US5059770A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Multi-zone planar heater assembly and method of operation
Assignee: Aviza Technology Inc
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Filing: 1989-09-19
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Granted: 1991-10-22
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Expires: 2009-09-19
Abstract
Abstract A heater assembly and method of operation for use in processing of a substrate such as a semiconductor wafer, for example in a chemical vapor deposition (CVD) reactor chamber, the heater assembly including a dielectric heater base, radially spaced apart and circumferentially extending heater element segments being arranged on the heater base, operation of the plurality of heater elements being independently regulated, a heater shroud being arranged in spaced apart relation over the heater elements while supporting the substrate for maintaining a blanket of inert gas between the heater elements and the heater shroud. Inert gas is preferably introduced through a central opening in the heater base and is selectively regulated for facilitating processing of the substrate.
Inventors
- 👤 Imad Mahawili
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-05 23:44
CPC Classifications
H; H10; H10P; H10P95/00; H10P72/00; H10P72/04; H10P72/0431; H10P72/0432; H10W; H10W40/00; H10W40/10
Claims Analysis
Total Claims: 27
Claim 1
Independent Claim
176 words
A heater assembly for use in semiconductor wafer processing for developing and maintaining a uniform elevated temperature in the wafer, comprising a dielectric heater base having a circular surface, a plurality of heater elements arranged on the circular surface of the heater base and formed from conductive material capable of resistive heating, the plurality of heater elements forming radially spaced, circumferentially extending segments which, in combination, substantially cover the circular surface, the heater element segments being separated from each other by circumferentially extending regions, each heater element segment being interrupted by a radially extending region, separate means for respectively regulating operation of the plurality of heater elements, the separate means for respectively regulating operation of the plurality of heater elements comprising electrical couplings operatively coupled with each heater element segment opposite the respective radially extending region, a heater shroud arranged in spaced apart relation from the plurality of heater elements and intermediate the heater elements and the semiconductor wafer, and means for maintaining a blanket of inert gas between the heater elements and the heater shroud.
Claim 2
Dependent Claim
176 words
A heater assembly for use in semiconductor wafer processing for developing and maintaining a uniform elevated temperature in the wafer, comprising a dielectric heater base having a circular surface, a plurality of heater elements arranged on the circular surface of the heater base and formed from conductive material capable of resistive heating, the plurality of heater elements forming radially spaced, circumferentially extending segments which, in combination, substantially cover the circular surface, the heater element segments being separated from each other by circumferentially extending regions, each heater element segment being interrupted by a radially extending region, separate means for respectively regulating operation of the plurality of heater elements, the separate means for respectively regulating operation of the plurality of heater elements comprising electrical couplings operatively coupled with each heater element segment opposite the respective radially extending region, a heater shroud arranged in spaced apart relation from the plurality of heater elements and intermediate the heater elements and the semiconductor wafer, and means for maintaining a blanket of inert gas between the heater elements and the heater shroud.
Claim 3
Dependent Claim
15 words
The heater assembly of claim 1 wherein the heater elements are formed from pyrolytic graphite.
Claim 4
Dependent Claim
41 words
The heater assembly of claim 1 wherein the heater elements are formed by uniformly depositing the conductive material over the circular surface of the dielectric heater base and then selectively removing portions of the conductive material to form the heater elements.
Claim 5
Dependent Claim
61 words
The heater assembly of claim 3 wherein the heater element segments are separated from each other by circumferentially extending regions, each heater element segment being interrupted by a radially extending region, the separate means for respectively regulating operation of the plurality of heater elements comprising electrical couplings formed on portions of each heater element segment opposite the respective radially extending region.
Claim 6
Dependent Claim
56 words
The heater assembly of claim 1 wherein the heater base is formed from dielectric material selected to have a similar coefficient of thermal expansion as the conductive metal in the heater elements, the dielectric material also being selected to resist separation from the conductive metal and to remain dimensionally stable during rapid an extensive temperature variations.
Claim 7
Dependent Claim
24 words
The heater assembly of claim 5 wherein the heater base is formed from boron nitride and the heater element segments are formed pyrolytic graphite.
Claim 8
Dependent Claim
17 words
The heater assembly of claim 1 wherein the heater shroud includes means for supporting the wafer thereupon.
Claim 9
Dependent Claim
48 words
The heater assembly of claim 1 wherein the means for maintaining an inert gas blanket comprises a central opening in the heater base forming an inert gas inlet so that inert gas from the central inlet flows radially outwardly between the heater element segments and the heater shroud.
Claim 10
Dependent Claim
23 words
The heater assembly of claim 8 further comprising means formed about a peripheral portion of the heater shroud for venting the inert gas.
