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US4996166A Expired / Lapsed US ⏱️ 0.0 years remaining

Process for fabricating a heterojunction bipolar transistor

Assignee: Fujitsu Ltd
•
Filing: 1990-01-17
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Granted: 1991-02-26
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Expires: 2010-01-17
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Abstract

Abstract A heterojunction bipolar transistor includes a base layer and a wide bandgap emitter layer. A portion of the base layer is exposed, a base electrode is formed thereon and the active region of the emitter-base junction is limited inside a semiconductor body. As a result, surface recombination current generation of the peripheral region of the junction is prevented and the emitter efficiency is improved.

Inventors

  • 👤 Toshio Ohshima

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-01 19:21
CPC Classifications
H; H10; H10D; H10D64/00; H10D64/20; H10D64/27; H10D64/281; H10D10/00; H10D10/80; H10D10/821

Claims Analysis

Total Claims: 3
Claim 1
Independent Claim 200 words
A process for fabricating a bipolar transistor comprising the steps of: (a) forming a first semiconductor layer of a first conductivity type; (b) forming a second semiconductor layer of a second conductivity type, opposite to the first conductivity type, on the first semiconductor layer; (c) forming a third semiconductor layer of the first conductivity type on the second semiconductor layer, the third semiconductor layer comprising a semiconductor forming a heterojunction with the second semiconductor layer and having a bandgap wider than that of the second semiconductor layer; (d) selectively removing a portion of the third semiconductor layer so that a portion of the second semiconductor layer is exposed and out overlaid by the third semiconductor layer; (e) doping an impurity into a region of the third semiconductor layer extending along an entire boundary between the third semiconductor layer and the exposed portion of the second semiconductor layer to convert the conductivity type of that region into the second conductivity; (f) forming a first electrode electrically connected with the first semiconductor layer; (g) forming a second electrode above and in contact with the second semiconductor layer in the exposed region; and (h) forming a third electrode above the third semiconductor layer.
Claim 2
Dependent Claim 200 words
A process for fabricating a bipolar transistor comprising the steps of: (a) forming a first semiconductor layer of a first conductivity type; (b) forming a second semiconductor layer of a second conductivity type, opposite to the first conductivity type, on the first semiconductor layer; (c) forming a third semiconductor layer of the first conductivity type on the second semiconductor layer, the third semiconductor layer comprising a semiconductor forming a heterojunction with the second semiconductor layer and having a bandgap wider than that of the second semiconductor layer; (d) selectively removing a portion of the third semiconductor layer so that a portion of the second semiconductor layer is exposed and out overlaid by the third semiconductor layer; (e) doping an impurity into a region of the third semiconductor layer extending along an entire boundary between the third semiconductor layer and the exposed portion of the second semiconductor layer to convert the conductivity type of that region into the second conductivity; (f) forming a first electrode electrically connected with the first semiconductor layer; (g) forming a second electrode above and in contact with the second semiconductor layer in the exposed region; and (h) forming a third electrode above the third semiconductor layer.
Claim 3
Dependent Claim 50 words
A process according to claim 1, further comprising the step of forming insulating portions in the third and second semiconductor layers, so that an active region of the boundary between the third semiconductor layer and the second semiconductor layer is entirely surrounded by the insulating portions and the doped region.

References Cited (Backward Citations)

US4712121A Cited
EP0177246A1 Cited
EP0194197A1 Cited
JPS6249659A Cited
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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1994-02-25 1994-08-27 1995-02-26 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1998-02-25 1998-08-27 1999-02-26 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2002-02-25 2002-08-27 2003-02-26 $7700.00 Window Closed / Lapsed

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