X-ray analysis apparatus comprising a saggitally curved analysis crystal

Claim 1

An x-ray analysis apparatus comprising in order an x-ray source passing an x-ray beam; a sample reflecting said x-ray beam; at least a primary soller slit collimator collimating said x-ray beam from said sample; a curved analysis crystal receiving said x-ray beam from said collimator, said analysis crystal being substantially circular-cylindrical in a saggital direction transverse to a plane extending through an incident x-ray beam to said analysis crystal and a normal to said analysis crystal, and said analysis crystal producing a diffracted x-ray beam, said circular-cylindrical analysis crystal having a radius of curvature R substantially equivalent to a distance between an entrance side of said primary soller slit collimator and a point of incidence of said incident x-ray beam on a surface of said analysis crystal divided by sin θ, where θ is an angle of incidence of said incident x-ray beam on said analysis crystal; and an x-ray detector receiving said diffracted x-ray beam and having at least one further collimator.