Claim 11
Dependent Claim
25 words
The heater assembly of claim 8 further comprising means for regulating inert gas flow through the central opening for facilitating processing of the semiconductor wafer.
Claim 12
Dependent Claim
48 words
The heater assembly of claim 1 wherein the means for maintaining an inert gas blanket comprises a central opening in the heater base forming an inert gas inlet so that inert gas from the central inlet flows radially outwardly between the heater element segments and the heater shroud.
Claim 13
Dependent Claim
23 words
The heater assembly of claim 11 further comprising means formed about a peripheral portion of the heater shroud for venting the inert gas.
Claim 14
Dependent Claim
25 words
The heater assembly of claim 11 further comprising means for regulating inert gas flow through the central opening for facilitating processing of the semiconductor wafer.
Claim 15
Dependent Claim
22 words
The heater assembly of claim 1 wherein the heater assembly and wafer are arranged in a chemical vapor deposition (CVD) reactor chamber.
Claim 16
Independent Claim
155 words
A method of heating a substrate during semiconductor wafer processing and for developing and maintaining a uniform elevated temperature in the substrate, comprising the steps of forming a heater assembly to include a dielectric heater base having a circular surface, a plurality of heater elements arranged on the circular surface of the heater base, the plurality of heater elements forming radially spaced, circumferentially extending segments which, in combination, substantially cover the circular surface, and a heater shroud arranged in spaced apart relation from the plurality of heater elements and intermediate the heater elements and the substrate, maintaining a blanket of inert gas between the heater elements and the heater shroud during operation of the heater assembly, and separately regulating operation of the plurality of heater elements in order to achieve different heating temperatures in the respective heater elements and thereby substantially eliminate temperature variations throughout the substrate for facilitating and enhancing processing of the substrate.
Claim 17
Independent Claim
155 words
A method of heating a substrate during semiconductor wafer processing and for developing and maintaining a uniform elevated temperature in the substrate, comprising the steps of forming a heater assembly to include a dielectric heater base having a circular surface, a plurality of heater elements arranged on the circular surface of the heater base, the plurality of heater elements forming radially spaced, circumferentially extending segments which, in combination, substantially cover the circular surface, and a heater shroud arranged in spaced apart relation from the plurality of heater elements and intermediate the heater elements and the substrate, maintaining a blanket of inert gas between the heater elements and the heater shroud during operation of the heater assembly, and separately regulating operation of the plurality of heater elements in order to achieve different heating temperatures in the respective heater elements and thereby substantially eliminate temperature variations throughout the substrate for facilitating and enhancing processing of the substrate.
Claim 18
Dependent Claim
19 words
The method of claim 15 wherein the heater elements are formed from a conductive material selected for resistive heating.
Claim 19
Dependent Claim
14 words
The method of claim 16 wherein the heater elements are formed from pyrolytic graphite.
Claim 20
Dependent Claim
38 words
The method of claim 16 wherein the heater elements are formed by uniformly depositing the conductive material on the circular surface of the heater base and then selectively removing portions of the metal to form the heater elements.
Claim 21
Dependent Claim
21 words
The method of claim 15 further comprising the step of supporting the substrate in thermally conductive relation upon the heater shroud.
Claim 22
Dependent Claim
37 words
The method of claim 15 wherein the inert gas blanket is maintained by introducing inert gas through a central opening in the heater base and allowing the inert gas to flow radially outwardly over the heater elements.
Claim 23
Dependent Claim
24 words
The method of claim 20 further comprising the step of venting the radially flowing inert gas about a peripheral portion of the heater shroud.
Claim 24
Dependent Claim
28 words
The method of claim 21 further comprising the step of regulating inert gas flow through the central opening of the heater base for facilitating processing of the substrate.
Claim 25
Dependent Claim
40 words
The method of claim 22 further comprising the step of mounting the heater assembly and substrate within a chemical vapor deposition (CVD) reactor chamber and thereafter operating the heater assembly as part of a CVD process for treating the substrate.
Claim 26
Dependent Claim
28 words
The method of claim 15 further comprising the step of regulating inert gas flow through a central opening of the heater base for facilitating processing of the substrate.
Claim 27
Dependent Claim
40 words
The method of claim 24 further comprising the step of mounting the heater assembly and substrate within a chemical vapor deposition (CVD) reactor chamber and thereafter operating the heater assembly as part of a CVD process for treating the substrate.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1994-10-21 | 1995-04-22 | 1995-10-22 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1998-10-21 | 1999-04-22 | 1999-10-22 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2002-10-21 | 2003-04-22 | 2003-10-22 | $7700.00 | Window Closed / Lapsed |