US4990976A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Semiconductor device including a field effect transistor having a protective diode between source and drain thereof
Assignee: NEC Electronics Corp
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Filing: 1988-11-22
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Granted: 1991-02-05
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Expires: 2008-11-22
Abstract
Abstract A field effect transistor includes an N-type semiconductor substrate of a drain region, a P-type base region formed in a surface of the semiconductor substrate, an N-type source region formed in the base region, a gate electrode formed on a base region between the source region and the semiconductor substrate, an N-type region having higher impurity concentration than the semiconductor substrate and formed in the surfaces of both the P-type base region and the N-type semiconductor substrate for forming a Zener diode between source and drain, a source electrode formed on the surface and connected to the source and base region, and a drain electrode connected to the semiconductor substrate. The N-type region for forming a Zener diode is formed by an ion implantation method.
Inventors
- 👤 Masayuki Hattori
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 06:49
CPC Classifications
H; H10; H10D; H10D84/00; H10D84/101; H10D84/141; H10D84/148; H10D30/00; H10D30/60; H10D30/64; H10D30/66; H10D30/663; H10D84/151; H10D84/158; H10D84/80; H10D84/811; H10D89/00; H10D89/60; H10D89/601; H10D89/611; H10D62/00; H10D62/10; H10D62/102; H10D62/103; H10D62/105; H10D62/108; H10D62/124; H10D62/126; H10D62/127; H10D62/13; H10D62/149; H10D62/151; H10D62/156; H10D62/157
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
152 words
A semiconductor device comprising; a semiconductor substrate of one conductivity type; a first semiconductor region of the other conductivity type formed in a main surface of said semiconductor substrate; a second semiconductor region of said one conductivity type formed in a surface of said first semiconductor region; a gate electrode formed on a portion of said first semiconductor region, said portion located between said second semiconductor region and said semiconductor substrate; a third semiconductor region of said one conductivity type formed in said main surface of said semiconductor substrate and said surface of said first semiconductor region, said third semiconductor region having higher impurity concentration than said semiconductor substrate and said third semiconductor region being in contact with both said semiconductor substrate and said first semiconductor region to form a Zener diode; a first electrode connected to said first and second semiconductor region; and a second electrode connected to said semiconductor substrate.
Claim 2
Dependent Claim
152 words
A semiconductor device comprising; a semiconductor substrate of one conductivity type; a first semiconductor region of the other conductivity type formed in a main surface of said semiconductor substrate; a second semiconductor region of said one conductivity type formed in a surface of said first semiconductor region; a gate electrode formed on a portion of said first semiconductor region, said portion located between said second semiconductor region and said semiconductor substrate; a third semiconductor region of said one conductivity type formed in said main surface of said semiconductor substrate and said surface of said first semiconductor region, said third semiconductor region having higher impurity concentration than said semiconductor substrate and said third semiconductor region being in contact with both said semiconductor substrate and said first semiconductor region to form a Zener diode; a first electrode connected to said first and second semiconductor region; and a second electrode connected to said semiconductor substrate.
Claim 3
Dependent Claim
45 words
A semiconductor device as claimed in claim 1, wherein said semiconductor substrate is a drain region, said second semiconductor region being a source region and a Zener diode being formed between said source and drain by said third semiconductor region and said first semiconductor region.
Claim 4
Dependent Claim
19 words
A semiconductor device as claimed in claim 2, wherein said gate electrode is surrounded by said third semiconductor region.
Claim 5
Dependent Claim
31 words
A semiconductor device as claimed in claim 2, wherein said semiconductor device is a horizontal-type field effect transistor, said second electrode being formed on said main surface of said semiconductor substrate.
Claim 6
Dependent Claim
18 words
A semiconductor device as claimed in claim 2, wherein said semiconductor device is a vertical-type field effect transistor.
Claim 7
Dependent Claim
159 words
A field effect transistor comprising: a semiconductor substrate of a drain region, said semiconductor substrate being of one conductivity type; a base region of the other conductivity type formed in a main surface of said semiconductor substrate; a source region of said one conductivity type formed in a surface of said base region; a gate electrode formed on a portion of said base region, said portion being located between said source region and said semiconductor substrate; a semiconductor region of said one conductivity type formed in said main surface of said semiconductor substrate and in said surface of said base region, impurity concentration of said semiconductor region being higher than said semiconductor substrate and said semiconductor region being in touch with both said semiconductor substrate and said base region to form a Zener diode between said source and drain; a source electrode connected to both said source and base regions; and a drain electrode connected to said semiconductor substrate.
Claim 8
Dependent Claim
159 words
A field effect transistor comprising: a semiconductor substrate of a drain region, said semiconductor substrate being of one conductivity type; a base region of the other conductivity type formed in a main surface of said semiconductor substrate; a source region of said one conductivity type formed in a surface of said base region; a gate electrode formed on a portion of said base region, said portion being located between said source region and said semiconductor substrate; a semiconductor region of said one conductivity type formed in said main surface of said semiconductor substrate and in said surface of said base region, impurity concentration of said semiconductor region being higher than said semiconductor substrate and said semiconductor region being in touch with both said semiconductor substrate and said base region to form a Zener diode between said source and drain; a source electrode connected to both said source and base regions; and a drain electrode connected to said semiconductor substrate.
Claim 9
Dependent Claim
19 words
A field effect transistor as claimed in claim 6, wherein said gate electrode is surrounded by said semiconductor region.
Claim 10
Dependent Claim
20 words
A field effect transistor as claimed in claim 6, wherein said field effect transistor is a horizontal-type field effect transistor.
Claim 11
Dependent Claim
20 words
A field effect transistor as claimed in claim 6, wherein said field effect transistor is a vertical-type field effect transistor.
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