Claims Analysis
Total Claims: 23
Claim 1
Independent Claim
98 words
A method of forming high purity semiconductor material from relatively low purity semiconductor material, comprising the steps of: (a) treating particles of relatively low purity semiconductor material to form a skin thereon of a thermally stable compound; (b) melting the material within said skin while retaining said molten material within said skin to cause impurities in said material to travel into said skin; (c) cooling the material to form a single crystal solid material within said skin; (d) removing said skin from said particles; and (e) repeating at least once the steps (a) through (d) on said particles.
Claim 2
Independent Claim
98 words
A method of forming high purity semiconductor material from relatively low purity semiconductor material, comprising the steps of: (a) treating particles of relatively low purity semiconductor material to form a skin thereon of a thermally stable compound; (b) melting the material within said skin while retaining said molten material within said skin to cause impurities in said material to travel into said skin; (c) cooling the material to form a single crystal solid material within said skin; (d) removing said skin from said particles; and (e) repeating at least once the steps (a) through (d) on said particles.
Claim 3
Dependent Claim
17 words
A method as set forth in claim 1 wherein said low purity particles are of irregular shape.
Claim 4
Dependent Claim
25 words
A method as set forth in claim 1 further including the step of making said particles of more uniform size distribution prior to step (e).
Claim 5
Dependent Claim
21 words
The method of claim 1, wherein: (a) said steps (a) through (d) are repeated at least five times on said particles.
Claim 6
Dependent Claim
39 words
A method as set forth in claim 1 wherein step (b) comprises heating the particles to a temperature in the range of about 1430° C. to not above 1550° C. in an oxygen rich atmosphere for about 2 minutes.
Claim 7
Dependent Claim
17 words
A method as set forth in claim 5 wherein said low purity particles are of irregular shape.
Claim 8
Dependent Claim
36 words
A method as set forth in claim 1 wherein step (a) comprises treating said particles in a reactive gaseous atmosphere to form said skin and step (b) comprises melting said material in an oxidizing gas environment.
Claim 9
Dependent Claim
17 words
A method as set forth in claim 7 wherein said low purity particles are of irregular shape.
Claim 10
Dependent Claim
39 words
A method as set forth in claim 7 wherein step (b) comprises heating the particles to a temperature in the range of about 1430° C. to not above 1550° C. in an oxygen rich atmosphere for about 2 minutes.
Claim 11
Dependent Claim
17 words
A method as set forth in claim 9 wherein said low purity particles are of irregular shape.
Claim 12
Dependent Claim
24 words
A method as set forth in claim 1 wherein said semiconductor material is taken from the group consisting of silicon, germanium and gallium arsenide.
Claim 13
Dependent Claim
17 words
A method as set forth in claim 11 wherein said low purity particles are of irregular shape.
Claim 14
Dependent Claim
39 words
A method as set forth in claim 11 wherein step (b) comprises heating the particles to a temperature in the range of about 1430° C. to not above 1550° C. in an oxygen rich atmosphere for about 2 minutes.
Claim 15
Dependent Claim
17 words
A method as set forth in claim 13 wherein said low purity particles are of irregular shape.
Claim 16
Dependent Claim
24 words
A method as set forth in claim 7 wherein said semiconductor material is taken from the group consisting of silicon, germanium and gallium arsenide.
Claim 17
Dependent Claim
17 words
A method as set forth in claim 15 wherein said low purity particles are of irregular shape.
Claim 18
Dependent Claim
25 words
A method as set forth in claim 15 further including the step of making said particles of more uniform size distribution prior to step (e).
Claim 19
Dependent Claim
39 words
A method as set forth in claim 15 wherein step (b) comprises heating the particles to a temperature in the range of about 1430° C. to not above 1550° C. in an oxygen rich atmosphere for about 2 minutes.
Claim 20
Dependent Claim
25 words
A method as set forth in claim 18 further including the step of making said particles of more uniform size distribution prior to step (e).
Claim 21
Dependent Claim
17 words
A method as set forth in claim 18 wherein said low purity particles are of irregular shape.
Claim 22
Dependent Claim
25 words
A method as set forth in claim 20 further including the step of making said particles of more uniform size distribution prior to step (e).
Claim 23
Dependent Claim
20 words
The method of claim 1, wherein: after said steps (a) through (e) are performed said solid material is single crystal.