Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
232 words
An integrated circuit having NMOS, PMOS, and NPN transistors comprising: a first P type layer; N+ buried regions formed insaid first P type layer corresponding with the PMOS transistors and the NPN transistors; a second P type layer overlying said first P type layer and housing the NMOS transistors; N well regions formed in said second P type layer each of said N well regions housing a PMOS transistor or a bipolar transistor; and P+ buried regions disposed between said first and second P type layers and beneath the NMOS transistors, and P+ buried regions being substantially smaller than said N+ buried regions and being isolated from said N+ buried regions thereby forming an integrated circuit in which PMOS transistors are in an N well, which N well is on an N+ region, and in which NMOS transistors are on P type layers, which P type layers are on a P+ region, and in which NPN transistors are in an N well, which N well is on an N+ region, and in which the P+ regions are isolated from the N+ regions, whereby the N+ regions provide a low resistance region for the PMOS and NPN transistors and the P+ region provides a low resistance region for the NMOS transistors, and the isolation of the P+ regions from the N+ regions avoids high capacitance due to proximity of N+ and P+ regions.
Claim 2
Dependent Claim
232 words
An integrated circuit having NMOS, PMOS, and NPN transistors comprising: a first P type layer; N+ buried regions formed insaid first P type layer corresponding with the PMOS transistors and the NPN transistors; a second P type layer overlying said first P type layer and housing the NMOS transistors; N well regions formed in said second P type layer each of said N well regions housing a PMOS transistor or a bipolar transistor; and P+ buried regions disposed between said first and second P type layers and beneath the NMOS transistors, and P+ buried regions being substantially smaller than said N+ buried regions and being isolated from said N+ buried regions thereby forming an integrated circuit in which PMOS transistors are in an N well, which N well is on an N+ region, and in which NMOS transistors are on P type layers, which P type layers are on a P+ region, and in which NPN transistors are in an N well, which N well is on an N+ region, and in which the P+ regions are isolated from the N+ regions, whereby the N+ regions provide a low resistance region for the PMOS and NPN transistors and the P+ region provides a low resistance region for the NMOS transistors, and the isolation of the P+ regions from the N+ regions avoids high capacitance due to proximity of N+ and P+ regions.
Claim 3
Dependent Claim
28 words
The integrated circuit of claim 1, wherein said first P type layer is a first epitaxial layer, and said second P type layer is a second epitaxial layer.
Claim 4
Dependent Claim
161 words
An integrated circuit having NMOS, PMOS, and bipolar transistors, comprising: a P+ layer of semiconductor material; a first P layer of semiconductor material on a surface of said P+ layer; a second P layer of semiconductor material on said first P layer and having an interface with said first P layer, and separated from said P+ layer by said first P layer; N+ regions at the interface of said first and second P layers and spaced from said P+ layer; first and second N regions in said second P layer, each of said N regions adjacent a corresponding one of said N+ regions; N source and drain regions in said second P layer for an NMOS transistor; P source and drain regions insaid first N region for a PMOS transistor; and a P base region in said second N region, and an N emitter region in said P base region for a bipolar transistor with said second N region as collector.
Claim 5
Dependent Claim
161 words
An integrated circuit having NMOS, PMOS, and bipolar transistors, comprising: a P+ layer of semiconductor material; a first P layer of semiconductor material on a surface of said P+ layer; a second P layer of semiconductor material on said first P layer and having an interface with said first P layer, and separated from said P+ layer by said first P layer; N+ regions at the interface of said first and second P layers and spaced from said P+ layer; first and second N regions in said second P layer, each of said N regions adjacent a corresponding one of said N+ regions; N source and drain regions in said second P layer for an NMOS transistor; P source and drain regions insaid first N region for a PMOS transistor; and a P base region in said second N region, and an N emitter region in said P base region for a bipolar transistor with said second N region as collector.