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US4256961A Expired / Lapsed US ⏱️ 0.0 years remaining

X-ray spectroscope

Assignee: Rigaku Corp
•
Filing: 1979-06-27
•
Granted: 1981-03-17
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Expires: 1999-06-27
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Abstract

Abstract An X-ray spectroscope comprising a soller slit consisting of a number of parallel plates and disposed such that one end thereof faces an X-ray emitting portion of a sample to be analyzed and a plurality of analysing crystals or total reflection mirrors disposed parallel to one another and spaced apart from one another at a suitable interval. The analysing crystals or total reflection mirrors are orientated with their one ends directed to the other end of the soller slit and such that X-rays having passed through the soller slit are incident on them with a desired angle of incidence. Also, these analysing crystals or total reflection mirrors each have a convex back side defined by inclined surfaces respectively parallel with incident and reflected X-rays and facing the reflecting surface of the next adjacent analysing crystal or total reflection mirror. With this X-ray spectroscope it is possible to make effective use of X-rays and prevent divergence in directions normal to the diffracting surface, thus permitting analysis with high efficiency.

Inventors

  • 👤 Takashi Shoji
  • 👤 Tadashi Utaka

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-31 23:29
CPC Classifications
G; G01; G01N; G01N23/00; G01N23/20; G01N23/207; G01N23/2076; G01N23/22; G01N23/223

Claims Analysis

Total Claims: 11
Claim 1
Independent Claim 88 words
An X-ray spectroscope comprising a means for causing emission of characteristic X-rays of a sample to be analyzed, a soller slit disposed such that one end thereof faces said sample, a plurality of reflecting means disposed parallel to one another and with one end thereof facing the other end of said soller slit such that X-rays having passed through said soller slit are incident on said reflecting means with a predetermined angle of incidence and a detector, X-rays diffracted by said reflecting means being incident on said detector.
Claim 2
Dependent Claim 88 words
An X-ray spectroscope comprising a means for causing emission of characteristic X-rays of a sample to be analyzed, a soller slit disposed such that one end thereof faces said sample, a plurality of reflecting means disposed parallel to one another and with one end thereof facing the other end of said soller slit such that X-rays having passed through said soller slit are incident on said reflecting means with a predetermined angle of incidence and a detector, X-rays diffracted by said reflecting means being incident on said detector.
Claim 3
Dependent Claim 16 words
The X-ray spectroscope according to claim 1, wherein said reflecting means each comprise an analysing crystal.
Claim 4
Dependent Claim 18 words
The X-ray spectroscope according to claim 1, wherein said reflecting means each comprise a thin total reflection mirror.
Claim 5
Dependent Claim 16 words
The X-ray spectroscope according to claim 2, wherein LiF (200) is used as said analysing crystal.
Claim 6
Dependent Claim 19 words
The X-ray spectroscope according to claim 3, wherein said mirror is formed by finishing a single crystal silicon wafer.
Claim 7
Dependent Claim 21 words
The X-ray spectroscope according to claim 1, which further provides a receiving soller slit between said reflecting means and said detector.
Claim 8
Dependent Claim 32 words
The X-ray spectroscope according to claim 1, which further provides a filter capable of absorbing characteristic X-rays of a particular substance, said filter being disposed between said reflecting means and said detector.
Claim 9
Dependent Claim 16 words
The X-ray spectroscope according to claim 1, wherein said soller slit comprises a number of plates.
Claim 10
Dependent Claim 45 words
The X-ray spectroscope according to claim 1, wherein each said reflecting means has a convex back side defined by inclined surfaces respectively parallel to incident and reflected X-rays, said convex back side facing the reflecting surface of the adjacent reflecting means on the back side.
Claim 11
Dependent Claim 17 words
The X-ray spectroscope according to claim 1, wherein said reflecting means are mounted on an exchanger member.

References Cited (Backward Citations)

US3160747A Cited
US3160749A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1984-03-16 1984-09-15 1985-03-17 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1988-03-16 1988-09-15 1989-03-17 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1992-03-16 1992-09-15 1993-03-17 $7700.00 Window Closed / Lapsed

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