner that the device formed on the first thin film device faces the undersurface of the second thin film device and the upper surface connection electrode formed on the device formed on the first thin film device is in alignment with and in contact with the undersurface connection electrode formed on the second thin film device; and removing the support plate and the adhesive of the second thin film device so that the upper surface of the second thin film device and the upper surface connection electrode formed on the the upper surface of the second thin film device are exposed.
Claim 3
Dependent Claim
166 words
A semiconductor substrate stacking method claimed in claim 1 wherein the preparation of each of the first and second thin film devices includes the steps of: forming a device on a semiconductor substrate; forming the upper surface connection electrode on an upper surface of the device formed on the semiconductor substrate; bonding the support plate, by adhesive, on the upper surface of the device formed on the semiconductor substrate and the upper surface connection electrode formed on the upper surface of the device formed on the semiconductor substrate; thinning the semiconductor substrate by removing the semiconductor substrate from an undersurface of the semiconductor substrate so as to form the thin film device composed of a remaining portion of the substrate in which the device is formed; forming an undersurface insulative layer on an undersurface of the thin film device; and forming an opening in the undersurface insulative layer; and forming the undersurface connection electrode on the undersurface of the thin film device exposed within the opening.
Claim 4
Dependent Claim
54 words
A semiconductor substrate stacking method claimed in claim 2 wherein the upper surface connection electrode formed on the upper surface of the device formed on the semiconductor substrate is formed of a refractory metal, and the undersurface connection electrode formed on the undersurface of the thin film device is formed of a non-refractory metal.
Claim 5
Dependent Claim
51 words
A semiconductor substrate stacking method claimed in claim 3 wherein the opening formed in the undersurface insulative layer formed on the undersurface of the thin film device is larger in size than a corresponding upper surface connection electrode, so that the nonrefractory metal filled in the opening forms a metal pool.
Claim 6
Dependent Claim
47 words
A semiconductor substrate stacking method claimed in claim 4 wherein the bonding of the first thin film device onto the base substrate is performed by heating the first thin film device and the base substrate to a temperature higher than a melting point of the non-refractory metal.
Claim 7
Dependent Claim
39 words
A semiconductor substrate stacking method as claimed in claim 4 wherein the removal of the support plate and the adhesive of the first thin film device is performed by etch-removing the support plate and then chemically removing the adhesive.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1995-02-10 | 1995-08-12 | 1996-02-11 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1999-02-10 | 1999-08-12 | 2000-02-11 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2003-02-10 | 2003-08-12 | 2004-02-11 | $7700.00 | Window Closed / Lapsed |