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US5068699A Expired / Lapsed US ⏱️ 0.0 years remaining

Thin film transistor for a plate display

Assignee: Samsung Electronics Co Ltd
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Filing: 1989-12-15
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Granted: 1991-11-26
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Expires: 2009-12-15
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Abstract

Abstract There is disclosed a thin film transistor for a plate display comprising first and second gates of different metals stacked one on top of the other on a glass substrate, a first insulating layer of tantalum oxide film formed on top of said second gate, second and third insulating layers of silicon dioxide formed successively on the first insulating layer and a semiconductor layer deposited on said third insulating layer.

Inventors

  • 👤 Kyujeong Chang

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-02 21:28
CPC Classifications
G; G02; G02F; G02F1/00; G02F1/01; G02F1/13; G02F1/133; G02F1/136; G02F1/1362; G02F1/1368; H; H10; H10D; H10D30/00; H10D30/60; H10D30/67; H10D30/6729; H10D30/6737; H10D30/6739; G02F1/136286; G02F1/13629

Claims Analysis

Total Claims: 3
Claim 1
Independent Claim 101 words
A thin film transistor for a plate display comprising first and second gates (2a and 2b) of different materials stacked one on top of the other, and a storage capacitor (9) on a glass substrate (1), the first gate (2a) comprising indium tin oxide and the second gate (2b) comprising tantalum, the capacitor (9) having an electrode of indium tin oxide, first, second and third insulating layers (3a, 3b and 3c) formed one on top of another on said second gate, the first insulating layer comprising Ta 2 O 5 and a semiconductor layer (4) deposited on said third insulating layer.
Claim 2
Dependent Claim 101 words
A thin film transistor for a plate display comprising first and second gates (2a and 2b) of different materials stacked one on top of the other, and a storage capacitor (9) on a glass substrate (1), the first gate (2a) comprising indium tin oxide and the second gate (2b) comprising tantalum, the capacitor (9) having an electrode of indium tin oxide, first, second and third insulating layers (3a, 3b and 3c) formed one on top of another on said second gate, the first insulating layer comprising Ta 2 O 5 and a semiconductor layer (4) deposited on said third insulating layer.
Claim 3
Dependent Claim 19 words
A thin film transistor as recited in claim 1, wherein the second and third insulating layers comprise silicon dioxide.

References Cited (Backward Citations)

EP0048911A2 Cited
US4469568A Cited
JPS63114263A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1994-11-25 1995-05-27 1995-11-26 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1998-11-25 1999-05-27 1999-11-26 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2002-11-25 2003-05-27 2003-11-26 $7700.00 Window Closed / Lapsed

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