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US5081065A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of contacting silicide tracks

Assignee: NXP BV
•
Filing: 1990-11-30
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Granted: 1992-01-14
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Expires: 2010-11-30
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Abstract

Abstract Disclosed is a method of contacting a metal silicide pattern on an integrated semiconductor circuit which is provided with a planarized dielectric layer. A silicide-forming metal layer (9), preferably a titanium layer, is provided on the surface of a silicon substrate having a field oxide patter (2) which is provided with a conductor pattern (4) of silicon. A layer (10) of amorphous (a-) silicon is provided locally on this metal layer to form "straps". The entire device is heated in a nitrogen-containing atmosphere, by which the metal layer (9) is converted at least partly into metal silicide (12). A dielectric layer (13), for example of silicon oxide, is provided over the entire surface. The layer (13) is planarized and provided with contact windows (15) on the metal silicide by etching, after which a metallization (16) is provided. According to the invention, the amorphous silicon layer is provided not only at the locations of the "straps", but also under at least those contact windows which are situated above the silicon pattern (4), and preferably below all contact windows, so that a thicker silicide layer (12B) is realized below these windows and partial or substantial removal by etching of the metal silicide in the "shallow" contact windows is prevented.

Inventors

  • 👤 Alexander G. M. Jonkers
  • 👤 Christopher A. Seams
  • 👤 Harald Godon
  • 👤 Andre Stolmeijer

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 05:58
CPC Classifications
H; H10; H10D; H10D64/00; H10D64/01; H10D64/011; H10W; H10W20/00; H10W20/01; H10W20/031; H10W20/0698; H10D64/0111; H10D64/0112; Y; Y10; Y10S; Y10S148/00; Y10S148/019

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 227 words
A method of manufacturing a semiconductor device comprising the steps of: (a) forming at least one monocrystalline silicon region and adjoining field oxide pattern on a surface of a semiconductor body, (b) forming a conductor pattern of polycrystalline silicon on said at least one silicon region and adjoining field oxide pattern, (c) covering said at least one silicon region and said adjoining field oxide pattern and said conductor pattern with a metal layer, (d) covering said metal layer with an amorphous silicon layer, (e) forming selected portions of said amorphous silicon layer on said metal layer and then removing remaining portions of said amorphous silicon layer, (f) converting said selected portions and underlying metal layer portions at least partially into metal silicide layer portions of different thicknesses by heating in a nitrogen-containing atmosphere and then removing remaining portions of said metal layer, said different thicknesses being determined by heights of said selected portions above said surface of said semiconductor body, (g) forming a planarized dielectric layer over said semiconductor body, (h) forming contact windows in said planarized dielectric layer to said metal silicide layer portions of different thicknesses by etching openings in said dielectric layer to each of said metal silicide layer portions at different heights above said surface, and (i) forming contact metallization into each of said contact windows to contact said metal silicide layer portions.
Claim 2
Independent Claim 227 words
A method of manufacturing a semiconductor device comprising the steps of: (a) forming at least one monocrystalline silicon region and adjoining field oxide pattern on a surface of a semiconductor body, (b) forming a conductor pattern of polycrystalline silicon on said at least one silicon region and adjoining field oxide pattern, (c) covering said at least one silicon region and said adjoining field oxide pattern and said conductor pattern with a metal layer, (d) covering said metal layer with an amorphous silicon layer, (e) forming selected portions of said amorphous silicon layer on said metal layer and then removing remaining portions of said amorphous silicon layer, (f) converting said selected portions and underlying metal layer portions at least partially into metal silicide layer portions of different thicknesses by heating in a nitrogen-containing atmosphere and then removing remaining portions of said metal layer, said different thicknesses being determined by heights of said selected portions above said surface of said semiconductor body, (g) forming a planarized dielectric layer over said semiconductor body, (h) forming contact windows in said planarized dielectric layer to said metal silicide layer portions of different thicknesses by etching openings in said dielectric layer to each of said metal silicide layer portions at different heights above said surface, and (i) forming contact metallization into each of said contact windows to contact said metal silicide layer portions.
Claim 3
Dependent Claim 27 words
A method according to claim 1, wherein said metal silicide layer portions are formed to be thicker for greater heights above said surface of said semiconductor body.
Claim 4
Dependent Claim 30 words
A method according to claim 2, wherein said selected portions of said amorphous silicon layer and said underlying metal layer portions are completely converted into said metal silicide layer portions.
Claim 5
Dependent Claim 21 words
A method according to claim 3, wherein said contact windows are formed above all selected portions and underlying metal layer portions.
Claim 6
Dependent Claim 14 words
A method according to claim 3, wherein said metal layer is provided of titanium.
Claim 7
Dependent Claim 14 words
A method according to claim 2, wherein said metal layer is provided of titanium.

References Cited (Backward Citations)

US4873204A Cited
US4708767A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1995-01-13 1995-07-15 1996-01-14 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1999-01-13 1999-07-15 2000-01-14 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2003-01-13 2003-07-15 2004-01-14 $7700.00 Window Closed / Lapsed

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