Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
202 words
An address decoder circuit for a non-volatile memory which produces, in a selection state, a first potential during a reading operation or a second potential greater in absolute value than the first potential during a writing operation, said address decoder circuit comprising: a load MOS transistor connected at one end thereof to a first terminal; one or more series-connected address input MOS transistors receiving address signals at gates thereof and coupled between the other end of said load MOS transistor and a second terminal; and a buffer receiving as an input a signal from a node of said load MOS transistor and said address input MOS transistor, and also receiving as a supply voltage the voltage between a third terminal and a reference potential terminal; wherein, during a reading operation, the first potential is outputted from the selected buffer by applying the first potential to both the first and third terminals; during a writing operation, the second potential is outputted from the selected buffer by applying the second potential to both the first and third terminals; and during an erasing operation, a third potential is outputted in a non-selection state by applying a third potential to both the second and third terminals.
Claim 2
Dependent Claim
202 words
An address decoder circuit for a non-volatile memory which produces, in a selection state, a first potential during a reading operation or a second potential greater in absolute value than the first potential during a writing operation, said address decoder circuit comprising: a load MOS transistor connected at one end thereof to a first terminal; one or more series-connected address input MOS transistors receiving address signals at gates thereof and coupled between the other end of said load MOS transistor and a second terminal; and a buffer receiving as an input a signal from a node of said load MOS transistor and said address input MOS transistor, and also receiving as a supply voltage the voltage between a third terminal and a reference potential terminal; wherein, during a reading operation, the first potential is outputted from the selected buffer by applying the first potential to both the first and third terminals; during a writing operation, the second potential is outputted from the selected buffer by applying the second potential to both the first and third terminals; and during an erasing operation, a third potential is outputted in a non-selection state by applying a third potential to both the second and third terminals.
Claim 3
Dependent Claim
48 words
An address decoder circuit according to claim 1, wherein a reference potential is outputted in a selection state during an erasing operation, so that a negative voltage is applied to the control gate of the non-volatile memory to allow injection of positive holes into the floating gate thereof.
Claim 4
Dependent Claim
23 words
An address decoder circuit according to claim 1, wherein the back gate of said load MOS transistor is connected to the third terminal.
Claim 5
Dependent Claim
65 words
An address decoder circuit for a non-volatile memory which comprises load means and MOS transistors supplied with address signals and receives a variable supply voltage whose absolute value in a writing operation is greater than that in a reading operation, wherein said load means is composed of a variable resistance means whose resistance becomes lower in the reading operation and higher in the writing operation.
Claim 6
Dependent Claim
65 words
An address decoder circuit for a non-volatile memory which comprises load means and MOS transistors supplied with address signals and receives a variable supply voltage whose absolute value in a writing operation is greater than that in a reading operation, wherein said load means is composed of a variable resistance means whose resistance becomes lower in the reading operation and higher in the writing operation.
Claim 7
Dependent Claim
49 words
An address decoder circuit according to claim 4, wherein the resistance of said load means is controlled by resistance control means in such a manner as to vary in conformity with the change in the variable supply voltage within a range between a write voltage and a read voltage.