UV absorption control of thin film growth

Claim 1

As apparatus for monitoring and controlling the growth of thin films comprising: (a) a chamber for containing a substrate in a controlled atmosphere, said thin film being grown on the substrate; (b) an input system having a tubular means for carrying gases from one or more solid or liquid reactants into said chamber, wherein some portion of each of said gases will be incorporated into the thin film; (c) an exhaust system for removing the remaining portion of said gases from said chamber; and (d) an ultraviolet absorbance monitor with an optical path through said chamber; (e) means for simultaneously measuring the ultraviolet absorbance of the gases at a plurality of wavelengths; and (f) means for calculating, using simultaneous equations, the partial pressures of each of said gases.

Claim 3

An apparatus for monitoring and controlling the growth rate and composition of thin films comprising: (a) a chamber for containing a substrate in a controlled atmosphere, said thin film being grown on the substrate; (b) an input system having a tubular means for carrying gases from one or more solid or liquid reactants into said chamber, wherein some portion of each of said gases will be incorporated into the thin film; (c) an exhaust system for removing the remaining portion of said gases from said chamber; (d) a source of ultraviolet light having a plurality of wavelengths; (e) a detector of ultraviolet light; (f) an optical path for transmitting said ultraviolet light from said source through said gases to said detector; (g) a bypass section in series communication with said tubular means, said bypass section carrying most of the gases flowing through said tubular means; and (h) a sensor section in parallel with said bypass section for carrying the remainder of the gases flowing through said tubular means, said sensor section including said optical path.

Claim 4

An apparatus for monitoring and controlling the growth rate and composition of thin films comprising: (a) a chamber for containing a substrate in a controlled atmosphere, said thin film being grown on the substrate; (b) an input system having a tubular means for carrying gases from one or more solid or liquid reactants into said chamber, wherein some portion of each of said gases will be incorporated into the thin film; (c) an exhaust system for removing the remaining portion of said gases from said chamber; (d) a source of ultraviolet light having a plurality of wavelengths; (e) a detector of ultraviolet light; (f) an optical path for transmitting said ultraviolet light from said source through said gases to said detector; (g) a bypass section in series communication with said tubular means, said bypass section carrying most of the gases flowing through said tubular means; and (h) a sensor section in parallel with said bypass section for carrying the remainder of the gases flowing through said tubular means, said sensor section including said optical path.

Claim 5

A method for monitoring the growth rate and composition of films comprising: (a) establishing a flow of carrier gas through a fabrication chamber having an optical path through said chamber; (b) heating a susceptor upon which is mounted a substrate for the growth of a film to a predetermined temperature; (c) introducing gases from one or more solid or liquid reactants into said chamber; (d) directing a beam of ultraviolet radiation having a plurality of wavelengths along said optical path through said chamber; (e) simultaneously, measuring the absorbance of the ultraviolet radiation by the gases; (f) using simultaneous equations calculating the partial pressure of each gas using the absorbance at a plurality of wavelengths of each gas; (g) correlating the partial pressure of each gas to the growth of the thin film on the substrate.

Claim 6

A method for monitoring the growth rate and composition of films comprising: (a) establishing a flow of carrier gas through a fabrication chamber having an optical path through said chamber; (b) heating a susceptor upon which is mounted a substrate for the growth of a film to a predetermined temperature; (c) introducing gases from one or more solid or liquid reactants into said chamber; (d) directing a beam of ultraviolet radiation having a plurality of wavelengths along said optical path through said chamber; (e) simultaneously, measuring the absorbance of the ultraviolet radiation by the gases; (f) using simultaneous equations calculating the partial pressure of each gas using the absorbance at a plurality of wavelengths of each gas; (g) correlating the partial pressure of each gas to the growth of the thin film on the substrate.