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US5011791A Expired / Lapsed US ⏱️ 0.0 years remaining

Fusible link with built-in redundancy

Assignee: Semiconductor Components Industries LLC
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Filing: 1989-02-03
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Granted: 1991-04-30
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Expires: 2009-02-03
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Abstract

Abstract A fusible link is fabricated using sidewall spacer technology. The fusible link of the present requires low fusing power because a fusible link having a small cross-sectional area is obtainable. A conductive or semiconductive, fusible sidewall spacer is formed around a platform or in a well of a dielectric layer. Each fusible link may have two fusible portions per site, resulting in a built-in redundancy. Alternatively, the packing density of the fusible links may be increased by using each side of the fusible sidewall spacer as a fusible link. This process is compatible with bipolar and BICMOS processes used in fabricating high performance memory devices.

Inventors

  • 👤 Sal T. Mastroianni

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 22:28
CPC Classifications
H; H10; H10W; H10W72/00; H10W72/071; H10W20/00; H10W20/40; H10W20/49; H10W20/493; Y; Y10; Y10S; Y10S148/00; Y10S148/055

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 60 words
A method of making a fusible sidewall spacer, comprising the steps of: providing a semiconductor substrate; forming a dielectric layer on the substrate; patterning a transition having four sides in the dielectric layer; forming a fusible material on the dielectric layer; and partially removing the fusible material to form the fusible sidewall spacer along the transition in the dielectric layer.
Claim 2
Independent Claim 60 words
A method of making a fusible sidewall spacer, comprising the steps of: providing a semiconductor substrate; forming a dielectric layer on the substrate; patterning a transition having four sides in the dielectric layer; forming a fusible material on the dielectric layer; and partially removing the fusible material to form the fusible sidewall spacer along the transition in the dielectric layer.
Claim 3
Dependent Claim 26 words
The method of claim 1 further comprising providing electrodes making contact to the fusible sidewall spacer to provide for a fusible link having a built-in redundancy.
Claim 4
Dependent Claim 24 words
The method of claim 1 further comprising providing electrodes making contact to the fusible sidewall spacer to provide for at least two fusible links.
Claim 5
Dependent Claim 28 words
The method of claim 1 further comprising providing electrodes making contact to the fusible sidewall spacer to provide for a fusible link on each side of the transition.
Claim 6
Dependent Claim 20 words
The method of claim 1 wherein the material from which the fusible sidewall spacer is formed is a conductive material.
Claim 7
Dependent Claim 20 words
The method of claim 1 wherein the material from which the fusible sidewall spacer is formed is a semiconductive material.

References Cited (Backward Citations)

US4358340A Cited
US4619037A Cited
US4542577A Cited
JPS63237441A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1994-04-29 1994-10-29 1995-04-30 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1998-04-29 1998-10-29 1999-04-30 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2002-04-29 2002-10-29 2003-04-30 $7700.00 Window Closed / Lapsed

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