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US5079604A Expired / Lapsed US ⏱️ 0.0 years remaining

SOI layout for low resistance gate

Assignee: Texas Instruments Inc
•
Filing: 1991-05-29
•
Granted: 1992-01-07
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Expires: 2011-05-29
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Abstract

Abstract Silicon-on-insulator mesa steps cause high resistance in polycrystalline material because of the lack of silicide coverage. In a gate or word line, for instance, this accounts for a large resistance. By connecting the mesas through the body nodes of adjacent transistors, all mesa steps in a polycrystalline semiconductor gate are eliminated. Thus, gate or word line resistance is reduced.

Inventors

  • 👤 Theodore W. Houston
  • 👤 Terence G. W. Blake

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-27 23:52
CPC Classifications
H; H10; H10D; H10D86/00; H10D86/201

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 82 words
A transistor structure comprising: a commonly gated first transistor and second transistor, said transistors being formed in a thin film of semiconductor material overlying an insulator, said thin film being patterned to form a mesa for each transistor, and an extension of semiconductor material from the body node of said first transistor to the body node of said second transistor so as to form a substantially planar surface of mesa, flush with an edge abutting said common gate, underlying the common gate.
Claim 2
Dependent Claim 82 words
A transistor structure comprising: a commonly gated first transistor and second transistor, said transistors being formed in a thin film of semiconductor material overlying an insulator, said thin film being patterned to form a mesa for each transistor, and an extension of semiconductor material from the body node of said first transistor to the body node of said second transistor so as to form a substantially planar surface of mesa, flush with an edge abutting said common gate, underlying the common gate.
Claim 3
Dependent Claim 16 words
A transistor structure as recited in claim 1 which further comprises isolation tabs between said mesas.
Claim 4
Dependent Claim 20 words
A transistor structure as recited in claim 2 wherein said isolation tabs comprise semiconductor material flanked with a sidewall insulator.
Claim 5
Dependent Claim 14 words
A transistor structure as recited in claim 3 wherein said sidewall insulator is oxide.
Claim 6
Dependent Claim 40 words
A transistor structure as recited in claim 1 wherein parasitic current is reduced by implanting dopants into the mesa between said transistors so as to raise the threshold voltage of a parasitic transistor formed between said first and second transistors.
Claim 7
Dependent Claim 22 words
A transistor structure as recited in claim 1 wherein a body node contact is made to the mesa extension between two transistors.

References Cited (Backward Citations)

US4809056A Cited
US4809044A Cited
US4918498A Cited
US4914491A Cited
US4905062A Cited
US4899202A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1995-01-06 1995-07-08 1996-01-07 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1999-01-06 1999-07-08 2000-01-07 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2003-01-06 2003-07-08 2004-01-07 $7700.00 Window Closed / Lapsed

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