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US5069740A Expired / Lapsed US ⏱️ 0.0 years remaining

Production of semiconductor grade silicon spheres from metallurgical grade silicon particles

Assignee: Spheral Solar Power Inc
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Filing: 1988-04-21
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Granted: 1991-12-03
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Expires: 2008-04-21
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Abstract

Abstract A method of making single crystal semiconductor grade silicon spheres for solar cells and the like from metallurgical grade silicon. The process comprises sizing metallurgical grade silicon particles to a desired range and oxidizing the outer surfaces of the particles to form a silicon dioxide skin thereon. The particles are then heated to melt the silicon within the skin to cause impurities to travel into the skin. This is made possible because single crystals are formed. The skin and impurities therein are then etched off and the remaining particles are again treated to form a skin with subsequent melt of the interior silicon and removal of the skin, the cycle being repeated until the desired degree of silicon purity is obtained. An intermediate shotting step can yield spheres of substantially uniform diameter for use as the feed for the repeat cycle.

Inventors

  • 👤 Jules D. Levine
  • 👤 Millard J. Jensen

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-07 02:02
CPC Classifications
C; C30; C30B; C30B29/00; C30B29/02; C30B29/06; C30B11/00; C30B11/002; C30B29/60

Claims Analysis

Total Claims: 23
Claim 1
Independent Claim 98 words
A method of forming high purity semiconductor material from relatively low purity semiconductor material, comprising the steps of: (a) treating particles of relatively low purity semiconductor material to form a skin thereon of a thermally stable compound; (b) melting the material within said skin while retaining said molten material within said skin to cause impurities in said material to travel into said skin; (c) cooling the material to form a single crystal solid material within said skin; (d) removing said skin from said particles; and (e) repeating at least once the steps (a) through (d) on said particles.
Claim 2
Independent Claim 98 words
A method of forming high purity semiconductor material from relatively low purity semiconductor material, comprising the steps of: (a) treating particles of relatively low purity semiconductor material to form a skin thereon of a thermally stable compound; (b) melting the material within said skin while retaining said molten material within said skin to cause impurities in said material to travel into said skin; (c) cooling the material to form a single crystal solid material within said skin; (d) removing said skin from said particles; and (e) repeating at least once the steps (a) through (d) on said particles.
Claim 3
Dependent Claim 17 words
A method as set forth in claim 1 wherein said low purity particles are of irregular shape.
Claim 4
Dependent Claim 25 words
A method as set forth in claim 1 further including the step of making said particles of more uniform size distribution prior to step (e).
Claim 5
Dependent Claim 21 words
The method of claim 1, wherein: (a) said steps (a) through (d) are repeated at least five times on said particles.
Claim 6
Dependent Claim 39 words
A method as set forth in claim 1 wherein step (b) comprises heating the particles to a temperature in the range of about 1430° C. to not above 1550° C. in an oxygen rich atmosphere for about 2 minutes.
Claim 7
Dependent Claim 17 words
A method as set forth in claim 5 wherein said low purity particles are of irregular shape.
Claim 8
Dependent Claim 36 words
A method as set forth in claim 1 wherein step (a) comprises treating said particles in a reactive gaseous atmosphere to form said skin and step (b) comprises melting said material in an oxidizing gas environment.
Claim 9
Dependent Claim 17 words
A method as set forth in claim 7 wherein said low purity particles are of irregular shape.
Claim 10
Dependent Claim 39 words
A method as set forth in claim 7 wherein step (b) comprises heating the particles to a temperature in the range of about 1430° C. to not above 1550° C. in an oxygen rich atmosphere for about 2 minutes.
Claim 11
Dependent Claim 17 words
A method as set forth in claim 9 wherein said low purity particles are of irregular shape.
Claim 12
Dependent Claim 24 words
A method as set forth in claim 1 wherein said semiconductor material is taken from the group consisting of silicon, germanium and gallium arsenide.
Claim 13
Dependent Claim 17 words
A method as set forth in claim 11 wherein said low purity particles are of irregular shape.
Claim 14
Dependent Claim 39 words
A method as set forth in claim 11 wherein step (b) comprises heating the particles to a temperature in the range of about 1430° C. to not above 1550° C. in an oxygen rich atmosphere for about 2 minutes.
Claim 15
Dependent Claim 17 words
A method as set forth in claim 13 wherein said low purity particles are of irregular shape.
Claim 16
Dependent Claim 24 words
A method as set forth in claim 7 wherein said semiconductor material is taken from the group consisting of silicon, germanium and gallium arsenide.
Claim 17
Dependent Claim 17 words
A method as set forth in claim 15 wherein said low purity particles are of irregular shape.
Claim 18
Dependent Claim 25 words
A method as set forth in claim 15 further including the step of making said particles of more uniform size distribution prior to step (e).
Claim 19
Dependent Claim 39 words
A method as set forth in claim 15 wherein step (b) comprises heating the particles to a temperature in the range of about 1430° C. to not above 1550° C. in an oxygen rich atmosphere for about 2 minutes.
Claim 20
Dependent Claim 25 words
A method as set forth in claim 18 further including the step of making said particles of more uniform size distribution prior to step (e).
Claim 21
Dependent Claim 17 words
A method as set forth in claim 18 wherein said low purity particles are of irregular shape.
Claim 22
Dependent Claim 25 words
A method as set forth in claim 20 further including the step of making said particles of more uniform size distribution prior to step (e).
Claim 23
Dependent Claim 20 words
The method of claim 1, wherein: after said steps (a) through (e) are performed said solid material is single crystal.

References Cited (Backward Citations)

US3632438A Cited
US3929529A Cited
US4435209A Cited
US4430150A Cited
US4487651A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1994-12-02 1995-06-03 1995-12-03 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1998-12-02 1999-06-03 1999-12-03 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2002-12-02 2003-06-03 2003-12-03 $7700.00 Window Closed / Lapsed

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