Fast recovery high temperature rectifying diode formed in silicon carbide

Claim 2

A fast recovery, high temperature rectifying diode formed in silicon carbide and comprising a monocrystalline silicon carbide substrate having a sufficient carrier concentration to give said substrate a first conductivity type; a first monocrystalline epitaxial layer of silicon carbide upon said substrate and having the same conductivity type as said substrate; a second monocrystalline epitaxial layer of silicon carbide upon said first epitaxial layer and having the opposite conductivity type from said first epitaxial layer; said first and second epitaxial layers having respective carrier concentrations that differ in magnitude by an amount sufficient so that the layer having the lesser concentration is predominantly depleted in reverse bias, with dais lesser concentration being between about 1×10 15 and 1×10 18 atoms per cubic centimeter (cm -3 ), and said layer having said lesser carrier concentration further having a minimum thickness of between about 0.2 microns at about 1×10 18 cm -3 and about 70 microns at about 1×10 15 cm -3 so that said minimum thickness is sufficient to achieve avalanche breakdown under reverse bias; and a rectifying p-n junction formed between said first and second epitaxial layers.

Claim 3

A rectifying diode according to claim 1 wherein said first epitaxial layer has a carrier concentration greater than said second epitaxial so that said second epitaxial layer is predominantly depleted in reverse bias.

Claim 4

A rectifying diode according to claim 1 wherein said substrate and said first epitaxial layer have n-type conductivity.

Claim 5

A rectifying diode according to claim 1 wherein said substrate and said first epitaxial layer have p-type conductivity.

Claim 6

A rectifying diode according to claim 1 and further comprising a third epitaxial layer upon said second epitaxial layer and wherein said third epitaxial layer has the same conductivity type as said second epitaxial layer and has a carrier concentration sufficiently greater than said second epitaxial layer to reduce the contact resistance to said diode.

Claim 7

A rectifying diode according to claim 1 wherein said silicon carbide substrate comprises of alpha silicon carbide and has a flat interface surface that is inclined more than one degree off axis with respect to a basal plane thereof substantially towards one of the <1120> directions, and with said first epitaxial layer comprising alpha silicon carbide homoepitaxially deposited on said substrate interface surface.

Claim 8

A rectifying diode according to claim 1 further comprising an ohmic contact to said substrate and an ohmic contact to said second epitaxial layer.

Claim 9

A rectifying diode according to claim 5 further comprising an ohmic contact to said substrate and an ohmic contact to said third epitaxial layer.

Claim 10

A rectifying diode according to claim 1 an further comprising a passivation layer adjacent said junction.

Claim 11

A rectifying diode according to claim 9 wherein said passivation layer comprises a thermally grown silicon dioxide.

Claim 12

A fast recovery, high temperature rectifying diode formed in silicon carbide and comprising: a monocrystalline silicon carbide substrate having a sufficient carrier concentration to give said substrate a first conductivity type; a first monocrystalline epitaxial layer of silicon carbide upon said substrate and having the same conductivity type as said substrate; and a second monocrystalline epitaxial layer of silicon carbide upon said first epitaxial layer and having the opposite conductivity type from said first epitaxial layer and having a carrier concentration greater than the carrier concentration of said first monocrystalline epitaxial layer so that said first epitaxial layer is predominantly depleted in reverse bias, with said carrier concentration of said first layer being between about 1×10 15 and 1×10 18 atoms per cubic centimeter (cm -3 ), and said first layer further having a minimum thickness of between about 0.2 microns at about 1×10 18 cm -3 and about 70 microns at about 1×10 15 cm -3 so that said minimum thickness is sufficient to achieve avalanche breakdown under reverse bias; and an abrupt rectifying p-n junction formed between said first and second epitaxial layers.

Claim 13

A fast recovery, high temperature rectifying diode formed in silicon carbide and comprising: a monocrystalline silicon carbide substrate having a sufficient carrier concentration to give said substrate a first conductivity type; a first monocrystalline epitaxial layer of silicon carbide upon said substrate and having the same conductivity type as said substrate; and a second monocrystalline epitaxial layer of silicon carbide upon said first epitaxial layer and having the opposite conductivity type from said first epitaxial layer and having a carrier concentration greater than the carrier concentration of said first monocrystalline epitaxial layer so that said first epitaxial layer is predominantly depleted in reverse bias, with said carrier concentration of said first layer being between about 1×10 15 and 1×10 18 atoms per cubic centimeter (cm -3 ), and said first layer further having a minimum thickness of between about 0.2 microns at about 1×10 18 cm -3 and about 70 microns at about 1×10 15 cm -3 so that said minimum thickness is sufficient to achieve avalanche breakdown under reverse bias; and an abrupt rectifying p-n junction formed between said first and second epitaxial layers.

Claim 14

A rectifying diode according to claim 11 wherein said substrate is formed of n-type alpha silicon carbide, said first epitaxial layer is formed of n-type alpha silicon carbide, and said second epitaxial layer is formed of p-type alpha silicon carbide.

Claim 15

A rectifying diode according to claim 11 wherein said first monocrystalline epitaxial layer has a carrier concentration less than the carrier concentration of said substrate.

Claim 16

A rectifying diode according to claim 11 further comprising an ohmic contact to said substrate and an ohmic contact to said second epitaxial layer.

Claim 17

A rectifying according to claim 14 wherein said ohmic contact to said substrate comprises nickel and said ohmic contact to said second epitaxial layer comprises a bimetallic contact containing aluminum.

Claim 18

A rectifying according to claim 14 wherein said ohmic contact to said second epitaxial layer comprises aluminum.

Claim 19

A rectifying diode according to claim 11 wherein said silicon carbide has a single polytype selected from the group consisting of the 6H, 3C, 4H, and 15R polytypes.

