Reactor vessel for the growth of heterojunction devices

Claim 2

A reactor vessel comprising: (a) a chamber having a top surface disposed substantially parallel to a semiconductor substrate disposed within the chamber, said chamber having an inlet through which a vapor stream is directed: (b) means for increasing the uniformity and decreasing the turbulence of the vapor stream comprising: a plate disposed within the chamber and substantially perpendicular to said semiconductor substrate, said plate having disposed therethrough a plurality of apertures; and (c) means for supporting the semiconductor substrate, for rotating the substrate, and for heating the substrate to a predetermined temperature.

Claim 3

The reactor vessel recited in claim 1 wherein the means for increasing the uniformity and decreasing the turbulence of the vapor stream further comprises means for decreasing the total volume of the chamber.

Claim 4

The reactor vessel recited in claim 2 wherein the means for decreasing the total volume of the chamber is a block.

Claim 5

The reactor vessel recited in claim 1 wherein the chamber is rectangular shaped and has a substantially planar bottom surface, said bottom surface being disposed substantially parallel to the semiconductor substrate.

Claim 6

The reactor vessel recited in claim 1 further comprising an outlet having the same cross-sectional dimensions as the chamber.

Claim 7

The reactor vessel recited in claim 1 wherein the means for heating the substrate is further disposed substantially over the substrate.

Claim 8

The reactor vessel recited in claim 1 wherein the inlet and the plate are spaced by a chamber region.

Claim 9

The reactor vessel recited in claim 7 wherein said chamber region is linearly tapered.

Claim 10

The reactor vessel recited in claim 3 wherein a top surface of the block and a top surface of the substrate are disposed along the same horizontal plane.

Claim 11

The reactor vessel recited in claim 1 wherein the chamber is maintained at atmospheric pressure.

Claim 12

A reactor vessel comprising: (a) a chamber having a top surface disposed substantially parallel to a semiconductor substrate disposed within the chamber and a bottom surface having an aperture disposed therethrough, said chamber having an inlet through which a vapor stream is directed; (b) means for increasing the uniformity and decreasing the turbulence of the vapor stream comprising: a plate disposed within the chamber and substantially perpendicular to said semiconductor substrate, said plate having disposed therethrough a plurality of apertures; (c) a susceptor, disposed within said chamber, said susceptor having an aperture disposed therethrough and aligned with the aperture in the bottom surface of the chamber, said susceptor further having a top surface in which is disposed a recess; (d) a rotatable shaft disposed vertically through the aperture in the bottom surface of the chamber and the aperture in the susceptor; and (e) a platen, disposed within said recess, wherein said platen is in contact with said shaft.

Claim 13

A reactor vessel comprising: (a) a chamber having a top surface disposed substantially parallel to a semiconductor substrate disposed within the chamber and a bottom surface having an aperture disposed therethrough, said chamber having an inlet through which a vapor stream is directed; (b) means for increasing the uniformity and decreasing the turbulence of the vapor stream comprising: a plate disposed within the chamber and substantially perpendicular to said semiconductor substrate, said plate having disposed therethrough a plurality of apertures; (c) a susceptor, disposed within said chamber, said susceptor having an aperture disposed therethrough and aligned with the aperture in the bottom surface of the chamber, said susceptor further having a top surface in which is disposed a recess; (d) a rotatable shaft disposed vertically through the aperture in the bottom surface of the chamber and the aperture in the susceptor; and (e) a platen, disposed within said recess, wherein said platen is in contact with said shaft.

Claim 14

The reactor vessel recited in claim 11 further comprising a chamber region disposed between the inlet and the plate.

Claim 15

The reactor vessel recited in claim 11 wherein the means for increasing the uniformity and decreasing the turbulence further includes a block for decreasing the total volume of the chamber.

Claim 16

The reactor vessel recited in claim 11 wherein said platen has a groove and wherein said groove is in contact with said shaft.

Claim 17

The reactor vessel recited in claim 11 wherein said platen has a top surface in which is disposed a recess and wherein said semiconductor substrate is disposed therein.