US4994903A — Circuit substrate and circuit using the substrate

Claim 1

Independent Claim 285 words

A circuit substrate comprising a layer of organic electrically insulating material, a relatively high electrical conductivity metal layer adhered to and supported on one side of the organic electrically insulating material layer to be etched to form electrically conductive circuit paths and pads for mounting silicon semiconductor devices thereon, heat-sink metal layer means adhered to and supported on an opposite side of the organic electrically insulating material layer in electrically insulated relation to the relatively high electrical conductivity metal layer for withdrawing heat from said devices, the organic layer having a multiplicity of particles of material of relatively higher thermal conductivity than the organic layer material dispersed in the organic layer material for enhancing heat-withdrawal from the devices and the heat-sink metal layer means comprising a layer of metal of relatively low coefficient of thermal expansion with a plurality of apertures therein and a metal of a relatively higher thermal conductivity then said low expansion metal disposed in the apertures and defining thin metal layers of high thermal conductivity along each of two opposite sides of the layer of metal of relatively low coefficient of thermal expansion said metal of relatively higher thermal conductivity being metallurgically bonded to the layer of metal of relatively low coefficient of thermal expansion providing the heat-sink metal layer means with a selected heat-transfer properties and an effective coefficient of thermal expansion and having the organic layer adhered thereto along one side of the heat-sink metal layer means to cooperate with particles enhancing heat-withdrawal from the silicon semiconductor devices to conduct the withdrawn heat into and through the heat-sink metal layer means while also providing improved reliability of mounting of silicon semiconductor devices on said pads during the enhanced heat-withdrawal.

Claim 2

Dependent Claim 285 words

A circuit substrate comprising a layer of organic electrically insulating material, a relatively high electrical conductivity metal layer adhered to and supported on one side of the organic electrically insulating material layer to be etched to form electrically conductive circuit paths and pads for mounting silicon semiconductor devices thereon, heat-sink metal layer means adhered to and supported on an opposite side of the organic electrically insulating material layer in electrically insulated relation to the relatively high electrical conductivity metal layer for withdrawing heat from said devices, the organic layer having a multiplicity of particles of material of relatively higher thermal conductivity than the organic layer material dispersed in the organic layer material for enhancing heat-withdrawal from the devices and the heat-sink metal layer means comprising a layer of metal of relatively low coefficient of thermal expansion with a plurality of apertures therein and a metal of a relatively higher thermal conductivity then said low expansion metal disposed in the apertures and defining thin metal layers of high thermal conductivity along each of two opposite sides of the layer of metal of relatively low coefficient of thermal expansion said metal of relatively higher thermal conductivity being metallurgically bonded to the layer of metal of relatively low coefficient of thermal expansion providing the heat-sink metal layer means with a selected heat-transfer properties and an effective coefficient of thermal expansion and having the organic layer adhered thereto along one side of the heat-sink metal layer means to cooperate with particles enhancing heat-withdrawal from the silicon semiconductor devices to conduct the withdrawn heat into and through the heat-sink metal layer means while also providing improved reliability of mounting of silicon semiconductor devices on said pads during the enhanced heat-withdrawal.

Claim 3

Dependent Claim 222 words

A circuit substrate according to claim 1, wherein the organic layer material is selected from the group consisting of epoxies, acetal resins, polyimides, polyamides, polyimide-amides, polyesters, polyolefins, tetrafluoroethylene and acrylonitule butadiene styrene copolymers, the particles are formed from materials selected from the group consisting of oxides, nitrides and carbides of aluminum, boron, beryllium, magnesium, zinc, silicon and titanium, the relatively high thermal conductivity metal and the heat sink layer is selected from the group consisting of copper and aluminum and alloys thereof, and the metal of relatively low coefficient of thermal expansion in the heat-sink layer is selected from the group consisting of alloys having a nominal composition by weight of from about 30 to 50 percent nickel and the balance iron, of about 31 percent nickel, 8 percent chromium, 8 percent cobalt and the balance iron, of about 32 percent nickel, 15 percent cobalt, 1 percent molybdenum and the balance iron, of about 38 percent nickel, 7 percent chromium and the balance iron, of of about 17 percent chromium and the balance iron, of about 16.5 percent chromium, 4.5 percent aluminum, and the balance iron, of about 57 percent cobalt, 9 percent chromium and the balance iron, and of about 23 to 30 percent nickel, about 17 to 30 percent cobalt, about 0.6 to 0.8 percent manganese, and the balance iron.