Claim 20

A rectifying diode according to claim 11 wherein the relationship between applied voltage and capacitance is such that the relationship between the reciprocal capacitance squared and the applied voltage is a substantially linear relationship.

Claim 21

A rectifying diode according to claim 11 having a reverse breakdown voltage as high as -5000 volts while operating at a temperature range of between -55° C. and 350° C.

Claim 22

A rectifying diode according to claim 11 having a forward current of at least 400 milliamps at a forward voltage of as low as 2.7 volts while operating at a temperature of 25° C.

Claim 23

A rectifying diode according to claim 11 having a forward current of at least 400 milliamps at a forward voltage of as low as 2.2 volts while operating at a temperature of 350° C.

Claim 24

A rectifying diode according to claim 11 having a forward current of up to 10 amps at forward voltages as low as 2.7 volts over at a temperature range of about 20° C. to about 350° C.

Claim 25

A rectifying diode according to claim 11 having a reverse leakage current no greater than 25 microamps up to a given rated reverse breakdown voltage while operating at a temperature of 25° C.

Claim 26

A rectifying diode according to claim 11 having a reverse leakage current no greater than 100 microamps up to a given rated reverse breakdown voltage while operating at a temperature of 350° C.

Claim 27

A rectifying diode according to claim 11 having a reverse leakage current no greater than 8 microamps at -400 volts while operating at a temperature of 25° C.

Claim 28

A rectifying diode according to claim 11 having a reverse leakage current no greater than 80 microamps at -400 volts while operating at a temperature of 350° C.

Claim 29

A rectifying diode according to claim 11 having a reverse recovery time less than 200 nanoseconds.

Claim 30

A rectifying diode according to claim 11 having a reverse recovery time less than 100 nanoseconds.

Claim 31

A rectifying diode according to claim 11 having a reverse recovery time less than 20 nanoseconds.

Claim 32

A rectifying diode according to claim 11 having a reverse recovery time less than 10 nanoseconds.

Claim 33

A rectifying diode according to claim 11 having a reverse recovery time as small as 6 nanoseconds or less at an operating temperature of 25° C.

Claim 34

A rectifying diode according to claim 11 having a reverse recovery time as small as 7 nanoseconds or less at an operating temperature of 350° C.

Claim 35

A fact recovery, high temperature rectifying diode formed in silicon carbide and comprising: a monocrystalline silicon carbide substrate having a sufficient carrier concentration to give said substrate a first conductivity type; a first monocrystalline epitaxial layer of silicon carbide upon said substrateand having the same conductivity type as said substrate; and a second monocrystalline epitaxial layer of silicon carbide upon said first epitaxial layer and having the opposite conductivity type from said first epitaxial layer; said first epitaxial layer having a carrier concentrate greater than said second epitaxial layer by an amount sufficient so that said second epitaxial layer is predominantly depleted at reverse bias, with said carrier concentration of said second layer being between about 1×10 15 and 1×10 18 atoms per cubic centimeter (cm -3 ), and said second layer further having a minimum thickness of between about 0.2 microns at about 1×10 18 cm -3 and about 70 microns at about 1×10 15 cm -3 so that said minimum thickness is sufficient to achieve avalanche breakdown under reverse bias; a third monoepitaxial layer upon said second epitaxial layer and having the same conductivity type as said second epitaxial layer and having a carrier concentration greater than said second epitaxial layer for reducing the contact resistance to said diode; and an abrupt rectifying p-n junction formed between said first and second epitaxial layers.

Claim 36

A fact recovery, high temperature rectifying diode formed in silicon carbide and comprising: a monocrystalline silicon carbide substrate having a sufficient carrier concentration to give said substrate a first conductivity type; a first monocrystalline epitaxial layer of silicon carbide upon said substrateand having the same conductivity type as said substrate; and a second monocrystalline epitaxial layer of silicon carbide upon said first epitaxial layer and having the opposite conductivity type from said first epitaxial layer; said first epitaxial layer having a carrier concentrate greater than said second epitaxial layer by an amount sufficient so that said second epitaxial layer is predominantly depleted at reverse bias, with said carrier concentration of said second layer being between about 1×10 15 and 1×10 18 atoms per cubic centimeter (cm -3 ), and said second layer further having a minimum thickness of between about 0.2 microns at about 1×10 18 cm -3 and about 70 microns at about 1×10 15 cm -3 so that said minimum thickness is sufficient to achieve avalanche breakdown under reverse bias; a third monoepitaxial layer upon said second epitaxial layer and having the same conductivity type as said second epitaxial layer and having a carrier concentration greater than said second epitaxial layer for reducing the contact resistance to said diode; and an abrupt rectifying p-n junction formed between said first and second epitaxial layers.

Claim 37

A rectifying diode according to claim 33 wherein said substrate and said first epitaxial layer comprise n-type alpha silicon carbide, and said second and third epitaxial layers comprise p-type alpha silicon carbide.

Claim 38

A rectifying diode according to claim 33 having a reverse breakdown voltage as high as -5000 volts while operating at a temperature range of between -55° C. and 350° C.

Claim 39

A rectifying diode according to claim 33 having a forward current of up to 10 amps at forward voltages as low as 2.7 volts over a temperature range of about 20° C. to about 350° C.

Claim 40

A rectifying diode according to claim 33 having a reverse leakage current no greater than 100 microamps up to a given rated reverse breakdown voltage while operating at a temperature of 350° C.

Claim 41

A rectifying diode according to claim 33 having a reverse recovery time less than 20 nanoseconds.

Claim 42

A rectifying diode according to claim 33 and further comprising an ohmic contact to said substrate and an ohmic contact to said third epitaxial layer.