US5026663A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of fabricating a structure having self-aligned diffused junctions
Assignee: Motorola Solutions Inc
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Filing: 1989-07-21
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Granted: 1991-06-25
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Expires: 2009-07-21
Abstract
Abstract A method of fabricating a semiconductor structure having self-aligned diffused junctions is provided wherein a first dielectric layer, a doped semiconductor layer and a second dielectric layer are formed on a semiconductor substrate. An opening extending to the semiconductor substrate is then formed through these layers. Undoped semiconductor spacers are formed in the opening adjacent to the exposed ends of the doped semiconductor layer and dopant is diffused from the doped semiconductor layer through the undoped semiconductor spacers and into the semiconductor substrate to form junctions therein. This provides for integrated contacts through the doped semiconductor layer.
Inventors
- 👤 Peter J. Zdebel
- 👤 Barbara Vasquez
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 16:14
CPC Classifications
H; H10; H10P; H10P32/00; H10P32/10; H10P32/17; H10P32/171; H10D; H10D64/00; H10D64/01; H10D64/011; H10D64/0111; H10D64/0113; H10P32/14; H10P32/1408; H10P32/1414; H10P76/00; H10P76/40
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
152 words
A method of fabricating a semiconductor structure having self-aligned diffused junctions comprising the steps of: providing a semiconductor substrate; forming a first dielectric layer on said substrate; forming a doped semiconductor layer on said first dielectric layer; forming a second dielectric layer on said doped semiconductor layer; forming an opening through said second dielectric layer; forming dielectric spacers in said opening; forming a dielectric lens in said opening between said dielectric spacers; removing said dielectric spacers; forming openings through said doped semiconductor layer and said first dielectric layer at the regions where said dielectric spacers were formerly disposed; forming undoped semiconductor material in said openings formed where said dielectric spacers were formerly disposed; removing said doped semiconductor layer and said first dielectric layer from between said undoped semiconductor material; and diffusing dopant from said doped semiconductor layer through said undoped semiconductor material and into said substrate to form junctions in said substrate.
Claim 2
Independent Claim
152 words
A method of fabricating a semiconductor structure having self-aligned diffused junctions comprising the steps of: providing a semiconductor substrate; forming a first dielectric layer on said substrate; forming a doped semiconductor layer on said first dielectric layer; forming a second dielectric layer on said doped semiconductor layer; forming an opening through said second dielectric layer; forming dielectric spacers in said opening; forming a dielectric lens in said opening between said dielectric spacers; removing said dielectric spacers; forming openings through said doped semiconductor layer and said first dielectric layer at the regions where said dielectric spacers were formerly disposed; forming undoped semiconductor material in said openings formed where said dielectric spacers were formerly disposed; removing said doped semiconductor layer and said first dielectric layer from between said undoped semiconductor material; and diffusing dopant from said doped semiconductor layer through said undoped semiconductor material and into said substrate to form junctions in said substrate.
Claim 3
Dependent Claim
21 words
The method of claim 1 wherein the openings formed where the dielectric spacers were formerly disposed extend into the semiconductor substrate.
Claim 4
Dependent Claim
39 words
The method of claim 2 further including the step of forming dielectric spacers in the opening, said dielectric spacers serving to limit the finished emitter width in a bipolar device or the finished gate length in an MOS device.
Claim 5
Independent Claim
229 words
A method of fabricating a semiconductor structure having self-aligned diffused junctions comprising the steps of: providing a monosilicon substrate; forming a first oxide layer on said substrate; forming a first nitride layer on said oxide layer; forming a polysilicon layer on said nitride layer; doping said polysilicon layer either during or after its formation; forming a second oxide layer on said polysilicon layer; forming a mask on said second oxide layer to define a device opening; forming said device opening by etching through said second oxide layer and stopping on said polysilicon layer; forming a conformal nitride layer over said semiconductor structure; etching said conformal nitride layer to form nitride spacers in said device opening; thermally oxidizing said polysilicon layer between said nitride spacers in said device opening to form an oxide lens; removing said nitride spacers from said device opening; forming openings in said device opening at the regions where said nitride spacers were formerly disposed, said openings extending to said substrate; forming a conformal polysilicon layer over the device structure including in said openings; etching said conformal polysilicon layer to form polysilicon spacers; removing the remainder of said polysilicon layer, said first nitride layer and said first oxide layer from between said polysilicon spacers in said device opening; and diffusing dopant from said polysilicon layer, through said polysilicon spacers and into said substrate to form junctions therein.
Claim 6
Independent Claim
229 words
A method of fabricating a semiconductor structure having self-aligned diffused junctions comprising the steps of: providing a monosilicon substrate; forming a first oxide layer on said substrate; forming a first nitride layer on said oxide layer; forming a polysilicon layer on said nitride layer; doping said polysilicon layer either during or after its formation; forming a second oxide layer on said polysilicon layer; forming a mask on said second oxide layer to define a device opening; forming said device opening by etching through said second oxide layer and stopping on said polysilicon layer; forming a conformal nitride layer over said semiconductor structure; etching said conformal nitride layer to form nitride spacers in said device opening; thermally oxidizing said polysilicon layer between said nitride spacers in said device opening to form an oxide lens; removing said nitride spacers from said device opening; forming openings in said device opening at the regions where said nitride spacers were formerly disposed, said openings extending to said substrate; forming a conformal polysilicon layer over the device structure including in said openings; etching said conformal polysilicon layer to form polysilicon spacers; removing the remainder of said polysilicon layer, said first nitride layer and said first oxide layer from between said polysilicon spacers in said device opening; and diffusing dopant from said polysilicon layer, through said polysilicon spacers and into said substrate to form junctions therein.
Claim 7
Dependent Claim
28 words
The method of claim 4 further comprising the step of forming a second nitride layer on the polysilicon layer prior to the formation of the second oxide layer.
Claim 8
Dependent Claim
17 words
The method of claim 4 wherein the forming openings step includes said openings extending into the substrate.
Claim 9
Dependent Claim
46 words
The method of claim 4 wherein the forming openings step comprises the steps of: etching through the polysilicon layer; etching through the first nitride layer and the first oxide layer; and etching into the substrate if it is desired that said openings extend into said substrate.
Claim 10
Dependent Claim
76 words
The method of claim 4 further including the steps of: forming a screen oxide layer on the polysilicon spacers and on the substrate in the device opening; forming and patterning masks on said screen oxide layer; implanting dopants into said substrate; and forming oxide or nitride spacers in said device opening, said oxide or nitride spacers serving to limit the finished emitter width in a bipolar device or the finished gate length in an MOS device.
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| 3.5 Years (Year 4) | 1994-06-24 | 1994-12-24 | 1995-06-25 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1998-06-24 | 1998-12-24 | 1999-06-25 | $3760.00 | Window Closed / Lapsed |
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