Claim 4

Dependent Claim 290 words

A circuit comprising a silicon semiconductor device; and a circuit substrate having a layer of organic electrically insulating material, a relatively high electrical conductivity metal layer adhered to and supported on one side of the organic electrically insulating material layer forming electrically conductive circuit paths and a pad for mounting the silicon semiconductor device, heat-sink metal layer means adhered to and supported on an opposite side of the organic electrically insulating material layer in electrically insulated relation to the circuit paths and silicon semiconductor device for withdrawing heat from the device, the organic layer having a multiplicity of particles of material of relatively higher thermal conductivity than the organic layer material dispersed in the organic layer material for enhancing heat-withdrawal from the device and the heat-sink metal layer means comprising a layer of metal of relatively low coefficient of thermal expansion with a plurality of apertures therein and a metal of relatively higher thermal conductivity than said low expansion metal disposed in the apertures and defining thin metal layers of high thermal conductivity along each of two opposite sides of the layer of metal of relatively low coefficient of thermal expansion, said metal of relatively higher thermal conductivity being metallurgically bonded to the layer of metal of relatively low coefficient of thermal expansion for providing the heat-sink metal layer means with selected heat-sink properties and an effective coefficient of thermal expansion and having the organic layer adhered thereto along one side of the heat sink metal layer means to cooperate with the particles enhancing heat-withdrawal from the semiconductor device to conduct the withdrawn heat into and through the heat-sink metal means while also providing improved reliability of mounting of the silicon semiconductor device on the pad during the enhanced heat-withdrawal.

Claim 5

Dependent Claim 290 words

A circuit comprising a silicon semiconductor device; and a circuit substrate having a layer of organic electrically insulating material, a relatively high electrical conductivity metal layer adhered to and supported on one side of the organic electrically insulating material layer forming electrically conductive circuit paths and a pad for mounting the silicon semiconductor device, heat-sink metal layer means adhered to and supported on an opposite side of the organic electrically insulating material layer in electrically insulated relation to the circuit paths and silicon semiconductor device for withdrawing heat from the device, the organic layer having a multiplicity of particles of material of relatively higher thermal conductivity than the organic layer material dispersed in the organic layer material for enhancing heat-withdrawal from the device and the heat-sink metal layer means comprising a layer of metal of relatively low coefficient of thermal expansion with a plurality of apertures therein and a metal of relatively higher thermal conductivity than said low expansion metal disposed in the apertures and defining thin metal layers of high thermal conductivity along each of two opposite sides of the layer of metal of relatively low coefficient of thermal expansion, said metal of relatively higher thermal conductivity being metallurgically bonded to the layer of metal of relatively low coefficient of thermal expansion for providing the heat-sink metal layer means with selected heat-sink properties and an effective coefficient of thermal expansion and having the organic layer adhered thereto along one side of the heat sink metal layer means to cooperate with the particles enhancing heat-withdrawal from the semiconductor device to conduct the withdrawn heat into and through the heat-sink metal means while also providing improved reliability of mounting of the silicon semiconductor device on the pad during the enhanced heat-withdrawal.

Claim 6

Dependent Claim 232 words

A circuit according to claim 3 wherein the organic layer material in the substrate is selected from the group consisting of epoxies, acetal resins, polyimides, polyamides, polyimide-amides, polyesters, polyolefins, tetrafluoroethylene and acrylonitrile butaliene styrene copolymers, the particles in the substrate are formed from materials selected from the group consisting of oxides, nitrides and carbides, of aluminum, boron, beryllium, magnesium, zinc, silicon and titanium, the relatively high thermal conductivity metal in heat-sink layer of the substrate is selected from the group consisting of copper and aluminum and alloys thereof, and the metal of relatively low coefficient of thermal expansion in the heat sink layer of the substrate is selected from the group consisting of alloys having a nominal composition by weight of from about 36 to 50 percent nickel and the balance of iron, of about 31 percent nickel, 8 percent chromium, 8 percent cobalt and the balance iron, ob about 32 percent nickel, 15 percent cobalt, 1 percent molybdenum and the balance iron, of about 38 percent nickel, 7 percent chromium and the balance iron, of about 17 percent chromium and the balance iron, of about 16.5 percent chromium, 4.5 percent aluminum, and the balance iron, of about 57 percent cobalt, 9 percent chromium and the balance iron, and of about 23 to 30 percent nickel, about 17 to 30 percent cobalt, about 0.6 to 0.8 percent manganese and the balance iron.

Annuity Stage	Window Opens	Payment Deadline	Surcharge Period Until	Estimated Fee	Status
3.5 Years (Year 4)	1994-02-18	1994-08-20	1995-02-19	$2000.00	Window Closed / Lapsed
7.5 Years (Year 8)	1998-02-18	1998-08-20	1999-02-19	$3760.00	Window Closed / Lapsed
11.5 Years (Year 12)	2002-02-18	2002-08-20	2003-02-19	$7700.00	Window Closed / Lapsed

Circuit substrate and circuit using the substrate

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