Abstract A semiconductor apparatus comprises a semiconductor body of one conductivity type; a first impurity region of an opposite conductivity type, which is formed in the surface area of the semiconductor body; impurity regions of the opposite conductivity type, formed in the surface area of the semiconductor body, at locations away from the first impruity region; second and third impurity regions of one conductivity type, which seve as source and drain regions, respectively, and are formed in the impurity regions of an opposite conductivity type, so as to sandwich a channel reigon; and a gate electrode formed on the channel region, through an insulative layer. In this semiconductor apparatus, the impurity regions of the opposite conductivity type include fourth and fifth impurity regions, formed in the channel region such that at least parts of the fourth and fifth impurity regions overlap.
A method of manufacturing a semiconductor apparatus, comprising the steps of: forming an insulative layer on a semiconductor body of one conductivity type; forming first and second opening portions on said insulative layer, such that said portions are located away from each other; forming an insulative film thinner than said insulative layer on said semiconductor base material exposed in said first and second opening portions; forming a gate electrode on the insulative film in said second opening portion; forming a first impurity region in the portion corresponding to said first opening portion, by implanting impurities of an opposite conductivity type in said semiconductor base material, through said first and second opening portions, by using said insulative layer and said gate electrode as masks, and forming second and third impurity regions in the portion corresponding to said second opening portion, so that parts of said second and third impurity regions overlap; and forming fourth and fifth impurity regions, serving as a source and a drain, respectively, by implanting impurities of one conductivity type into said second and third impurity regions, through the second opening portion.
Claim 2
Independent Claim
184 words
A method of manufacturing a semiconductor apparatus, comprising the steps of: forming an insulative layer on a semiconductor body of one conductivity type; forming first and second opening portions on said insulative layer, such that said portions are located away from each other; forming an insulative film thinner than said insulative layer on said semiconductor base material exposed in said first and second opening portions; forming a gate electrode on the insulative film in said second opening portion; forming a first impurity region in the portion corresponding to said first opening portion, by implanting impurities of an opposite conductivity type in said semiconductor base material, through said first and second opening portions, by using said insulative layer and said gate electrode as masks, and forming second and third impurity regions in the portion corresponding to said second opening portion, so that parts of said second and third impurity regions overlap; and forming fourth and fifth impurity regions, serving as a source and a drain, respectively, by implanting impurities of one conductivity type into said second and third impurity regions, through the second opening portion.